Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 17
2
- 2017
- Question & Answer
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1194, doi. 10.1049/el.2017.2418
- Zhengfa Liang;
- Hengzhu Liu;
- Linbo Qiao;
- Yiliu Feng;
- Wei Chen
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1171, doi. 10.1049/el.2017.2407
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1198, doi. 10.1049/el.2017.2346
- Shuaifang Xiao;
- Yunfei Guo;
- Kaizhi Huang;
- Liang Jin
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1226, doi. 10.1049/el.2017.2259
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1172, doi. 10.1049/el.2017.2251
- Huan Zhang;
- Yong-Chang Jiao;
- Gang Zhao;
- Chi Zhang
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1200, doi. 10.1049/el.2017.2107
- Choi, J.-H.;
- Jo, M.-G.;
- Han, S.-W.;
- Kim, H.;
- Kim, S.-H.;
- Jang, S.;
- Kim, J.-S.;
- Cha, H.-Y.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1218, doi. 10.1049/el.2017.2248
- Yiming Chen;
- Jianping Xu;
- Jing Cao;
- Leiming Lin;
- Hongbo Ma
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1209, doi. 10.1049/el.2017.2239
- Killamsetty, V. K.;
- Mukherjee, B.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1205, doi. 10.1049/el.2017.2182
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1214, doi. 10.1049/el.2017.2136
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1222, doi. 10.1049/el.2017.2095
- Jingxi Wang;
- Xin Guo;
- Feng-Xiang Ge;
- Arce, Gonzalo R.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1188, doi. 10.1049/el.2017.2188
- Tianqing Yuan;
- Dazhi Wang;
- Yunlu Li;
- Sen Tan;
- Shuai Zhou
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1213, doi. 10.1049/el.2017.1961
- Lamy, M.;
- Finot, C.;
- Fatome, J.;
- Brun, M.;
- Labeye, P.;
- Nicolleti, S.;
- Bogris, A.;
- Syvridis, D.;
- Ettabib, M.A.;
- Richardson, D.J.;
- Petropoulos, P.;
- Hammani, K.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1211, doi. 10.1049/el.2017.1954
- Lidan Yao;
- Yongle Wu;
- Mingxing Li;
- Yuanan Liu
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1184, doi. 10.1049/el.2017.1935
- Jiansheng Qian;
- Rong Bao;
- Wei Shen;
- Junfeng Hu;
- Lu Tang;
- Zhifang Xia
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1190, doi. 10.1049/el.2017.1892
- Rui Chen;
- Huizhu Jia;
- Xiange Wen;
- Xiaodong Xie
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1186, doi. 10.1049/el.2017.1845
- Sheng-Lyang Jang;
- Yan-Cu Lin
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1207, doi. 10.1049/el.2017.1672
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1178, doi. 10.1049/el.2017.1637
- Hongtao Wang;
- Bezerianos, Anastasios
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1176, doi. 10.1049/el.2017.1558
- Ghosh, S.;
- Srivastava, K. V.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1180, doi. 10.1049/el.2017.1837
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1228, doi. 10.1049/el.2017.1768
- Tianyu Huang;
- Linhua Ma;
- Xing Hu;
- Shaocheng Huang;
- Shiping Liu
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1220, doi. 10.1049/el.2017.1748
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1224, doi. 10.1049/el.2017.1793
- Liang Yu;
- Yongmei Cheng;
- Song Li;
- Yan Liang;
- Xiaoxu Wang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1192, doi. 10.1049/el.2017.1792
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1169, doi. 10.1049/el.2017.1340
- Kai-Jen Chuang;
- Wei-Ming Syu;
- Shu-Chuan Chen;
- Ching-Cheng Wang
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1182, doi. 10.1049/el.2017.1365
- Taran, S.;
- Bajaj, V.;
- Sharma, D.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1202, doi. 10.1049/el.2017.1691
- Geliang Yang;
- Keping Wang;
- Zhigong Wang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1196, doi. 10.1049/el.2017.1321
- Haiju Fan;
- Ming Li;
- Wentao Mao
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1174, doi. 10.1049/el.2017.1170
- Karamzadeh, S.;
- Rafiei, V.;
- Saygin, H.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1203, doi. 10.1049/el.2017.1240
- Sánchez, J. R.;
- Bachiller, C.;
- Esteban, H.;
- Belenguer, A.;
- Nova, V.;
- Boria, V.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1216, doi. 10.1049/el.2017.0615
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1283, doi. 10.1049/el.2017.2541
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1279, doi. 10.1049/el.2017.0773
- Son, S.‐W.;
- Shin, S.H.;
- Park, J.H.;
- Baek, J.‐M.;
- Kim, D.‐K.;
- Lee, J.‐H.;
- Kim, T.‐W.;
- Kim, D.‐H.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1277, doi. 10.1049/el.2017.2292
- Zhang, Dong;
- Zhang, Yongshun;
- Zheng, Guimei;
- Feng, Cunqian;
- Tang, Jun
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1276, doi. 10.1049/el.2017.1303
- Andrade, A.M.S.S.;
- Hey, H.L.;
- Martins, M.L. da S.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1281, doi. 10.1049/el.2017.1344
- Benaissa, S.;
- Plets, D.;
- Tanghe, E.;
- Trogh, J.;
- Martens, L.;
- Vandaele, L.;
- Verloock, L.;
- Tuyttens, F.A.M.;
- Sonck, B.;
- Joseph, W.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1274, doi. 10.1049/el.2017.2390
- Huang, Xiaozong;
- Liu, Zhiwei;
- Liu, Fan;
- Liu, Jizhi;
- Song, Wenqiang
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1272, doi. 10.1049/el.2017.2391
- Miluski, P.;
- Kochanowicz, M.;
- Zmojda, J.;
- Dorosz, D.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1270, doi. 10.1049/el.2017.1413
- John, J.D.;
- Saito, I.;
- Toyama, R.;
- Ochiai, J.;
- Yamada, T.;
- Masuzawa, T.;
- Chua, D.H.C.;
- Okano, K.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1268, doi. 10.1049/el.2017.2596
- Ciofi, C.;
- Scandurra, G.;
- Giusi, G.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1232, doi. 10.1049/el.2017.3105
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1258, doi. 10.1049/el.2017.2060
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1256, doi. 10.1049/el.2017.0323
- Ye, Yinghui;
- Lu, Guangyue;
- Li, Yongzhao;
- Jin, Ming
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1266, doi. 10.1049/el.2017.2510
- Liu, Yuze;
- Li, Hui;
- Wang, Yunyun;
- Duan, Zhiwei;
- Ji, Yuefeng
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1260, doi. 10.1049/el.2017.2032
- Kim, P.;
- Chaudhary, G.;
- Jeong, Y.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1226, doi. 10.1049/el.2017.2259
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 17, p. 1264, doi. 10.1049/el.2017.1886
- Kraftmakher, G.;
- Butylkin, V.;
- Kazantsev, Y.;
- Mal'tsev, V.
- Article