Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 4
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 296, doi. 10.1049/el.2015.4109
- Preis, S.;
- Wiens, A.;
- Maune, H.;
- Heinrich, W.;
- Jakoby, R.;
- Bengtsson, O.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 300, doi. 10.1049/el.2015.3738
- Tisserand, E.;
- Berviller, Y.;
- Humbert, J. B.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 304, doi. 10.1049/el.2015.3982
- Mughal, A. J.;
- Oh, S.;
- Myzaferi, A.;
- Nakamura, S.;
- Speck, J. S.;
- DenBaars, S. P.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 327, doi. 10.1049/el.2015.3979
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 310, doi. 10.1049/el.2015.3736
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 293, doi. 10.1049/el.2015.3379
- Gaoming Xu;
- Taijun Liu;
- Yan Ye;
- Jun Li;
- Ghannouchi, Fadhel M.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 256, doi. 10.1049/el.2015.3319
- Rong-Cang Han;
- Shun-Shi Zhong
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 298, doi. 10.1049/el.2015.3913
- Hao Xu;
- Yi-Jun Zhu;
- Yan-Yu Zhang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 268, doi. 10.1049/el.2015.3807
- Babaie-Fishani, A.;
- Rombouts, P.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 302, doi. 10.1049/el.2015.3277
- Yi Zhang;
- Dedong Han;
- Lingling Huang;
- Junchen Dong;
- Yingying Cong;
- Guodong Cui;
- Xiaomi Zhang;
- Xing Zhang;
- Shengdong Zhang;
- Yi Wang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 289, doi. 10.1049/el.2015.3706
- Lopez-Lapeña, O.;
- Serrano-Finetti, E.;
- Casas, O.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 255, doi. 10.1049/el.2015.3701
- Wolosinski, G.;
- Fusco, V.;
- Malyuskin, O.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 319, doi. 10.1049/el.2015.3694
- Arriaga-Trejo, I. A.;
- Flores-Troncoso, J.;
- Villanueva, J.;
- Simón, J.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 314, doi. 10.1049/el.2015.3571
- Zhongtao Liu;
- Zheng Zhong;
- Yong Xin Guo
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 285, doi. 10.1049/el.2015.3547
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 295, doi. 10.1049/el.2015.3520
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 264, doi. 10.1049/el.2015.3466
- Xiaoyu Dang;
- Ying Wang;
- Xiangbin Yu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 280, doi. 10.1049/el.2015.3456
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 287, doi. 10.1049/el.2015.3439
- Jinguang Hao;
- Wenjiang Pei;
- Kai Wang;
- Yili Xia
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 270, doi. 10.1049/el.2015.3432
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 260, doi. 10.1049/el.2015.3416
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 323, doi. 10.1049/el.2015.3239
- Khattabi, Y.;
- Matalgah, M. M.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 276, doi. 10.1049/el.2015.3235
- Jianwei Luo;
- Zhiguo Jiang;
- Jianguo Li
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 308, doi. 10.1049/el.2015.3232
- Rana, M.;
- Kabir, A.;
- Rafi, Md.;
- MRazib, M.;
- Jarin, S.;
- Khan, A. G.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 283, doi. 10.1049/el.2015.3218
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 253, doi. 10.1049/el.2015.3206
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 321, doi. 10.1049/el.2015.3174
- Houjun Huang;
- Shengyu Yao;
- Ruohua Zhou;
- Yonghong Yan
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 312, doi. 10.1049/el.2015.3136
- Rasti Boroujeni, S.;
- Shahabadi, M.;
- Rashed-Mohassel, J.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 306, doi. 10.1049/el.2015.3130
- Makoschitz, M.;
- Hartmann, M.;
- Ertl, H.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 291, doi. 10.1049/el.2015.3107
- Kao, H.-L.;
- Cho, C.-L.;
- Tseng, C.-L.;
- Chiu, H.-C.;
- Chen, Y.-Y.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 281, doi. 10.1049/el.2015.3097
- Limin Fan;
- Hua Chen;
- Meihui Chen;
- Si Gao
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 316, doi. 10.1049/el.2015.3092
- Khalili, A.;
- Soliman, A. A.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 258, doi. 10.1049/el.2015.3060
- Kgwadi, M.;
- Drysdale, T. D.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 266, doi. 10.1049/el.2015.2694
- Baba, A. A.;
- Hashmi, R. M.;
- Esselle, K. P.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 274, doi. 10.1049/el.2015.3055
- Cheon, S. H.;
- Eom, I. K.;
- Moon, Y. H.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 272, doi. 10.1049/el.2015.2583
- Myunghwan Eom;
- Dongkyoung Chwa
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 318, doi. 10.1049/el.2015.2126
- Weihua Kang;
- Xiaodong Zhang;
- Xian Ji;
- Yong Cai;
- Jiahui Zhou;
- Wenjun Xu;
- Qi Li;
- Gongli Xiao;
- Baoshun Zhang;
- Haiou Li
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 278, doi. 10.1049/el.2015.2353
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 262, doi. 10.1049/el.2015.1973
- Xuemin Yang;
- Zhi Zheng;
- Bin Hu
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 4, p. 325, doi. 10.1049/el.2015.1703
- Shang-Chi Wu;
- Tai-Cheng Lee
- Article