Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 21
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1797, doi. 10.1049/el.2016.2220
- Shilin Guo;
- Jianhui Su;
- Xuejian Chen;
- Xiang Yu
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1799, doi. 10.1049/el.2016.0091
- Ziyi Hao;
- Xiaoyan Xiang;
- Chen Chen;
- Jianyi Meng;
- Xiaolang Yan
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1801, doi. 10.1049/el.2016.2740
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1816, doi. 10.1049/el.2016.2850
- Agiwal, M.;
- Maheshwari, M. K.;
- Saxena, N.;
- Roy, A.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1815, doi. 10.1049/el.2016.2241
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1811, doi. 10.1049/el.2016.2016
- Kanehira, T.;
- Imanishi, Y.;
- Hayashi, H.;
- Nakaoka, T.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1813, doi. 10.1049/el.2016.2664
- Romanczyk, B.;
- Guidry, M.;
- Wienecke, S.;
- Li, H.;
- Ahmadi, E.;
- Zheng, X.;
- Keller, S.;
- Mishra, U. K.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1809, doi. 10.1049/el.2016.2217
- Yang Li;
- Kunzhe Zhang;
- Linan Yang;
- Lin Du
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1805, doi. 10.1049/el.2016.2972
- Zhibin Wang;
- Yanyang Liu;
- Zhenfang Li;
- Gang Xu;
- Junli Chen
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1807, doi. 10.1049/el.2016.2926
- Xiaohui Zhao;
- Yicheng Jiang;
- Wen-Qin Wang
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1804, doi. 10.1049/el.2016.2356
- Min-Ho Ka;
- Baskakov, Aleksandr. I.;
- Se-Yeon Jeon;
- Inchan Paek;
- Jonghun Jang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1795, doi. 10.1049/el.2016.2713
- Lisi Tian;
- Feng Wu;
- Jin Zhao
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1780, doi. 10.1049/el.2016.2225
- Yun-Long Lu;
- Yi Wang;
- Changzhou Hua;
- Taijun Liu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1788, doi. 10.1049/el.2016.3021
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1790, doi. 10.1049/el.2016.2315
- Khadir, S.;
- Zeng, L.;
- Chakaroun, M.;
- Fischer, A. P. A.;
- Lamrous, O.;
- Boudrioua, A.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1794, doi. 10.1049/el.2016.2412
- Holl, P.;
- Rattunde, M.;
- Adler, S.;
- Bächle, A.;
- Diwo-Emmer, E.;
- Aidam, R.;
- Wagner, J.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1792, doi. 10.1049/el.2016.2218
- Jian Zhang;
- Shuming Chen;
- Chao Yang;
- Yaohua Wang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1784, doi. 10.1049/el.2016.2154
- Chen, C.-C.;
- Sim, C. Y. D.;
- Wu, Y.-J.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1786, doi. 10.1049/el.2016.2392
- Moradi, B.;
- Matrinez, U.;
- Garcia, J.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1774, doi. 10.1049/el.2016.2450
- Deng, E. Y.;
- Prenat, G.;
- Anghel, L.;
- Zhao, W. S.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1761, doi. 10.1049/el.2016.2409
- Sai Huang;
- Yuanyuan Yao;
- Yan Xiao;
- Zhiyong Feng
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1771, doi. 10.1049/el.2016.2081
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1782, doi. 10.1049/el.2016.2166
- Yong Gao;
- En Li;
- Gaofeng Guo
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1759, doi. 10.1049/el.2016.2808
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1778, doi. 10.1049/el.2016.2712
- Zhaosheng He;
- Chang Jiang You;
- Supeng Leng;
- Xiang Li
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1776, doi. 10.1049/el.2016.2824
- Chen Hai-Tao;
- Zhang Zhi-Guang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1769, doi. 10.1049/el.2016.1243
- Yiyuan Wang;
- Dantong Ouyang;
- Liming Zhang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1765, doi. 10.1049/el.2016.1592
- Yantao Liu;
- Morgan, Yasser
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1772, doi. 10.1049/el.2016.2947
- Lemmon, A.;
- Freeborn, T. J.;
- Shahabi, A.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1763, doi. 10.1049/el.2016.2777
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1767, doi. 10.1049/el.2016.2548
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1755, doi. 10.1049/el.2016.1792
- Qureshi, M. A.;
- Deriche, M.;
- Beghdadi, A.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1753, doi. 10.1049/el.2016.2661
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1751, doi. 10.1049/el.2015.3883
- Changyuan Wang;
- Derong Chen;
- Meng Li;
- Jiulu Gong
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1749, doi. 10.1049/el.2016.2682
- Labate, G.;
- Matekovits, L.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1748, doi. 10.1049/el.2016.2375
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1757, doi. 10.1049/el.2016.2324
- Preethi, C. M.;
- Vanathi, P. T.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1868, doi. 10.1049/el.2016.2846
- Idris, A.S.;
- Jiang, H.;
- Hamamoto, K.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1879, doi. 10.1049/el.2016.3201
- Yao, Rugui;
- Xu, Fei;
- Mekkawy, Tamer;
- Xu, Juan
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1746, doi. 10.1049/el.2016.2755
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1742, doi. 10.1049/el.2016.1626
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1740, doi. 10.1049/el.2016.2825
- Oh, K.-I.;
- Kang, T. W.;
- Kim, S. E.;
- Park, H.-I.;
- Lim, I. G.;
- Kang, S. W.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1739, doi. 10.1049/el.2016.2733
- Hongyan Tang;
- Ke Wang;
- Runmiao Wu;
- Chao Yu
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1744, doi. 10.1049/el.2016.2961
- Biolek, D.;
- Biolek, Z.;
- Biolkova, V.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1881, doi. 10.1049/el.2016.3049
- Hyoung, C.H.;
- Hwang, J.H.;
- Lee, J.H.;
- Kang, S.W.;
- Kim, Y.T.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1866, doi. 10.1049/el.2016.2987
- Ogiso, Y.;
- Ozaki, J.;
- Kashio, N.;
- Kikuchi, N.;
- Tanobe, H.;
- Ohiso, Y.;
- Kohtoku, M.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1737, doi. 10.1049/el.2016.3459
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1736, doi. 10.1049/el.2016.3457
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1897, doi. 10.1049/el.2016.3120
- Oshima, N.;
- Hashimoto, K.;
- Suzuki, S.;
- Asada, M.
- Article