Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 14
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 897, doi. 10.1049/el.2017.2340
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2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 896, doi. 10.1049/el.2017.2341
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3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 904, doi. 10.1049/el.2017.1072
- Congsi Wang;
- Yan Wang;
- Wei Wang;
- Jinzhu Zhou;
- Meng Wang;
- Zhihai Wang
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 935, doi. 10.1049/el.2017.1559
- Yuze Liu;
- Hui Li;
- Chunjian Lyu;
- Zhiwei Duan;
- Yuefeng Ji
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5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 953, doi. 10.1049/el.2017.1549
- Zhihui Li;
- Yongshun Zhang;
- Hanwei Liu;
- Yiduo Guo
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6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 949, doi. 10.1049/el.2017.0760
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8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 933, doi. 10.1049/el.2017.1829
- Jie Xu;
- Yinjie Cui;
- Zhengbin Xu;
- Jian Guo;
- Cheng Qian;
- Wenyuan Li
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9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 908, doi. 10.1049/el.2017.1506
- Park, J.;
- Lee, J.;
- Lee, B.;
- Poon, A. S. Y.;
- Lee, S.;
- Kim, S.
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10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 939, doi. 10.1049/el.2017.1695
- Hai-Zhong Weng;
- Osamu Wada;
- Jun-Yuan Han;
- Jin-Long Xiao;
- Yue-De Yang;
- Yong-Zhen Huang;
- Jin Li;
- Bing Xiong;
- Chang-Zheng Sun;
- Yi Luo
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 924, doi. 10.1049/el.2017.1037
- Park, J.;
- Kim, I.;
- Song, H.-Y.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 926, doi. 10.1049/el.2017.1460
- Weiwei Shan;
- Shuai Zhang;
- Yukun He
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 930, doi. 10.1049/el.2017.1508
- Lee, J.;
- Kim, J.;
- Lim, S.-Y.;
- Kwon, J.-Y.;
- Im, J.;
- Lee, S.-M.;
- Moon, S. E.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 903, doi. 10.1049/el.2017.1357
- Yueshu Xu;
- Qian Ye;
- Guoxiang Meng
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 931, doi. 10.1049/el.2017.0429
- Ying Jiang;
- Bin Wei;
- Yong Heng;
- Xubo Guo;
- Bisong Cao;
- Linan Jiang
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 937, doi. 10.1049/el.2017.0125
- Fengdan Xin;
- Juanjuan Yan;
- Qidi Liu
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 951, doi. 10.1049/el.2017.1333
- Ming Zhang;
- Yuan-bo Guo;
- Ze Li;
- Xiao-hua Zhang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 914, doi. 10.1049/el.2017.1301
- Kim, I. H.;
- Yook, J. H.;
- Son, Y. I.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 901, doi. 10.1049/el.2017.1282
- Saeidi-Manesh, H.;
- Mirmozafari, M.;
- Zhang, G.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 910, doi. 10.1049/el.2017.1243
- Lim, J.;
- Kim, H.;
- Oh, H.;
- Kang, S.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 912, doi. 10.1049/el.2017.1167
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 955, doi. 10.1049/el.2017.1139
- Ning Wang;
- Zhonghao Wei;
- Guangzuo Li;
- Ran Wang;
- Keshu Zhang;
- Yirong Wu
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 972, doi. 10.1049/el.2017.1133
- Bin Ren;
- Yingmin Wang;
- Shaohui Sun;
- Yawen Zhang;
- Xiaoming Dai;
- Kai Niu
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 899, doi. 10.1049/el.2017.1115
- Zhenhai Yan;
- Feiran Yang;
- Jun Yang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 970, doi. 10.1049/el.2017.1018
- Huan Zhang;
- Qinglin Zhao;
- Fangxin Xu
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 947, doi. 10.1049/el.2017.1064
- Huber, J. E.;
- Kolar, J. W.;
- Pammer, G.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 943, doi. 10.1049/el.2017.1007
- Haihong Huang;
- Nanxia Bi;
- Haixin Wang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 920, doi. 10.1049/el.2017.0272
- YuXuan Wu;
- GaoYun An;
- YiQiong Zhang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 956, doi. 10.1049/el.2017.1016
- Xinlei Chen;
- Chao Fei;
- Changqing Gu;
- Mittra, Raj
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 945, doi. 10.1049/el.2017.0755
- Girolami, M.;
- Bellucci, A.;
- Calvani, P.;
- Dimroth, F.;
- Trucchi, D. M.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 958, doi. 10.1049/el.2017.0882
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 922, doi. 10.1049/el.2017.0878
- Dahe Liu;
- Wengao Lu;
- Shanzhe Yu;
- Zhongjian Chen
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 928, doi. 10.1049/el.2017.0093
- Jianlong Zhao;
- Hua Qu;
- Jihong Zhao;
- Zhirong Luan;
- Ya Guo
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 916, doi. 10.1049/el.2017.0524
- Park, H. H.;
- Seo, K.;
- Kwon, Y.-K.;
- Park, H.-B.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 918, doi. 10.1049/el.2017.0523
- Jiabao Wang;
- Yang Li;
- Zhuang Miao;
- Yulong Xu;
- Gang Tao
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 962, doi. 10.1049/el.2017.0458
- Lee, L. M.;
- Le, H. H.;
- Jean, F. R.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 964, doi. 10.1049/el.2017.0040
- Chau, P.;
- Lee, Y.;
- Bui, T. D.;
- Shin, J.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 968, doi. 10.1049/el.2016.4751
- Zhiyang Liu;
- Yingxin Zhao;
- Hong Wu
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 941, doi. 10.1049/el.2016.3340
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 960, doi. 10.1049/el.2017.0157
- Sharma, N.;
- Chauhan, S. S.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 906, doi. 10.1049/el.2016.3673
- Ndip, I.;
- Huhn, M.;
- Brandenburger, F.;
- Ehrhardt, C.;
- Schneider-Ramelow, M.;
- Reichl, H.;
- Lang, K. D.;
- Henke, H.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 14, p. 966, doi. 10.1049/el.2016.4704
- Fangchao Zhang;
- Shaohui Sun;
- Qiubin Gao
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