Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 25
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2068, doi. 10.1049/el.2016.3197
- Minglei Yang;
- Lei Sun;
- Xin Yuan;
- Baixiao Chen
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2072, doi. 10.1049/el.2016.3461
- González-Domínguez, M.;
- Bao, D.;
- Dadín, S.;
- Cuiñas, I.;
- Sánchez, M. G.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2040, doi. 10.1049/el.2016.3524
- Jihoon Kim;
- Hongjong Park;
- Sangho Lee;
- Jaeduk Kim;
- Wangyong Lee;
- Changhoon Lee;
- Youngwoo Kwon
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2026, doi. 10.1049/el.2016.4146
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2027, doi. 10.1049/el.2016.4142
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2067, doi. 10.1049/el.2016.3789
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2063, doi. 10.1049/el.2016.3747
- Maheshwari, J.;
- George, N. V.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2053, doi. 10.1049/el.2016.3658
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2065, doi. 10.1049/el.2016.3670
- Jianhua He;
- Zuoyin Tang;
- Zhongzhi Che
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2044, doi. 10.1049/el.2016.3557
- Jin, H.;
- Moon, K.;
- Lee, S.;
- Kim, B.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2051, doi. 10.1049/el.2016.3561
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2055, doi. 10.1049/el.2016.3450
- Mirzavand, F.;
- Nayyeri, V.;
- Soleimani, M.;
- Mirzavand, R.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2061, doi. 10.1049/el.2016.3543
- Jingu Lee;
- Daehyun Kim;
- Seonghee Jeong;
- Gil-Cho Ahn;
- Younglok Kim
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2031, doi. 10.1049/el.2016.3390
- Benko, P. L.;
- Galeti, M.;
- Pereira, C. F.;
- Lucchi, J. C.;
- Giacomini, R.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2042, doi. 10.1049/el.2016.3536
- Dongquan Sun;
- Zhenhua Chen;
- Changfei Yao;
- Jinping Xu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2048, doi. 10.1049/el.2016.3364
- Jun Wang;
- Zhongxiang Shen;
- Lei Zhao
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2059, doi. 10.1049/el.2016.3494
- Qi Yang;
- Bin Deng;
- Hongqiang Wang;
- Yuliang Qin
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2046, doi. 10.1049/el.2016.3170
- Chuanming Zhu;
- Jin Xu;
- Wei Kang;
- Wen Wu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2050, doi. 10.1049/el.2016.2789
- Mingdi Ding;
- Yibin Zhang;
- Jianwei Xu;
- Desheng Zhao;
- Hongjuan Huang;
- Xin Xu;
- Zhenlin Miao;
- Peng He;
- Yanming Wang;
- Yongjun Dong;
- Baoshun Zhang;
- Yong Cai
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2029, doi. 10.1049/el.2016.2893
- Bang, J.-H.;
- Jeong, Y.-S.;
- Kim, C.-H.;
- Li, S.;
- Ahn, B.-C.;
- Choi, S.-G.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2034, doi. 10.1049/el.2016.2982
- Haixin Song;
- Woogeun Rhee;
- Inbo Shim;
- Zhihua Wang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2070, doi. 10.1049/el.2016.2444
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2036, doi. 10.1049/el.2016.2944
- Peng Liu;
- Jun Guo;
- Yingtao Jiang
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2038, doi. 10.1049/el.2016.2718
- Jinbo Wu;
- Wenjian Huang;
- Yuchen Song;
- Jinguo Zhang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2057, doi. 10.1049/el.2016.1253
- Ishihara, M.;
- Umetani, K.;
- Umegami, H.;
- Hiraki, E.;
- Yamamoto, M.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2032, doi. 10.1049/el.2016.2932
- Moonesan, M.;
- Mirzaee, R. Faghih;
- Daliri, M. Sam;
- Navi, K.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2068, doi. 10.1049/el.2016.3197
- Yang, Minglei;
- Sun, Lei;
- Yuan, Xin;
- Chen, Baixiao
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2070, doi. 10.1049/el.2016.2444
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2061, doi. 10.1049/el.2016.3543
- Lee, Jingu;
- Kim, Daehyun;
- Jeong, Seonghee;
- Ahn, Gil‐Cho;
- Kim, Younglok
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2074, doi. 10.1049/el.2016.1796
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2067, doi. 10.1049/el.2016.3789
- Li, Chenglong;
- Chen, Xihong
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2036, doi. 10.1049/el.2016.2944
- Liu, Peng;
- Guo, Jun;
- Jiang, Yingtao
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2076, doi. 10.1049/el.2016.4186
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2074, doi. 10.1049/el.2016.1796
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2072, doi. 10.1049/el.2016.3461
- González‐Domínguez, M.;
- Bao, D.;
- Dadín, S.;
- Cuiñas, I.;
- Sánchez, M.G.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2065, doi. 10.1049/el.2016.3670
- He, Jianhua;
- Tang, Zuoyin;
- Che, Zhongzhi
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2040, doi. 10.1049/el.2016.3524
- Kim, Jihoon;
- Park, Hongjong;
- Lee, Sangho;
- Kim, Jaeduk;
- Lee, Wangyong;
- Lee, Changhoon;
- Kwon, Youngwoo
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2063, doi. 10.1049/el.2016.3747
- Maheshwari, J.;
- George, N.V.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2059, doi. 10.1049/el.2016.3494
- Yang, Qi;
- Deng, Bin;
- Wang, Hongqiang;
- Qin, Yuliang
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2057, doi. 10.1049/el.2016.1253
- Ishihara, M.;
- Umetani, K.;
- Umegami, H.;
- Hiraki, E.;
- Yamamoto, M.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2055, doi. 10.1049/el.2016.3450
- Mirzavand, F.;
- Nayyeri, V.;
- Soleimani, M.;
- Mirzavand, R.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2053, doi. 10.1049/el.2016.3658
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2051, doi. 10.1049/el.2016.3561
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2050, doi. 10.1049/el.2016.2789
- Ding, Mingdi;
- Zhang, Yibin;
- Xu, Jianwei;
- Zhao, Desheng;
- Huang, Hongjuan;
- Xu, Xin;
- Miao, Zhenlin;
- He, Peng;
- Wang, Yanming;
- Dong, Yongjun;
- Zhang, Baoshun;
- Cai, Yong
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2048, doi. 10.1049/el.2016.3364
- Wang, Jun;
- Shen, Zhongxiang;
- Zhao, Lei
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2046, doi. 10.1049/el.2016.3170
- Zhu, Chuanming;
- Xu, Jin;
- Kang, Wei;
- Wu, Wen
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2042, doi. 10.1049/el.2016.3536
- Sun, Dongquan;
- Chen, Zhenhua;
- Yao, Changfei;
- Xu, Jinping
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 25, p. 2044, doi. 10.1049/el.2016.3557
- Jin, H.;
- Moon, K.;
- Lee, S.;
- Kim, B.
- Article