Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 7
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 780, doi. 10.1049/el.2016.1042
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 778, doi. 10.1049/el.2015.4037
- Guerreiro, J.;
- Dinis, R.;
- Montezuma, P.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 776, doi. 10.1049/el.2015.3673
- Zhao, Yisheng;
- Chen, Zhonghui;
- Ji, Hong
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 774, doi. 10.1049/el.2015.4006
- Rui, Xianyi;
- Wang, Mengmeng;
- Liu, SuQi
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 772, doi. 10.1049/el.2015.4143
- Li, Rui;
- Tao, Liang;
- Kwan, Hon Keung
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 770, doi. 10.1049/el.2015.4348
- Raad, B.;
- Nigam, K.;
- Sharma, D.;
- Kondekar, P.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 769, doi. 10.1049/el.2015.3650
- Joo, D.M.;
- Lee, B.K.;
- Kim, J.S.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 767, doi. 10.1049/el.2016.0336
- Zahir Joozdani, M.;
- Khalaj Amirhosseini, M.;
- Abdolali, A.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 765, doi. 10.1049/el.2016.0234
- Bao, Qian;
- Peng, Xueming;
- Lin, Yun;
- Zhang, Bingchen;
- Hong, Wen
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 763, doi. 10.1049/el.2015.3971
- Chen, Jie;
- Guo, Wei;
- Li, Zhuo;
- Liu, Wei
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 761, doi. 10.1049/el.2015.1637
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 759, doi. 10.1049/el.2015.4083
- Zhang, Yuping;
- Li, Yunjie;
- Wei, Yuyu;
- Li, Wenjing
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 758, doi. 10.1049/el.2016.0196
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 756, doi. 10.1049/el.2015.3462
- Osorio, R.;
- Alonso, J.M.;
- Balderas, R.;
- Vázquez, N.;
- Ponce, M.;
- Martínez, A.J.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 754, doi. 10.1049/el.2015.3991
- Chen, Yu;
- Zhong, Zhihao;
- Kang, Yong
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 751, doi. 10.1049/el.2015.3682
- Shah, S.T.;
- Choi, K.W.;
- Hasan, S.F.;
- Chung, M.Y.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 749, doi. 10.1049/el.2015.3733
- Ahmed, M.;
- Hendawi, E.;
- Taha, I.B.M.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 748, doi. 10.1049/el.2016.0109
- Hyodo, M.;
- Sato, K.;
- Kawakami, A.;
- Saito, S.;
- Watanabe, M.;
- Adachi, M.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 746, doi. 10.1049/el.2016.0236
- Liu, Xueshan;
- Xu, Jianping;
- Yang, Qi;
- Xu, Duo
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 744, doi. 10.1049/el.2015.3946
- Tadić, N.;
- Goll, B.;
- Zimmermann, H.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 742, doi. 10.1049/el.2015.4274
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 740, doi. 10.1049/el.2015.4017
- Xu, Daiguo;
- Liu, Lu;
- Xu, Shiliu
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 738, doi. 10.1049/el.2016.0451
- Forni, F.;
- Shi, Y.;
- Boom, H.P.A.;
- Tangdiongga, E.;
- Koonen, A.M.J.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 736, doi. 10.1049/el.2015.4365
- Chiba, A.;
- Akamatsu, Y.;
- Takada, K.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 734, doi. 10.1049/el.2016.0361
- Zhang, Bo;
- Wu, Yongle;
- Yu, Cuiping;
- Liu, Yuanan
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 732, doi. 10.1049/el.2015.3827
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 731, doi. 10.1049/el.2016.0322
- Lu, Jiayuan;
- Wang, Jianpeng;
- Gu, Hui
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 729, doi. 10.1049/el.2016.0227
- Ai, Jing;
- Zhang, Yonghong;
- Xu, Kai Da;
- Guo, Yingjiang;
- Joines, William Thomas;
- Liu, Qing Huo
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 727, doi. 10.1049/el.2016.0255
- Fabian‐Gongora, H.;
- Martynyuk, A.E.;
- Rodriguez‐Cuevas, J.;
- Martinez‐Lopez, J.I.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 725, doi. 10.1049/el.2015.3886
- Hong, Y.‐P.;
- Salter, M.J.;
- Lee, D.‐J.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 724, doi. 10.1049/el.2015.3661
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 722, doi. 10.1049/el.2015.2692
- Tang, Ming‐Chun;
- Shi, Ting;
- Chen, Shiyong;
- Cao, Hailin
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 720, doi. 10.1049/el.2015.4375
- Yang, Maoqiang;
- Zhang, Bangning;
- Huang, Yuzhen;
- Guo, Daoxing;
- Yi, Xu
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 719, doi. 10.1049/el.2015.3933
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 718, doi. 10.1049/el.2015.4141
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 716, doi. 10.1049/el.2015.4008
- Wu, Gang;
- Zhang, Bangning;
- Guo, Daoxing;
- Liang, Xiaohu
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 714, doi. 10.1049/el.2015.3830
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 712, doi. 10.1049/el.2015.3550
- Zhao, Haiquan;
- Zheng, Zongsheng
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 710, doi. 10.1049/el.2016.0354
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 708, doi. 10.1049/el.2015.4486
- Rocha, F.G.C.;
- Vieira, F.H.T.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 706, doi. 10.1049/el.2015.3997
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 705, doi. 10.1049/el.2015.3407
- Liu, Dahe;
- Lu, Wengao;
- Lei, Shuyu;
- Chen, Zhongjian
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 703, doi. 10.1049/el.2015.3926
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 701, doi. 10.1049/el.2015.4555
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 699, doi. 10.1049/el.2015.4551
- Li, Deshi;
- Wang, Xiaoliang;
- Sun, Tao
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 697, doi. 10.1049/el.2016.0151
- Zhang, Y.;
- Chen, C.‐H.;
- He, T.;
- Temes, G.C.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 695, doi. 10.1049/el.2015.4308
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 694, doi. 10.1049/el.2015.4531
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 692, doi. 10.1049/el.2015.4368
- Park, J.;
- Shin, D.‐H.;
- Cho, Y.‐H.;
- Kwon, K.‐W.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 7, p. 690, doi. 10.1049/el.2016.0289
- Zhang, Yulin;
- Bonizzoni, Edoardo;
- Maloberti, Franco
- Article