Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 8
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 568, doi. 10.1049/el.2016.0955
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 658, doi. 10.1049/el.2015.4140
- Yinhui Chen;
- Sheng Dong Hu;
- Kun Cheng;
- Yuyu Jiang;
- Jianlin Zhou;
- Fang Tang;
- Xi Chuan Zhou;
- Ping Gan
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 569, doi. 10.1049/el.2016.0954
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 573, doi. 10.1049/el.2015.4300
- Vincent, J.;
- Borderies, P.;
- Poirier, J. R.;
- Gobin, V.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 646, doi. 10.1049/el.2015.4263
- Sinha, A. K.;
- Schneider, M. C.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 589, doi. 10.1049/el.2015.4166
- Lee, D.;
- Velander, J.;
- Blokhuis, T. J.;
- Kim, K.;
- Augustine, R.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 661, doi. 10.1049/el.2015.4258
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 570, doi. 10.1049/el.2016.0952
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 583, doi. 10.1049/el.2016.0324
- Keya Tao;
- Bo Li;
- Yiming Tang;
- Qilei Wu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 659, doi. 10.1049/el.2016.0225
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 580, doi. 10.1049/el.2016.0198
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 617, doi. 10.1049/el.2016.0189
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 671, doi. 10.1049/el.2016.0170
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 619, doi. 10.1049/el.2016.0077
- Reviriego, Pedro;
- Shan Shan Liu;
- Sánchez-Macián, Alfonso;
- Liyi Xiao;
- Maestro, Juan Antonio
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 609, doi. 10.1049/el.2016.0057
- Xudong Li;
- Wai Ho Mow;
- Xianhua Niu
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 667, doi. 10.1049/el.2016.0025
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 654, doi. 10.1049/el.2016.0020
- Akyilmaz, E.;
- Leloglu, U. M.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 626, doi. 10.1049/el.2015.4539
- Feng Huang;
- Jianpeng Wang;
- Jialin Li;
- Wen Wu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 585, doi. 10.1049/el.2015.4534
- Sayegh, A. M.;
- Jenu, M. Z. M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 656, doi. 10.1049/el.2015.4517
- Loan, S. A.;
- Verma, S.;
- Alamoud, A. M.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 591, doi. 10.1049/el.2015.4511
- Kim, K.-N.;
- Seo, J.-H.;
- Han, S.-D.;
- Song, H.;
- Ryu, Y.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 578, doi. 10.1049/el.2015.4499
- Xu Rui;
- Jianying Li;
- Kun Wei
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 620, doi. 10.1049/el.2015.4488
- Noor, T.;
- Habib, A.;
- Amin, Y.;
- Loo, J.;
- Tenhunen, H.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 645, doi. 10.1049/el.2015.4480
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 641, doi. 10.1049/el.2015.4457
- Al Graiti, S. A.;
- Maywar, D. N.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 576, doi. 10.1049/el.2015.4448
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 637, doi. 10.1049/el.2015.4441
- Naughton, A.;
- Lai, C. P.;
- Talli, G.;
- Vaernewyck, R.;
- Yin, X.;
- Bauwelinck, J.;
- Qiu, X. Z.;
- Maxwell, G.;
- Smith, D. W.;
- Borghesani, A.;
- Cronin, R.;
- Grobe, K.;
- Eiselt, M.;
- Parsons, N.;
- Kehayas, E.;
- Townsend, P. D.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 600, doi. 10.1049/el.2015.4437
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 615, doi. 10.1049/el.2015.4428
- Guangkuo Lu;
- Manlin Xiao;
- Ping Wei
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 643, doi. 10.1049/el.2015.4398
- Ma, L.;
- Ma, C.;
- Wang, Y.;
- Wang, D. Y.;
- Wang, A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 665, doi. 10.1049/el.2015.4357
- Kim, J. -S.;
- Shin, G. -S.;
- Oh, H. -M.;
- Choi, S.;
- Byeon, C. W.;
- Son, J.;
- Lee, J. H.;
- Kim, C. -Y.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 625, doi. 10.1049/el.2015.4340
- Jang, S. -L.;
- Cheng, W. -C.;
- Hsue, C. -W.;
- Juang, M. -H.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 604, doi. 10.1049/el.2015.4323
- Heo, Y. S.;
- Bang, G.;
- Park, G. H.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 648, doi. 10.1049/el.2015.4220
- Cheng-Lin Xiong;
- Xia-Jie Wu;
- Fei Diao;
- Xiao-Yun Feng
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 633, doi. 10.1049/el.2015.4264
- Stepniak, G.;
- Lewandowski, A.;
- Kropp, J. R.;
- Ledentsov, N. N.;
- Shchukin, V. A.;
- Ledentsov Jr, N.;
- Schaefer, G.;
- Agustin, M.;
- Turkiewicz, J. P.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 622, doi. 10.1049/el.2015.3727
- Kim, J.;
- Park, H.;
- Lee, S.;
- Kwon, Y.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 608, doi. 10.1049/el.2015.4209
- Lin, T. -L.;
- Liaw, P. -S.;
- Chen, S. -L.;
- Hsia, C. -H.;
- Lin, S. -Y.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 669, doi. 10.1049/el.2015.4228
- Ramsey, B.;
- Fuller, J.;
- Badenhop, C.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 596, doi. 10.1049/el.2015.3746
- Intajag, S.;
- Kansomkeat, S.;
- Bhurayanontachai, P.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 602, doi. 10.1049/el.2015.4163
- Mahmood, M. H.;
- Salvi, J.;
- Lladó, X.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 639, doi. 10.1049/el.2015.3545
- Dong-Nhat, N.;
- Malekmohammadi, A.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 611, doi. 10.1049/el.2015.3470
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 587, doi. 10.1049/el.2015.3404
- Fartookzadeh, M.;
- Mohseni Armaki, S. H.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 650, doi. 10.1049/el.2015.4078
- Lee, H.;
- Kang, S.;
- Kim, Y.;
- Jung, C.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 592, doi. 10.1049/el.2015.3959
- Doshi, T.;
- Di Caterina, G.;
- Soraghan, J.;
- Petropoulakis, L.;
- Grose, D.;
- MacKenzie, K.;
- Wilson, C.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 630, doi. 10.1049/el.2015.3923
- Wang, Q.;
- Lim, J.;
- Jeong, Y.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 673, doi. 10.1049/el.2015.3887
- Lanqi Liu;
- Zhaojing Lu;
- Kefeng Zhang;
- Zhixiong Ren;
- Ang Hu;
- Xuecheng Zou
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 598, doi. 10.1049/el.2015.3848
- Moo-Yeol Choi;
- Hyung-Dong Roh;
- Yong-Hee Lee;
- Ho-Jin Park;
- Bai-Sun Kong
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 8, p. 628, doi. 10.1049/el.2015.3763
- Shunyong Hu;
- Kaijun Song;
- Yong Fan
- Article