Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 16
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1160, doi. 10.1049/el.2017.1368
- Zarbouti, D. A.;
- Tsoulos, G. V.;
- Athanasiadou, G. E.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1158, doi. 10.1049/el.2016.4768
- Geng Sun;
- Yanheng Liu;
- Jionghui Li;
- Ying Zhang;
- Aimin Wang
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1156, doi. 10.1049/el.2017.1006
- Miridakis, N. I.;
- Vergados, D. D.;
- Michalas, A.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1154, doi. 10.1049/el.2017.0400
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1152, doi. 10.1049/el.2017.1930
- Xian Tang;
- Jianxu Zeng;
- Yanqi Zheng;
- Ka Nang Leung;
- Zhihua Wang
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1148, doi. 10.1049/el.2017.1510
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1102, doi. 10.1049/el.2017.1771
- Yinxuan Lyu;
- Jianhua Feng;
- Hongfei Ye;
- Dunshan Yu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1150, doi. 10.1049/el.2017.1658
- Xi Yang;
- Kejun Lei;
- Li Hu;
- Xiuying Cao;
- Xiaoyu Huang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1144, doi. 10.1049/el.2017.1784
- Kim, D.-G.;
- Kim, Y.-H.;
- Seo, Y.-K.;
- Lee, Y.-R.;
- Kim, H.-N.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1146, doi. 10.1049/el.2017.1579
- Choi, C. M.;
- Sukegawa, H.;
- Mitani, S.;
- Song, Y. H.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1142, doi. 10.1049/el.2017.1782
- Zhiyong Niu;
- Jibin Zheng;
- Tao Su;
- Jiancheng Zhang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1135, doi. 10.1049/el.2017.1794
- Kang, S.;
- Kim, J.;
- Yang, S.;
- Yun, T.;
- Kim, H.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1139, doi. 10.1049/el.2017.1671
- Gonzalez-Ramirez, M.;
- Cruz-Villar, C. A.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1141, doi. 10.1049/el.2017.1553
- Rucheng Jiang;
- Yan Han;
- Shifeng Zhang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1137, doi. 10.1049/el.2017.0694
- Pulipaka, S.;
- Ramesh, A.;
- Kumar, R.;
- Bora, B.;
- Kumar, S.;
- Singh, S. K.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1132, doi. 10.1049/el.2017.1590
- Colalongo, L.;
- Dotti, D.;
- Richelli, A.;
- Kovács-Vajna, Zs. M.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1130, doi. 10.1049/el.2017.1662
- Lin, S.-T.;
- Li, X.;
- Sun, C.;
- Tang, Y.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1115, doi. 10.1049/el.2017.1711
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1129, doi. 10.1049/el.2017.1536
- Haixia Wang;
- Rong Zhang;
- Feng Wang;
- Zhejing Jiao;
- Dixiang Shao;
- Zhanglong Fu;
- Tao Zhou;
- Zhiyong Tan;
- Jungcheng Cao
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1127, doi. 10.1049/el.2017.1546
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1125, doi. 10.1049/el.2017.1622
- Ascoli, A.;
- Ntinas, V.;
- Tetzlaff, R.;
- Sirakoulis, G. Ch.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1123, doi. 10.1049/el.2017.1844
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1121, doi. 10.1049/el.2017.1556
- Kang Zhou;
- Chunxia Zhou;
- Wen Wu
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1119, doi. 10.1049/el.2017.1121
- Firmansyah, T.;
- Praptodiyono, S.;
- Pramudyo, A. S.;
- Chairunissa, C.;
- Alaydrus, M.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1117, doi. 10.1049/el.2017.2118
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1085, doi. 10.1049/el.2017.1618
- Xianliang Zeng;
- Linxi Zhang;
- Guobin Wan;
- Meng Gao
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1114, doi. 10.1049/el.2017.1910
- Minango, J.;
- de Almeida, C.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1112, doi. 10.1049/el.2017.0707
- Kim, J.;
- Park, S. W.;
- Kang, M. G.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1110, doi. 10.1049/el.2017.1772
- Müller, T.;
- See, C.;
- Ghani, A.;
- Bati, A.;
- Thiemann, P.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1108, doi. 10.1049/el.2017.1839
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1106, doi. 10.1049/el.2017.0744
- Luyun Wang;
- Ronggang Qi;
- Guoan Bi
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1104, doi. 10.1049/el.2017.1647
- Bo-Cheng Bao;
- Pingye Wu;
- Han Bao;
- Mo Chen;
- Quan Xu
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1100, doi. 10.1049/el.2017.1812
- Zongsheng Zheng;
- Zhigang Liu;
- Lu Lu
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1098, doi. 10.1049/el.2017.1726
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1096, doi. 10.1049/el.2017.2066
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1094, doi. 10.1049/el.2017.1425
- Byun, W.;
- Ku, Y.;
- Kim, J.-H.;
- Kim, H. C.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1092, doi. 10.1049/el.2017.1788
- Hwang, Y.;
- Jeong, M.-H.;
- Cho, W.;
- Oh, S.-R.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1090, doi. 10.1049/el.2017.1681
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1088, doi. 10.1049/el.2017.1656
- Jianxun Su;
- Chuiyong Kong;
- Zengrui Li;
- Hongcheng Yin;
- Yaoqing (Lamar) Yang
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1087, doi. 10.1049/el.2017.1168
- Dingwang Yu;
- Peiguo Liu;
- Yanfei Dong;
- Qihui Zhou;
- Dongming Zhou
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 16, p. 1083, doi. 10.1049/el.2017.1543
- Fei Liu;
- Kuiwen Xu;
- Peng Zhao;
- Linxi Dong;
- Gaofeng Wang
- Article