Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 20
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1731, doi. 10.1049/el.2016.1245
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1729, doi. 10.1049/el.2016.1583
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1727, doi. 10.1049/el.2016.2431
- Xiaodong Xu;
- Yi Zhang;
- Xiaofeng Tao
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1725, doi. 10.1049/el.2016.3060
- Pan Mian;
- Jiang Jie;
- Li Zhu;
- Cao Jing;
- Zhou Tao
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1723, doi. 10.1049/el.2016.2360
- Youda Wan;
- Feiqiang Chen;
- Junwei Nie;
- Guangfu Sun
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1721, doi. 10.1049/el.2016.2798
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1719, doi. 10.1049/el.2016.1000
- Zhirui Wang;
- Jia Xu;
- Zuzhen Huang;
- Xiang-Gen Xia;
- Xudong Zhang
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1717, doi. 10.1049/el.2016.0675
- Bin Gou;
- Xing-Lai Ge;
- Yong-Chao Liu;
- Xiao-Yun Feng
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1715, doi. 10.1049/el.2016.2835
- Xuefeng Hu;
- Linpeng Li;
- Yongchao Li;
- Guiyang Wu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1714, doi. 10.1049/el.2016.1890
- Mohd Zin, A. A.;
- Naderipour, A.;
- Hafiz Habibuddin, M.;
- Guerrero, J. M.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1712, doi. 10.1049/el.2016.1174
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1710, doi. 10.1049/el.2016.2638
- Shu Zhong;
- Jianping Xu;
- Sheng Zhao;
- Xiang Zhou
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1708, doi. 10.1049/el.2016.1728
- Hussain, S.;
- Won, Y.-Y.;
- Seo, D. S.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1707, doi. 10.1049/el.2016.2260
- Tsai, Y.-C.;
- Zhong, Y.-N.;
- Chou, F.-P.;
- Huang, C.-A.;
- Hsin, Y.-M.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1705, doi. 10.1049/el.2016.2359
- Maegami, Y.;
- Takei, R.;
- Cong, G.;
- Ohno, M.;
- Okano, M.;
- Horikawa, T.;
- Yamada, K.;
- Kamei, T.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1703, doi. 10.1049/el.2016.1406
- Park, D. H.;
- Yun, V.;
- Luo, J.;
- Jen, A. K.-Y.;
- Herman, W. N.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1701, doi. 10.1049/el.2016.2132
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1699, doi. 10.1049/el.2016.2495
- Gatti, R. Vincenti;
- Rossi, R.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1697, doi. 10.1049/el.2016.2554
- Allanic, R.;
- Quéré, Y.;
- Le Berre, D.;
- Quendo, C.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1695, doi. 10.1049/el.2016.1519
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1694, doi. 10.1049/el.2016.2027
- Jie Xu;
- Yinjie Cui;
- Jian Guo;
- Zhengbin Xu;
- Cheng Qian;
- Wenyuan Li
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1692, doi. 10.1049/el.2016.1815
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1690, doi. 10.1049/el.2016.2091
- Bing Xue;
- Guangyou Fang;
- Yicai Ji
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1688, doi. 10.1049/el.2016.1446
- Nascimento, D. S. C.;
- Canuto, A. M. P.;
- Coelho, A. L. V.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1687, doi. 10.1049/el.2016.2654
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1685, doi. 10.1049/el.2016.2115
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1683, doi. 10.1049/el.2016.2596
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1681, doi. 10.1049/el.2016.2494
- Junyan Huo;
- Dongchun Mo;
- Fuzheng Yang;
- Weisi Lin
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1679, doi. 10.1049/el.2016.0841
- Yang, C.;
- Ku, B.;
- Han, D.K.;
- Ko, H.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1677, doi. 10.1049/el.2016.2338
- Haopeng Zhang;
- Zhiguo Jiang
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1675, doi. 10.1049/el.2016.1660
- Zheyao Xu;
- Yukun Chen;
- Naiming Qi;
- Qilong Sun;
- Yulong Fan;
- Chaolei Wang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1673, doi. 10.1049/el.2016.2645
- S.Wang;
- Wang, W.;
- Yakopcic, C.;
- Shin, E.;
- Subramanyam, G.;
- Taha, T. M.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1671, doi. 10.1049/el.2016.0984
- Yonghong Bai;
- Liji Wu;
- Xingjun Wu;
- Xiangyu Li;
- Xiangmin Zhang;
- Beibei Wang
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1669, doi. 10.1049/el.2016.2138
- Biolek, Z.;
- Biolek, D.;
- Biolkova, V.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1667, doi. 10.1049/el.2016.0942
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1665, doi. 10.1049/el.2016.2610
- Hanjun Jiang;
- Xiyang Zhu;
- Wenao Xie;
- Feng Guo;
- Chun Zhang;
- Zhihua Wang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1663, doi. 10.1049/el.2016.1652
- Araujo, C.;
- Silva, F.;
- Costa, I.;
- Vaz, F.;
- Kosta, S.;
- Maciel, P.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1662, doi. 10.1049/el.2015.3984
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1660, doi. 10.1049/el.2016.2622
- Hanjun Jiang;
- Zheyao Wang;
- Shujie Yang;
- Heng Liu;
- Zhihua Wang
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1658, doi. 10.1049/el.2016.1926
- Antonino-Daviu, E.;
- Mohamed Mohamed-Hicho, N.;
- Cabedo-Fabrés, M.;
- Ferrando-Bataller, M.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1656, doi. 10.1049/el.2016.2505
- Mirzaee, M.;
- Noghanian, S.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1654, doi. 10.1049/el.2016.2110
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1653, doi. 10.1049/el.2016.1360
- Lv-Wei Chen;
- Yuehe Ge;
- Bird, Trevor S.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 20, p. 1651, doi. 10.1049/el.2016.2538
- Maezawa, K.;
- Fujino, S.;
- Yamaoka, T.;
- Mori, M.
- Article