Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 6
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 435, doi. 10.1049/el.2015.4174
- Ying Liu;
- Xin Quan;
- Shihai Shao;
- Youxi Tang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 421, doi. 10.1049/el.2015.4326
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 410, doi. 10.1049/el.2016.0609
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 445, doi. 10.1049/el.2016.0022
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 434, doi. 10.1049/el.2015.4427
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 419, doi. 10.1049/el.2015.4403
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 472, doi. 10.1049/el.2015.4392
- Longtao Xu;
- Shilei Jin;
- Yifei Li
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 473, doi. 10.1049/el.2015.4172
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 414, doi. 10.1049/el.2015.4103
- Rui Xu;
- Jian-ying Li;
- Kun Wei;
- Guang-wei Yang
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 460, doi. 10.1049/el.2015.4328
- Chung, S.;
- Ma, R.;
- Teo, K. H.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 441, doi. 10.1049/el.2015.4077
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 462, doi. 10.1049/el.2015.4043
- Ryu, H.;
- Ha, K. W.;
- Baek, D.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 428, doi. 10.1049/el.2015.4306
- Rostaing, J.-P.;
- Sicard, G.;
- Dupret, A.;
- Peizerat, A.;
- Villard, P.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 424, doi. 10.1049/el.2015.4295
- Pinapati, S. P.;
- Kaufmann, T.;
- Ranasinghe, D. C.;
- Fumeaux, C.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 452, doi. 10.1049/el.2015.4241
- Daehan Ha;
- Hoojin Lee;
- Joonhyuk Kang
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 413, doi. 10.1049/el.2015.4004
- Le Chang;
- Yue Li;
- Zhijun Zhang;
- Zhenghe Feng
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 456, doi. 10.1049/el.2015.3962
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 416, doi. 10.1049/el.2015.3960
- Zhongjie Qin;
- Wen Geyi;
- Ming Zhang;
- Jun Wang
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 443, doi. 10.1049/el.2015.3956
- Kim, S.-W.;
- Choi, B.-D.;
- Park, W.-J.;
- Ko, S.-J.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 479, doi. 10.1049/el.2015.3921
- Kitagawa, S.;
- Suzuki, S.;
- Asada, M.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 432, doi. 10.1049/el.2015.3204
- Ratiu, A.;
- Morche, D.;
- Allard, B.;
- Lin-Shi, X.;
- Verdier, J.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 418, doi. 10.1049/el.2015.3885
- Qiang Chen;
- Liguo Liu;
- Liang Chen;
- Jiajun Bai;
- Yunqi Fu
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 439, doi. 10.1049/el.2015.3879
- Sengupta, A.;
- Bhadauria, S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 468, doi. 10.1049/el.2015.3856
- Lee, J.;
- Jeon, J. H.;
- Kim, Y.-G.;
- Lee, S. Q.;
- Yang, W. S.;
- Lee, J. S.;
- Lee, S.-G.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 423, doi. 10.1049/el.2015.3811
- Kwang-jae Lee;
- Taek-kyung Lee
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 464, doi. 10.1049/el.2015.3834
- Labrado, C.;
- Thapliyal, H.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 483, doi. 10.1049/el.2015.3814
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 450, doi. 10.1049/el.2015.3788
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 454, doi. 10.1049/el.2015.3784
- Bondzulic, B. P.;
- Pavlovic, B. Z.;
- Petrovic, V. S.;
- Andric, M. S.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 430, doi. 10.1049/el.2015.3778
- Hu, B.;
- Ren, F.;
- Chen, Z.-Z.;
- Jiang, X.;
- Chang, M.-C. F.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 448, doi. 10.1049/el.2015.3716
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 470, doi. 10.1049/el.2015.3655
- Lei Zhao;
- Haoyu Li;
- Shufeng Liu;
- Weihe Zeng
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 475, doi. 10.1049/el.2015.3583
- Jia Liu;
- Ning Fang;
- Yong Jun Xie;
- Bao Fa Wang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 447, doi. 10.1049/el.2015.3447
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 437, doi. 10.1049/el.2015.3437
- Martínez-García, H.;
- Saberkari, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 458, doi. 10.1049/el.2015.3434
- Yunwu Zhang;
- Jing Zhu;
- Weifeng Sun;
- Yangyang Lu;
- Fagang Wang;
- Kuo Yu
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 481, doi. 10.1049/el.2015.3420
- Kumar, P. Akhendra;
- Rao, N. Bheema
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 426, doi. 10.1049/el.2015.3226
- Hajimorad, M.;
- Gralnick, J. A.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 477, doi. 10.1049/el.2015.2874
- Hunt, M. R.;
- Mitchell, C.;
- McCartney, C. L.;
- Ho, F. D.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 466, doi. 10.1049/el.2015.2835
- Article