Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 9
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 677, doi. 10.1049/el.2016.1153
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 683, doi. 10.1049/el.2016.0392
- Hashmi, R. M.;
- Esselle, K. P.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 676, doi. 10.1049/el.2016.1161
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 678, doi. 10.1049/el.2016.1154
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 765, doi. 10.1049/el.2016.0234
- Qian Bao;
- Xueming Peng;
- Yun Lin;
- Bingchen Zhang;
- Wen Hong
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 710, doi. 10.1049/el.2016.0354
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 708, doi. 10.1049/el.2015.4486
- Rocha, F. G. C.;
- Vieira, F. H. T.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 686, doi. 10.1049/el.2016.0344
- D. H. Nam;
- D. W. Kang;
- H. S. Myoung;
- K. J. Lee
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 738, doi. 10.1049/el.2016.0451
- Forni, F.;
- Y. Shi;
- van den Boom, H. P. A.;
- Tangdiongga, E.;
- Koonen, A. M. J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 746, doi. 10.1049/el.2016.0236
- Xueshan Liu;
- Jianping Xu;
- Qi Yang;
- Duo Xu
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 734, doi. 10.1049/el.2016.0361
- Bo Zhang;
- Yongle Wu;
- Cuiping Yu;
- Yuanan Liu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 729, doi. 10.1049/el.2016.0227
- Jing Ai;
- Yonghong Zhang;
- Kai Da Xu;
- Yingjiang Guo;
- Joines, William Thomas;
- Qing Huo Liu
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 694, doi. 10.1049/el.2015.4531
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 767, doi. 10.1049/el.2016.0336
- Joozdani, M. Zahir;
- Amirhosseini, M. Khalaj;
- Abdolali, A.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 731, doi. 10.1049/el.2016.0322
- Jiayuan Lu;
- Jianpeng Wang;
- Hui Gu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 690, doi. 10.1049/el.2016.0289
- Yulin Zhang;
- Bonizzoni, Edoardo;
- Maloberti, Franco
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 727, doi. 10.1049/el.2016.0255
- Fabian-Gongora, H.;
- Martynyuk, A. E.;
- Rodriguez-Cuevas, J.;
- Martinez-Lopez, J. I.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 684, doi. 10.1049/el.2015.4416
- Yiling Chen;
- Shilie Zheng;
- Hao Chi;
- Xiaofeng Jin;
- Xianmin Zhang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 758, doi. 10.1049/el.2016.0196
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 701, doi. 10.1049/el.2015.4555
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 699, doi. 10.1049/el.2015.4551
- Deshi Li;
- Xiaoliang Wang;
- Tao Sun
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 697, doi. 10.1049/el.2016.0151
- Y. Zhang;
- C.-H. Chen;
- T. He;
- G. C. Temes
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 748, doi. 10.1049/el.2016.0109
- M. Hyodo;
- K. Sato;
- A. Kawakami;
- S. Saito;
- M. Watanabe;
- M. Adachi
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 681, doi. 10.1049/el.2016.0038
- Bekasiewicz, A.;
- Koziel, S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 720, doi. 10.1049/el.2015.4375
- Maoqiang Yang;
- Bangning Zhang;
- Yuzhen Huang;
- Daoxing Guo;
- Xu Yi
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 692, doi. 10.1049/el.2015.4368
- J. Park;
- D.-H. Shin;
- Y.-H. Cho;
- K.-W. Kwon
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 736, doi. 10.1049/el.2015.4365
- A. Chiba;
- Y. Akamatsu;
- K. Takada
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 770, doi. 10.1049/el.2015.4348
- Raad, B.;
- Nigam, K.;
- Sharma, D.;
- Kondekar, P.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 695, doi. 10.1049/el.2015.4308
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 742, doi. 10.1049/el.2015.4274
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 732, doi. 10.1049/el.2015.3827
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 778, doi. 10.1049/el.2015.4037
- Guerreiro, J.;
- Dinis, R.;
- Montezuma, P.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 716, doi. 10.1049/el.2015.4008
- Gang Wu;
- Bangning Zhang;
- Daoxing Guo;
- Xiaohu Liang
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 719, doi. 10.1049/el.2015.3933
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 725, doi. 10.1049/el.2015.3886
- Y.-P. Hong;
- M. J. Salter;
- D.-J. Lee
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 772, doi. 10.1049/el.2015.4143
- Rui Li;
- Liang Tao;
- Hon Keung Kwan
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 718, doi. 10.1049/el.2015.4141
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 759, doi. 10.1049/el.2015.4083
- Yuping Zhang;
- Yunjie Li;
- Yuyu Wei;
- Wenjing Li
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 714, doi. 10.1049/el.2015.3830
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 740, doi. 10.1049/el.2015.4017
- Daiguo Xu;
- Lu Liu;
- Shiliu Xu
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 774, doi. 10.1049/el.2015.4006
- Xianyi Rui;
- Mengmeng Wang;
- SuQi Liu
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 706, doi. 10.1049/el.2015.3997
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 754, doi. 10.1049/el.2015.3991
- Yu Chen;
- Zhihao Zhong;
- Yong Kang
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 763, doi. 10.1049/el.2015.3971
- Jie Chen;
- Wei Guo;
- Zhuo Li;
- Wei Liu
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 744, doi. 10.1049/el.2015.3946
- Tadic, N.;
- Goll, B.;
- Zimmermann, H.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 761, doi. 10.1049/el.2015.1637
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 749, doi. 10.1049/el.2015.3733
- Ahmed, M.;
- Hendawi, E.;
- Taha, I. B. M.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 703, doi. 10.1049/el.2015.3926
- Article