Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 5
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 399, doi. 10.1049/el.2015.3963
- Wenzhen Yue;
- Yan Zhang;
- Jingwen Xie
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 336, doi. 10.1049/el.2015.3889
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 379, doi. 10.1049/el.2015.3090
- Hutchinson, M. N.;
- Thompson, K. E.;
- Frigo, N. J.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 367, doi. 10.1049/el.2015.2634
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 374, doi. 10.1049/el.2015.3884
- Jain, S.;
- Ellinger, F.;
- Tchamov, N. T.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 333, doi. 10.1049/el.2016.0463
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 378, doi. 10.1049/el.2015.4214
- Komarov, V. V.;
- Meschanov, V. P.;
- Popova, N. F.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 340, doi. 10.1049/el.2015.4134
- Agarwal, M.;
- Behera, A. K.;
- Meshram, M. K.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 405, doi. 10.1049/el.2015.4131
- Yongle Wu;
- Lidan Yao;
- Lingxiao Jiao;
- Weimin Wang;
- Yuanan Liu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 372, doi. 10.1049/el.2015.4087
- Janković, N.;
- Niarchos, G.;
- Crnojević-Bengin, V.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 381, doi. 10.1049/el.2015.4061
- Yancheng Ma;
- Liang Fang;
- Guoan Wu
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 383, doi. 10.1049/el.2015.4033
- Andronov, A. A.;
- Dodin, E. P.;
- Nozdrin, Yu. N.;
- Pozdnyakova, V. I.;
- Sadofiev, Yu. G.;
- Fefelov, A. G.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 385, doi. 10.1049/el.2015.3995
- Butera, S.;
- Vines, P.;
- Tan, C. H.;
- Sandall, I.;
- Buller, G. S.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 338, doi. 10.1049/el.2015.3844
- Jie Zhuang;
- Qian Ye;
- Qiushi Tan;
- Ali, Abdulrahman Hussein
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 344, doi. 10.1049/el.2015.3934
- Linfeng Wang;
- Qiao Meng;
- Wenwei He;
- Daoyuan Zhang;
- Hengfei Ma
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 390, doi. 10.1049/el.2015.3779
- Bo Yang;
- Xiao Yu Peng;
- Wen Feng Zheng;
- Shan Liu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 335, doi. 10.1049/el.2015.3881
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 365, doi. 10.1049/el.2015.3729
- Qingshuang Zhang;
- Aijun Liu;
- Yingxian Zhang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 395, doi. 10.1049/el.2015.3671
- Hagmann, M. J.;
- Henage, T. E.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 362, doi. 10.1049/el.2015.3820
- Eonsu Noh;
- Kwang Hee Ko;
- Kangwook Kim
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 350, doi. 10.1049/el.2015.3809
- Kim, M.;
- Hangil Joe;
- Son-Ceol Yu
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 397, doi. 10.1049/el.2015.3052
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 348, doi. 10.1049/el.2015.3664
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 342, doi. 10.1049/el.2015.3613
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 354, doi. 10.1049/el.2015.3612
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 371, doi. 10.1049/el.2015.3392
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 387, doi. 10.1049/el.2015.3564
- Fan, L.;
- Monk, P. B.;
- Lakhtakia, A.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 376, doi. 10.1049/el.2015.3417
- Gaskell, A. A.;
- Stander, T.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 369, doi. 10.1049/el.2015.3337
- Varonen, M.;
- Safaripour, A.;
- Parveg, D.;
- Kangaslahti, P.;
- Gaier, T.;
- Hajimiri, A.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 388, doi. 10.1049/el.2015.3296
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 352, doi. 10.1049/el.2015.3326
- Ransom, P.;
- Larimore, Z.;
- Jensen, S.;
- Mirotznik, M. S.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 393, doi. 10.1049/el.2015.3268
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 357, doi. 10.1049/el.2015.3093
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 401, doi. 10.1049/el.2015.2931
- Yonghong Zhao;
- Linrang Zhang;
- Yabin Gu
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 361, doi. 10.1049/el.2015.2818
- Abolfazli, E.;
- Shah-Mansouri, V.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 472, doi. 10.1049/el.2015.4392
- Xu, Longtao;
- Jin, Shilei;
- Li, Yifei
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 355, doi. 10.1049/el.2015.2500
- Sangseok Hong;
- Lee, Jin S.;
- Tae-Yong Kuc
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 475, doi. 10.1049/el.2015.3583
- Liu, Jia;
- Fang, Ning;
- Jun Xie, Yong;
- Fa Wang, Bao
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 403, doi. 10.1049/el.2015.2919
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 434, doi. 10.1049/el.2015.4427
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 346, doi. 10.1049/el.2015.2637
- Bo Zhou;
- Shuli Liu;
- Patrick Chiang
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 359, doi. 10.1049/el.2015.2599
- H. W. Yu;
- Jeon, J. D.;
- Lee, B. H.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 464, doi. 10.1049/el.2015.3834
- Labrado, C.;
- Thapliyal, H.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 363, doi. 10.1049/el.2015.2188
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 485, doi. 10.1049/el.2016.0052
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 481, doi. 10.1049/el.2015.3420
- Akhendra Kumar, P.;
- Bheema Rao, N.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 483, doi. 10.1049/el.2015.3814
- Wen, Dingzhu;
- Yu, Guanding
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 5, p. 479, doi. 10.1049/el.2015.3921
- Kitagawa, S.;
- Suzuki, S.;
- Asada, M.
- Article