Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 12
1
- 2017
- Letter to the Editor
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 806, doi. 10.1049/el.2017.1315
- Haiying Zhang;
- Zhenfang Li;
- Chao Fang
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 766, doi. 10.1049/el.2017.1291
- Chae, J.-H.;
- Kim, M.;
- Ko, H.;
- Jeong, Y.;
- Park, J.;
- Hong, G.-M.;
- Jeong, D.-K.;
- Kim, S.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 762, doi. 10.1049/el.2017.0406
- Bo Wu;
- Xin-yuan Cao;
- Ming-Sheng Chen
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 810, doi. 10.1049/el.2017.0357
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 772, doi. 10.1049/el.2017.1287
- Oh, D.-R.;
- Jo, D.-S.;
- Moon, K.-J.;
- Roh, Y.-J.;
- Ryu, S.-T.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 800, doi. 10.1049/el.2017.1274
- Yanzhao Ma;
- Danghui Wang;
- Shengbing Zhang;
- Xiaoya Fan
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 764, doi. 10.1049/el.2017.1191
- Ta-Yeh Lin;
- Tsenchieh Chiu;
- Da-Chiang Chang
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 779, doi. 10.1049/el.2017.0119
- Wei, Y.;
- Wang, X.;
- Torah, R.;
- Tudor, J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 804, doi. 10.1049/el.2017.0936
- Oh, Y. S.;
- Yeon, J. E.;
- Cho, K. M.;
- Kim, H. J.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 789, doi. 10.1049/el.2017.1024
- Huan Yi;
- Shi-Wei Qu;
- Chi Hou Chan
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 760, doi. 10.1049/el.2017.1173
- Zeeshan Zahid;
- Hyeongdong Kim
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 808, doi. 10.1049/el.2017.0932
- Nouri, M.;
- Mivehchy, M.;
- Sabahi, M. F.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 773, doi. 10.1049/el.2017.0928
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 785, doi. 10.1049/el.2017.0899
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 787, doi. 10.1049/el.2017.0866
- Chuanming Zhu;
- Jin Xu;
- Wei Kang;
- Zhenxin Hu;
- Wen Wu
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 812, doi. 10.1049/el.2016.4689
- Jingfeng Chen;
- Xianling Liang;
- Chong He;
- Junping Geng;
- Ronghong Jin
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 795, doi. 10.1049/el.2016.4447
- Lalbakhsh, A.;
- Karimi, G.;
- Sabaghi, F.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 759, doi. 10.1049/el.2017.0835
- Ya Qiao Liu;
- Jian Gang Liang;
- Ya Wei Wang
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 802, doi. 10.1049/el.2017.0787
- Qian Zhang;
- Wenhua Chen;
- Zhenghe Feng
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 777, doi. 10.1049/el.2017.0729
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 797, doi. 10.1049/el.2017.0711
- Ueda, Y.;
- Ogiso, Y.;
- Kashio, N.;
- Hashizume, Y.;
- Kikuchi, N.;
- Ishikawa, M.;
- Kohtoku, M.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 770, doi. 10.1049/el.2017.0702
- Bo Lu;
- Yong Chen;
- Jiajun Luo;
- Yumei Zhou
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 791, doi. 10.1049/el.2017.0697
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 799, doi. 10.1049/el.2017.0662
- Li, L. H.;
- Chen, L.;
- Freeman, J. R.;
- Salih, M.;
- Dean, P.;
- Davies, A. G.;
- Linfield, E. H.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 775, doi. 10.1049/el.2017.0628
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 814, doi. 10.1049/el.2017.0409
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 781, doi. 10.1049/el.2016.3866
- Jiafu Li;
- Jun Wang;
- Xiaolin Zhang;
- Wenyan Tang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 889, doi. 10.1049/el.2017.1270
- Killamsetty, V.K.;
- Mukherjee, B.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 768, doi. 10.1049/el.2016.3828
- Hongyu Han;
- Sheng Zhang;
- Hongbin Liang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 793, doi. 10.1049/el.2016.3037
- Shin, J.;
- Yoo, J.;
- Park, P.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 892, doi. 10.1049/el.2017.1249
- Zhuang, Zheng;
- Wu, Yongle;
- Jiao, Lingxiao;
- Wang, Weimin;
- Liu, Yuanan
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 890, doi. 10.1049/el.2016.4712
- Gurugopinath, S.;
- Muralishankar, R.;
- Shankar, H.N.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 783, doi. 10.1049/el.2016.3462
- Vázquez, M. A.;
- Míguez, J.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 887, doi. 10.1049/el.2017.0929
- Tagliaferri, D.;
- Capsoni, C.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 885, doi. 10.1049/el.2017.0800
- Guo, Zijun;
- Wei, Zhiqing;
- Feng, Zhiyong;
- Fan, Ning
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 841, doi. 10.1049/el.2017.1202
- Choi, P.;
- Lee, M.‐K.;
- Kim, D.K.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 883, doi. 10.1049/el.2017.1369
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 879, doi. 10.1049/el.2017.0536
- Kim, H.‐S.;
- Goodman, N.A.;
- Lee, C.K.;
- Yang, S.‐I.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 866, doi. 10.1049/el.2017.1423
- Yin, Si‐Yu;
- Li, Jia‐Lin;
- Gao, Shan‐Shan
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 864, doi. 10.1049/el.2017.0730
- Yue, Yaxing;
- Xu, Yougen;
- Shen, Lei;
- Liu, Zhiwen
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 862, doi. 10.1049/el.2017.1350
- Lee, J.;
- Jang, Y.;
- Yoon, D.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 881, doi. 10.1049/el.2017.1578
- Dou, Jiangling;
- Xu, Jinping
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 877, doi. 10.1049/el.2017.1597
- Dallmann, T.;
- Heberling, D.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 868, doi. 10.1049/el.2017.0530
- Yamanaka, Y.;
- Sakano, G.;
- Haruki, J.;
- Kato, K.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 875, doi. 10.1049/el.2017.1092
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 873, doi. 10.1049/el.2017.1438
- Cai, Yaping;
- Xu, Jianping;
- Liu, Gao;
- Yao, Zhanhui;
- Zhou, Guohua
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 871, doi. 10.1049/el.2017.0968
- Triviño‐Cabrera, A.;
- Aguado, J.;
- González, J.M.
- Article