Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 13
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 881, doi. 10.1049/el.2017.1578
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 828, doi. 10.1049/el.2017.1252
- Lubing Sun;
- Yongsong Zhang;
- Yang Cai;
- Zuping Qian
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 877, doi. 10.1049/el.2017.1597
- Dallmann, T.;
- Heberling, D.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 818, doi. 10.1049/el.2017.2132
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 852, doi. 10.1049/el.2017.1346
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 889, doi. 10.1049/el.2017.1270
- Killamsetty, V. K.;
- Mukherjee, B.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 819, doi. 10.1049/el.2017.2117
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 837, doi. 10.1049/el.2017.1027
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 822, doi. 10.1049/el.2017.1010
- Ningning Yan;
- Kaixue Ma;
- Haobin Zhang;
- Yun He
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 854, doi. 10.1049/el.2017.1531
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 834, doi. 10.1049/el.2017.1463
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 873, doi. 10.1049/el.2017.1438
- Yaping Cai;
- Jianping Xu;
- Gao Liu;
- Zhanhui Yao;
- Guohua Zhou
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 866, doi. 10.1049/el.2017.1423
- Si-Yu Yin;
- Jia-Lin Li;
- Shan-Shan Gao
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 835, doi. 10.1049/el.2017.1405
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 883, doi. 10.1049/el.2017.1369
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 862, doi. 10.1049/el.2017.1350
- Lee, J.;
- Jang, Y.;
- Yoon, D.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 885, doi. 10.1049/el.2017.0800
- Zijun Guo;
- Zhiqing Wei;
- Zhiyong Feng;
- Ning Fan
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 849, doi. 10.1049/el.2017.1329
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 892, doi. 10.1049/el.2017.1249
- Zheng Zhuang;
- Yongle Wu;
- Lingxiao Jiao;
- Weimin Wang;
- Yuanan Liu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 841, doi. 10.1049/el.2017.1202
- Choi, P.;
- Lee, M.-K.;
- Kim, D. K.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 869, doi. 10.1049/el.2017.1165
- Simpanen, E.;
- Gustavsson, J. S.;
- Haglund, E.;
- Haglund, E. P.;
- Larsson, A.;
- Sorin, W. V.;
- Mathai, S.;
- Tan, M. R.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 858, doi. 10.1049/el.2017.1190
- Zhen Meng;
- Feng Shen;
- Weidong Zhou
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 832, doi. 10.1049/el.2017.1033
- Pérez García, N. A.;
- Pinto, A. D.;
- Torres, J. M.;
- Rengel, J. E.;
- Rujano, L. M.;
- Camargo, N. Robles;
- Donoso, Y.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 875, doi. 10.1049/el.2017.1092
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 843, doi. 10.1049/el.2017.0780
- Cho, S.;
- Lee, D.;
- Ali, I.;
- Kim, S.;
- Pu, Y.;
- Yoo, S.;
- Lee, K.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 864, doi. 10.1049/el.2017.0730
- Yaxing Yue;
- Yougen Xu;
- Lei Shen;
- Zhiwen Liu
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 851, doi. 10.1049/el.2017.0728
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 860, doi. 10.1049/el.2017.0983
- Zhang Qingshuang;
- Aijun, Liu;
- Xiaofei, Pan
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 830, doi. 10.1049/el.2017.0941
- Jinhai Liu;
- Zhaoyang Tang;
- Yingzeng Yin
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 871, doi. 10.1049/el.2017.0968
- Triviño-Cabrera, A.;
- Aguado, J.;
- González, J. M.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 887, doi. 10.1049/el.2017.0929
- Tagliaferri, D.;
- Capsoni, C.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 856, doi. 10.1049/el.2017.0392
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 826, doi. 10.1049/el.2017.0187
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 890, doi. 10.1049/el.2016.4712
- Gurugopinath, S.;
- Muralishankar, R.;
- Shankar, H. N.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 845, doi. 10.1049/el.2017.0105
- Ying Xiong;
- Feng He;
- Xiaoting Li;
- Changxiao Zhao;
- Huagang Xiong
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 847, doi. 10.1049/el.2016.4477
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 824, doi. 10.1049/el.2017.0679
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 879, doi. 10.1049/el.2017.0536
- Kim, H.-S.;
- Goodman, N. A.;
- Lee, C. K.;
- Yang, S. -I.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 868, doi. 10.1049/el.2017.0530
- Yamanaka, Y.;
- Sakano, G.;
- Haruki, J.;
- Kato, K.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 839, doi. 10.1049/el.2017.0441
- Sensen Hu;
- Feng Shi;
- Xu Chen
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 13, p. 821, doi. 10.1049/el.2016.4300
- Kim, H.;
- Lee, Y.;
- Kim, B.;
- Baek, K.;
- Ko, S.;
- Yang, T.;
- Lee, J.;
- Nam, S.
- Article