Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 23
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1929, doi. 10.1049/el.2016.2955
- Cheng Guo;
- Jin Li;
- Dinh, Duc D.;
- Xiaobang Shang;
- Lancaster, Michael J.;
- Jun Xu
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1900, doi. 10.1049/el.2016.3829
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1901, doi. 10.1049/el.2016.3826
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1908, doi. 10.1049/el.2016.3368
- Verbeke, M.;
- Rombouts, P.;
- Yin, X.;
- Torfs, G.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1931, doi. 10.1049/el.2016.3432
- Jahanbakhshi, M.;
- Hayati, M.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1961, doi. 10.1049/el.2016.2688
- Schmidt, J. F.;
- Schilcher, U.;
- Bettstetter, C.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1912, doi. 10.1049/el.2016.3371
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1946, doi. 10.1049/el.2016.3076
- Chunhui Chen;
- Qun Zhang;
- Fufei Gu;
- Ying Luo
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1918, doi. 10.1049/el.2016.2670
- Chao Qi;
- JiangxingWu;
- Hongchao Hu;
- Guozhen Cheng
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1942, doi. 10.1049/el.2016.3350
- Kun Peng;
- Zhen Wang;
- Huan Zhan;
- Li Ni;
- Cong Gao;
- Xiaolong Wang;
- Yuying Wang;
- Jianjun Wang;
- Feng Jing;
- Aoxiang Lin
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1937, doi. 10.1049/el.2016.3288
- Arayashiki, Y.;
- Ikeda, M.;
- Amano, Y.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1960, doi. 10.1049/el.2016.3245
- Jiangqiao Ding;
- Dong Liu;
- Shengcai Shi;
- Wen Wu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1910, doi. 10.1049/el.2016.3240
- Tadros, R. N.;
- Dasari, N.;
- Beerel, P. A.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1904, doi. 10.1049/el.2016.3223
- Tan, K. H.;
- Goh, P.;
- Ain, M. F.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1965, doi. 10.1049/el.2016.3100
- Dempster, A. G.;
- Cetin, E.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1948, doi. 10.1049/el.2016.3087
- Jie Chen;
- Kai Wang;
- Wei Yang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1925, doi. 10.1049/el.2016.3079
- Fan Ding;
- Hui Wang;
- Shengli Zhang;
- Mingjun Dai
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1916, doi. 10.1049/el.2016.2403
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1920, doi. 10.1049/el.2016.2098
- Ko, J.;
- Heo, M.;
- Lee, J.;
- Kim, C.;
- Lee, M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1903, doi. 10.1049/el.2016.2902
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1924, doi. 10.1049/el.2016.2885
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1906, doi. 10.1049/el.2016.2694
- Kossel, M.;
- Brändli, M.;
- Francese, P.;
- Kull, L.;
- Menolfi, C.;
- Morf, T.;
- Toifl, T.;
- Cevrero, A.;
- Luu, D.;
- Özkaya, I.;
- Yüksel, H.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1944, doi. 10.1049/el.2016.2779
- Shilin Guo;
- Jianhui Su;
- Xuejian Chen;
- Xiang Yu
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1958, doi. 10.1049/el.2016.1834
- Buchanan, N. B.;
- Fusco, V.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1922, doi. 10.1049/el.2016.1783
- Reviriego, Pedro;
- Shanshan Liu;
- Liyi Xiao;
- Maestro, Juan Antonio
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1927, doi. 10.1049/el.2016.2686
- Zhaoyang Weng;
- Hanjun Jiang;
- Jingjing Dong;
- Fule Li;
- Zhihua Wang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1956, doi. 10.1049/el.2016.1523
- Chao Tong;
- Jun Li;
- Weizhi Zhang
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1941, doi. 10.1049/el.2016.1226
- Xereas, G.;
- Chodavarapu, V. P.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1963, doi. 10.1049/el.2016.1099
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1952, doi. 10.1049/el.2016.0803
- Hwang, J. Y.;
- Kim, J. K.;
- Moon, S. J.;
- Hong, M. T.;
- Yun, E. J.;
- Bae, B. S.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2021, doi. 10.1049/el.2016.2742
- Liu, Lanqi;
- Zhang, Kefeng;
- Liu, Dongsheng;
- Zou, Xuecheng;
- Hu, Ang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2019, doi. 10.1049/el.2016.3480
- Xu, C.;
- Cosmas, J.;
- Zhang, Y.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2017, doi. 10.1049/el.2016.3318
- Amouri, B.;
- Ghanem, K.;
- Kaddeche, M.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2015, doi. 10.1049/el.2016.2370
- Jiang, Xianliang;
- Jin, Guang
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2013, doi. 10.1049/el.2016.3305
- Wang, Song;
- Hu, Ruimin;
- Chen, Shihong;
- Wang, Xiaochen;
- Yang, Yuhong;
- Tu, Weiping
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2011, doi. 10.1049/el.2016.3517
- Chen, Long;
- Yang, Xining;
- Fu, Ping;
- Xu, Zhengming;
- Zhang, Cishen
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2009, doi. 10.1049/el.2016.2352
- Sun, Dan;
- Zhou, Wenzhi;
- Zheng, Zhihao
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2007, doi. 10.1049/el.2016.3427
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2005, doi. 10.1049/el.2016.2572
- Li, Gang;
- Yu, Shengbao;
- Shi, Jing
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2003, doi. 10.1049/el.2016.3055
- Pourhashemi, A.;
- Farrell, R.M.;
- Cohen, D.A.;
- Becerra, D.L.;
- DenBaars, S.P.;
- Nakamura, S.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 2001, doi. 10.1049/el.2016.3188
- Sasamal, T.N.;
- Singh, A.K.;
- Ghanekar, U.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1999, doi. 10.1049/el.2016.2941
- Diebold, S.;
- Nishio, K.;
- Nishida, Y.;
- Kim, J.‐Y.;
- Tsuruda, K.;
- Mukai, T.;
- Fujita, M.;
- Nagatsuma, T.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1990, doi. 10.1049/el.2016.2872
- Ahmad, Ayaz;
- Khan, Muhammad Toaha Raza;
- Kaleem, Zeeshan
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1988, doi. 10.1049/el.2016.2299
- Xu, Yan;
- Wang, Quanwei;
- Wei, Zhenyu;
- Ma, Shuo
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1996, doi. 10.1049/el.2016.3073
- Boutejdar, A.;
- Ibrahim, A.A.;
- Ali, W.A.E.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1978, doi. 10.1049/el.2016.1991
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1984, doi. 10.1049/el.2016.2946
- Zhao, Yuanyi;
- Johnston, Martin;
- Tsimenidis, Charalampos;
- Chen, Li
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1998, doi. 10.1049/el.2016.3442
- Zou, Wanghui;
- Chen, Diping;
- Peng, Wei;
- Zeng, Yun
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1961, doi. 10.1049/el.2016.2688
- Schmidt, J.F.;
- Schilcher, U.;
- Bettstetter, C.
- Article