Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 22
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 75, doi. 10.1049/el.2016.3181
- Kang, D.;
- Tak, J.;
- Choi, J.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 19, doi. 10.1049/el.2016.2135
- Hayder, A. S.;
- Kim, S. Y.;
- Abbasizadeh, H.;
- Lee, K. Y.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 13, doi. 10.1049/el.2016.1682
- Qu, L.;
- Zhang, R.;
- Shin, H.;
- Kim, J.;
- Kim, H.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 17, doi. 10.1049/el.2016.2114
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 43, doi. 10.1049/el.2016.2846
- Idris, A. S.;
- Jiang, H.;
- Hamamoto, K.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 1821, doi. 10.1049/el.2016.3636
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 79, doi. 10.1049/el.2016.3372
- Nam, W. I.;
- Kang, E. K.;
- Park, H. G.;
- Jun, D.-H.;
- Song, Y. M.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 77, doi. 10.1049/el.2016.3201
- Rugui Yao;
- Fei Xu;
- Mekkawy, Tamer;
- Juan Xu
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 39, doi. 10.1049/el.2016.2728
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 73, doi. 10.1049/el.2016.3174
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 71, doi. 10.1049/el.2016.3123
- Shaker, G.;
- Chen, R.;
- Milligan, B.;
- Qu, T.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 69, doi. 10.1049/el.2016.3120
- Oshima, N.;
- Hashimoto, K.;
- Suzuki, S.;
- Asada, M.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 67, doi. 10.1049/el.2016.3108
- Zota, C. B.;
- Lindelöw, F.;
- Wernersson, L.-E.;
- Lind, E.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 65, doi. 10.1049/el.2016.3056
- Mazumder, O.;
- Kundu, A.;
- Lenka, P.;
- Bhaumik, S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 63, doi. 10.1049/el.2016.3049
- Hyoung, C. H.;
- Hwang, J. H.;
- Lee, J. H.;
- Kang, S. W.;
- Kim, Y. T.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 61, doi. 10.1049/el.2016.2987
- Ogiso, Y.;
- Ozaki, J.;
- Kashio, N.;
- Kikuchi, N.;
- Tanobe, H.;
- Ohiso, Y.;
- Kohtoku, M.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 59, doi. 10.1049/el.2016.2986
- Zizoua, C.;
- Raison, M.;
- Boukhenous, S.;
- Attari, M.;
- Achiche, S.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 57, doi. 10.1049/el.2016.2974
- Olenko, A.;
- Wong, K. T.;
- Mir, H.;
- Al-Nashash, H.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 55, doi. 10.1049/el.2016.2901
- Congiu, M.;
- Albano, L. G. S.;
- Nunes-Neto, O.;
- Graeff, C. F. O.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 53, doi. 10.1049/el.2016.2871
- Xiang, D. P.;
- Botha, M. M.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 51, doi. 10.1049/el.2016.2870
- Hakla, N.;
- Ghosh, S.;
- Srivastava, K. V.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 49, doi. 10.1049/el.2016.2867
- de Medeiros, J. E. G.;
- Haddad, S. A. P.;
- de Menezes, L. R. A. X.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 47, doi. 10.1049/el.2016.2864
- Escribano, F. J.;
- Sáez-Landete, J.;
- Wagemakers, A.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 45, doi. 10.1049/el.2016.2851
- Fuchs, C.;
- Berger, C.;
- Möller, C.;
- Weseloh, M.;
- Reinhard, S.;
- Hader, J.;
- Moloney, J. V.;
- Koch, S. W.;
- Stolz, W.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 27, doi. 10.1049/el.2016.2526
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 41, doi. 10.1049/el.2016.2838
- Singh, V.;
- Killamsetty, V. K.;
- Mukherjee, B.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 37, doi. 10.1049/el.2016.2692
- Qirun Huo;
- Jianwu Li;
- Yao Lu
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 33, doi. 10.1049/el.2016.2626
- Zhiping Zeng;
- Haidong Xiao;
- Xinpeng Zhang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 35, doi. 10.1049/el.2016.2680
- Yong Li;
- Ruikun Mai;
- Yeran Liu;
- Zhengyou He
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 31, doi. 10.1049/el.2016.2574
- Santini, T. R. S.;
- Ibrahim, T. S.;
- Maciel, C. D.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 15, doi. 10.1049/el.2016.1953
- Feng-Gang Yan;
- Tao Jin;
- Ming Jin;
- Yi Shen
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 29, doi. 10.1049/el.2016.2567
- Hanjun Jiang;
- Zhaoyang Weng;
- Yang Li;
- Jingjing Dong;
- Woogeun Rhee;
- Zhihua Wang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 11, doi. 10.1049/el.2016.1427
- Zhou, M.;
- Sun, Z.;
- Low, Q.;
- Siek, L.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 25, doi. 10.1049/el.2016.2501
- Cai Long Jin;
- Xiao Peng Yu;
- Wen-Quan Sui
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 23, doi. 10.1049/el.2016.2380
- Wenjie Feng;
- Meiling Hong;
- Wenquan Che
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 21, doi. 10.1049/el.2016.2203
- Danaeian, M.;
- Moznebi, A.-R.;
- Afrooz, K.;
- Hakimi, H.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 9, doi. 10.1049/el.2016.1398
- Tisserand, E.;
- Berviller, Y.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 3, doi. 10.1049/el.2016.0831
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 5, doi. 10.1049/el.2016.1111
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 7, doi. 10.1049/el.2016.1328
- Yang Zhao;
- Yong Ding;
- XinYu Zhao
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 1, doi. 10.1049/el.2016.0733
- Xiaohu Ru;
- Zhitao Huang;
- Zheng Liu;
- Wenli Jiang
- Article