Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 1
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 22, doi. 10.1049/el.2016.3919
- Park, S.;
- Lee, H. S.;
- Kim, J.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 20, doi. 10.1049/el.2016.3011
- Huihui Song;
- Yuhui Zheng;
- Kaihua Zhang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 42, doi. 10.1049/el.2016.3662
- Feng Zhang;
- Kangping Wang;
- Xu Yang;
- Shi Cheng
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 36, doi. 10.1049/el.2016.3771
- Nicholson, K. J.;
- Dunbabin, O.;
- Baum, T.;
- Ghorbani, K.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 34, doi. 10.1049/el.2016.3566
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 50, doi. 10.1049/el.2016.2563
- Hosseini, S. M.;
- Kahaei, M. H.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 48, doi. 10.1049/el.2016.3836
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 46, doi. 10.1049/el.2016.3569
- Hariharan, R. M.;
- Kala, C. Preferencial;
- Janani, K.;
- Joseph, H. Bijo;
- Vivekananthan, S.;
- Thiruvadigal, D. John
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 44, doi. 10.1049/el.2016.3694
- Yong-Chao Liu;
- Xinglai Ge;
- Qidi Tang;
- Zhixian Deng;
- Bin Gou
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 25, doi. 10.1049/el.2016.3106
- Juang, W.-H.;
- Lai, S.-C.;
- Chen, K.-H.;
- Tsai, W.-K.;
- Luo, C.-H.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 40, doi. 10.1049/el.2016.3394
- Wang, M.;
- Hosoda, T.;
- Shterengas, L.;
- Kipshidze, G.;
- Hwang, D. J.;
- Belenky, G.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 38, doi. 10.1049/el.2016.3799
- Lee, W.;
- Lee, S.;
- Choi, J.;
- So, J.;
- Kwon, Y.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 24, doi. 10.1049/el.2016.2156
- Sidibé, D.;
- Mériaudeau, F.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 32, doi. 10.1049/el.2016.2265
- Xiaolei Kang;
- Xinsheng Ji;
- Kaizhi Huang;
- Xiangyu Li
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 31, doi. 10.1049/el.2016.3074
- Ji-bin Zheng;
- Gui-sheng Liao;
- Qing-huo Liu
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 27, doi. 10.1049/el.2016.2876
- Mirtchev, S. T.;
- Ganchev, I.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 29, doi. 10.1049/el.2016.3518
- Lisha Wang;
- Xiaohu Tang;
- Zheng Ma
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 18, doi. 10.1049/el.2016.2660
- Hongying Zheng;
- Ying Yang;
- Di Xiao;
- Jie He
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 16, doi. 10.1049/el.2016.3706
- Kim, M.-K.;
- Hong, S.-K.;
- Gou, J.;
- Kwon, O.-K.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 14, doi. 10.1049/el.2016.3345
- Gutierrez, E.;
- Hernandez, L.;
- Cardes, F.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 12, doi. 10.1049/el.2016.2435
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 10, doi. 10.1049/el.2016.3982
- Yasir;
- Ning Wu;
- Xiao Qiang Zhang;
- Yahya, Muhammad Rehan
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 8, doi. 10.1049/el.2016.3295
- Kuk, S.;
- Park, Y.;
- Han, S.;
- Kim, H.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 7, doi. 10.1049/el.2016.3808
- Yang Li;
- Lin-an Yang;
- Shao-bo Wang;
- Lin Du;
- Yue Hao
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 5, doi. 10.1049/el.2016.3803
- Abedian, M.;
- Rahim, S. K. A.;
- Danesh, S.;
- Jamaluddin, M. H.;
- Islam, M. T.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 96, doi. 10.1049/el.2016.4025
- Okayama, H.;
- Onawa, Y.;
- Shimura, D.;
- Yaegashi, H.;
- Sasaki, H.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 2
- Toumazou, Chris;
- White, Ian
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 110, doi. 10.1049/el.2016.2479
- Kan, Yingzhi;
- Zhu, Yongfeng;
- Zhou, Jianxiong;
- Yang, Lei;
- Tang, Liang;
- Fu, Qiang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 79, doi. 10.1049/el.2016.0863
- Park, C.;
- Kim, J.;
- Kweon, I.S.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 2, doi. 10.1049/el.2016.4404
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 121, doi. 10.1049/el.2016.3438
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 108, doi. 10.1049/el.2016.3018
- Xiao, Z.;
- Khoa, B.A.;
- Siek, L.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 119, doi. 10.1049/el.2016.3007
- Choi, C.M.;
- Sukegawa, H.;
- Mitani, S.;
- Song, Y.H.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 106, doi. 10.1049/el.2016.3986
- Wang, Tianfeng;
- Liu, Xin;
- Tang, Houjun;
- Ali, Muhammad
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 117, doi. 10.1049/el.2016.3872
- You, Bong‐Hyun;
- Lee, Jae‐Hoon;
- Lee, Soo‐Yeon;
- Hong, Seok‐Ha;
- Kim, Hyun‐Chang;
- Ju, Ha‐Ram;
- Choi, Moon‐Chul;
- Jeong, Deog‐Kyoon
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 115, doi. 10.1049/el.2016.3898
- Alkhodary, M.T.;
- Muqaibel, A.H.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 113, doi. 10.1049/el.2016.3944
- Tian, Ye;
- Shi, Hongyin;
- Xu, He
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 111, doi. 10.1049/el.2016.3818
- Zhang, Yu;
- Zhang, Gong;
- Wang, Xinhai
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 85, doi. 10.1049/el.2016.3500
- Zhang, Qingshuang;
- Liu, Aijun;
- Liang, Xiaohu
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 81, doi. 10.1049/el.2016.3686
- Wang, Ke;
- Liu, Aijun;
- Liang, Xiaohu;
- Peng, Siming
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 104, doi. 10.1049/el.2016.3909
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 77, doi. 10.1049/el.2016.3273
- De Matteis, M.;
- Donno, A.;
- D'Amico, S.;
- Baschirotto, A.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 102, doi. 10.1049/el.2016.3096
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 100, doi. 10.1049/el.2016.3833
- Yang, Zhuo;
- Bian, Fangjuan;
- Zhu, Jing;
- Sun, Weifeng;
- Tian, Ye;
- Tong, Xin;
- Zhu, Yuanzheng;
- Ye, Peng
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 98, doi. 10.1049/el.2016.3582
- Takubo, Yuya;
- Yamashita, Shinji
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 75, doi. 10.1049/el.2016.3558
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 95, doi. 10.1049/el.2016.3778
- Awad, E.;
- Abdel‐Rahman, M.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 93, doi. 10.1049/el.2016.3732
- Möller, C.;
- Zhang, F.;
- Fuchs, C.;
- Berger, C.;
- Rehn, A.;
- Ruiz Perez, A.;
- Rahimi‐Iman, A.;
- Hader, J.;
- Koch, M.;
- Moloney, J.V.;
- Koch, S.W.;
- Stolz, W.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 1, p. 91, doi. 10.1049/el.2016.3099
- Tan, Zhiyong;
- Li, Hua;
- Wan, Wenjian;
- Fu, Zhanglong;
- Wang, Chang;
- Cao, Juncheng
- Article