Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 15
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1015, doi. 10.1049/el.2017.1676
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2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1062, doi. 10.1049/el.2017.1620
- Shuyu Zhang;
- Menglian Zhao;
- Xiaobo Wu;
- Haozhou Zhang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 977
- de Wit, Jacco J.M.;
- van Rossum, Wim L.;
- Blacknell, David;
- Muff, Darren
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1033, doi. 10.1049/el.2017.1816
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5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1060, doi. 10.1049/el.2017.1657
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6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1011, doi. 10.1049/el.2017.1519
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7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 976, doi. 10.1049/el.2017.2508
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8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1019, doi. 10.1049/el.2017.1972
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1066, doi. 10.1049/el.2017.1835
- Lee, E.-C.;
- Choi, N.-S.;
- Kim, H.-J.
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10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1052, doi. 10.1049/el.2017.1605
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11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1030, doi. 10.1049/el.2017.1747
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12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1029, doi. 10.1049/el.2017.1669
- Sa-Ing, V.;
- Vorasayan, P.;
- Suwanwela, N. C.;
- Auethavekiat, S.;
- Chinrungrueng, C.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1044, doi. 10.1049/el.2017.1648
- Longxiang Huang;
- Xu Zhao;
- Yuncai Liu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 991, doi. 10.1049/el.2017.1570
- Corbett, B.;
- Andre, D.;
- Finnis, M.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1068, doi. 10.1049/el.2017.1534
- Bernacki, K.;
- Rymarski, Z.;
- Dyga, Ł.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1001, doi. 10.1049/el.2017.1523
- Lane, R. O.;
- Badran, T. A.;
- Marshall, G. F.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1047, doi. 10.1049/el.2017.0970
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 984, doi. 10.1049/el.2017.1584
- Andre, D.;
- Faulkner, B.;
- Finnis, M.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 995, doi. 10.1049/el.2017.1514
- van Rossum, W. L.;
- de Wit, J. J. M.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 981, doi. 10.1049/el.2017.1478
- Doody, S. G.;
- Hughes, N.;
- Ramio-Tomas, L.;
- Mak, E.;
- Muff, D. G.;
- Nottingham, M. R.
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21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1013, doi. 10.1049/el.2017.1030
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1021, doi. 10.1049/el.2017.1499
- Asokan, Hefilia;
- Gopalakrishnan, Srivatsun
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 987, doi. 10.1049/el.2017.1454
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1005, doi. 10.1049/el.2017.0993
- Chan, S.;
- Warburton, R. E.;
- Gariepy, G.;
- Altmann, Y.;
- McLaughlin, S.;
- Leach, J.;
- Faccio, D.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1008, doi. 10.1049/el.2017.1473
- Kaasalainen, S.;
- Ruotsalainen, L.;
- Kirkko-Jaakkola, M.;
- Nevalainen, O.;
- Hakala, T.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1034, doi. 10.1049/el.2017.1373
- Kim, S. G.;
- Jeon, H. G.;
- Koo, H. I.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 997, doi. 10.1049/el.2017.1367
- Bonjour, R.;
- Welschen, S.;
- Leuchtmann, P.;
- Wellig, P.;
- Leuthold, J.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1023, doi. 10.1049/el.2017.1351
- Fischl, K. D.;
- Fair, K.;
- Tsai, W.-Y.;
- Sampson, J.;
- Andreou, A. G.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1073, doi. 10.1049/el.2017.0849
- Xu Qian;
- Bin Wu;
- Tianchun Ye
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1042, doi. 10.1049/el.2017.0795
- Shasha Mao;
- Weisi Lin;
- Jiawei Chen;
- Lin Xiong
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1056, doi. 10.1049/el.2017.1345
- Chen, C.-C.;
- Sim, C. Y. D.;
- Chen, J.-W.;
- Lin, J.-H.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1070, doi. 10.1049/el.2017.1312
- Benzhou Jin;
- Yongxue Ma;
- Gang Wu
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1017, doi. 10.1049/el.2017.1280
- Sarkar, A.;
- Sharma, A.;
- Adhikary, M.;
- Biswas, A.;
- Akhtar, M. J.
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34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1050, doi. 10.1049/el.2017.1169
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35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1058, doi. 10.1049/el.2017.1157
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36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1049, doi. 10.1049/el.2017.1132
- Sai-Wai Wong;
- Bing-Long Zheng;
- Lei Zhu;
- Qing-Xin Chu
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1027, doi. 10.1049/el.2017.1085
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1064, doi. 10.1049/el.2017.0790
- Soltanzadeh, K.;
- Dehghani, M.;
- Riahi, R.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1041, doi. 10.1049/el.2017.0326
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1054, doi. 10.1049/el.2017.0168
- Rizwan, M.;
- Khan, M. W. A.;
- He, H.;
- Virkki, J.;
- Sydänheimo, L.;
- Ukkonen, L.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1038, doi. 10.1049/el.2016.4726
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1075, doi. 10.1049/el.2017.0774
- Zebing Feng;
- Zhiyong Feng;
- Jianwu Li
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1071, doi. 10.1049/el.2017.0493
- Seyed Alireza Mohadeskasaei;
- Fuhong Lin;
- Xianwei Zhou;
- Sani Umar Abdullahi
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1025, doi. 10.1049/el.2017.0390
- Montero-Rodríguez, J. J.;
- Fernández-Castro, A. J.;
- Schroeder, D.;
- Krautschneider, W.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1036, doi. 10.1049/el.2016.4709
- Hossny, M.;
- Nahavandi, S.;
- Creighton, D.;
- Lim, C.;
- Bhatti, A.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1075, doi. 10.1049/el.2017.0774
- Feng, Zebing;
- Feng, Zhiyong;
- Li, Jianwu
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1044, doi. 10.1049/el.2017.1648
- Huang, Longxiang;
- Zhao, Xu;
- Liu, Yuncai
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1049, doi. 10.1049/el.2017.1132
- Wong, Sai‐Wai;
- Zheng, Bing‐Long;
- Zhu, Lei;
- Chu, Qing‐Xin
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1068, doi. 10.1049/el.2017.1534
- Bernacki, K.;
- Rymarski, Z.;
- Dyga, Ł.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 15, p. 1073, doi. 10.1049/el.2017.0849
- Qian, Xu;
- Wu, Bin;
- Ye, Tianchun
- Article