Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 10
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 637, doi. 10.1049/el.2017.1521
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2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 665, doi. 10.1049/el.2017.0868
- Okayama, H.;
- Onawa, Y.;
- Shimura, D.;
- Takahashi, H.;
- Yaegashi, H.;
- Sasaki, H.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 680, doi. 10.1049/el.2017.0617
- Hanbali, S. Baher Safa;
- Kastantin, R.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 682, doi. 10.1049/el.2017.0801
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 685, doi. 10.1049/el.2017.0674
- Wen Luo;
- Zongxi Tang;
- Binbin Ge;
- Xin Cao
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 636, doi. 10.1049/el.2017.1515
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 668, doi. 10.1049/el.2017.0990
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 674, doi. 10.1049/el.2017.0963
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 663, doi. 10.1049/el.2017.0653
- Poojali, J.;
- Ray, S.;
- Pesala, B.;
- Krishnamurthy, C. V.;
- Arunachalam, K.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 661, doi. 10.1049/el.2017.0625
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 644, doi. 10.1049/el.2017.0809
- Thummaluru, S. R.;
- Chaudhary, R. K.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 672, doi. 10.1049/el.2017.0610
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 676, doi. 10.1049/el.2017.0678
- Yong-Chao Liu;
- Xinglai Ge;
- Qidi Tang;
- Bin Gou
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 666, doi. 10.1049/el.2017.0447
- Sekiguchi, H.;
- Imanishi, T.;
- Matsuzaki, R.;
- Ozaki, K.;
- Yamane, K.;
- Okada, H.;
- Kishino, K.;
- Wakahara, A.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 639, doi. 10.1049/el.2017.0593
- Sarkar, D.;
- Srivastava, K. V.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 642, doi. 10.1049/el.2017.0548
- Pengchao Zhao;
- Zhiyuan Zong;
- Bo Li;
- Wen Wu;
- Dagang Fang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 687, doi. 10.1049/el.2017.0456
- Maddio, S.;
- Cidronali, A.;
- Passafiume, M.;
- Collodi, G.;
- Maurri, S.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 752, doi. 10.1049/el.2017.0750
- Kapucu, N.;
- Bilim, M.;
- Develi, I.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 691, doi. 10.1049/el.2017.0346
- Eunbi Ku;
- Chulho Chung;
- Byungcheol Kang;
- Jaeseok Kim
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 646, doi. 10.1049/el.2017.0559
- Rabbani, M. S.;
- Ghafouri-Shiraz, H.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 689, doi. 10.1049/el.2016.4532
- Yong Mao Huang;
- Yujia Peng;
- Yuliang Zhou;
- Haiyan Jin;
- Supeng Leng;
- Guoan Wang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 648, doi. 10.1049/el.2016.4528
- Gaosheng Li;
- Gui Gao;
- Wei Liu;
- Zhihao Tian
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 659, doi. 10.1049/el.2016.2034
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 652, doi. 10.1049/el.2017.0322
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 746, doi. 10.1049/el.2017.0188
- Yuan, Qingwei;
- Zhao, Rongxiang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 678, doi. 10.1049/el.2017.0240
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 683, doi. 10.1049/el.2017.0235
- Tao Zhang;
- Xiaolei Lv;
- Jiang Qian;
- Jun Hong;
- Ye Yun
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 653, doi. 10.1049/el.2017.0180
- Wanyue Jiang;
- Daobo Wang;
- Yin Wang;
- Ali, Zain Anwar
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 641, doi. 10.1049/el.2017.0145
- Barbuto, M.;
- Trotta, F.;
- Bilotti, F.;
- Toscano, A.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 655, doi. 10.1049/el.2017.0035
- Lee, S.-H.;
- Kim, S.-T.;
- Yip, E.;
- Choi, B.-D.;
- Song, J.;
- Ko, S.-J.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 657, doi. 10.1049/el.2016.4763
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 670, doi. 10.1049/el.2016.4617
- Article
34
- 2017
- Tawfic, Israa Shaker;
- Kayhan, Sema Koc
- Letter to the Editor
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 750, doi. 10.1049/el.2017.0901
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 748, doi. 10.1049/el.2017.0684
- Dai, Weilong;
- Zhang, Gong;
- Zhang, Yang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 650, doi. 10.1049/el.2016.4222
- Sheng-Guang Wang;
- Wen-Jun Lu;
- Chun-Rui Guo;
- Lei Zhu
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 744, doi. 10.1049/el.2017.0521
- Brox, O.;
- Tawfieq, M.;
- Della Casa, P.;
- Ressel, P.;
- Sumpf, B.;
- Erbert, G.;
- Knigge, A.;
- Weyers, M.;
- Wenzel, H.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 743, doi. 10.1049/el.2017.0853
- Becker, S.;
- Scheuermann, J.;
- Weih, R.;
- Nähle, L.;
- König, O.;
- Fischer, M.;
- Koeth, J.;
- Höfling, S.;
- Kamp, M.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 741, doi. 10.1049/el.2017.0155
- Hasan, Md. Rabiul;
- Akter, Sanjida
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 739, doi. 10.1049/el.2017.0465
- Kim, Y.;
- Park, I.H.;
- Kwon, H.T.;
- Wee, D.;
- Park, B.‐G.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 737, doi. 10.1049/el.2017.0463
- Unigarro, E.;
- Bohórquez, J.C.;
- Achury, A.;
- Ramirez, F.;
- Sacristán, J.;
- Segura‐Quijano, F.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 735, doi. 10.1049/el.2017.1097
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 732, doi. 10.1049/el.2017.0068
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 734, doi. 10.1049/el.2017.1238
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 717, doi. 10.1049/el.2016.3179
- Tan, Yun;
- Hou, Xingsong;
- Chen, Zan;
- Yu, Shihang
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 722, doi. 10.1049/el.2017.0827
- Xu, Han;
- Yan, Lianshan;
- Xing, Huanlai;
- Cui, Yunhe;
- Li, Saifei
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 718, doi. 10.1049/el.2017.0420
- Meena, H.K.;
- Sharma, K.K.;
- Joshi, S.D.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 720, doi. 10.1049/el.2016.4194
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 10, p. 715, doi. 10.1049/el.2016.3515
- Su, Zhenming;
- Yang, Ling;
- Zhu, Simiao;
- Si, Ningbo;
- Lv, Xin
- Article