Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 17
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1422, doi. 10.1049/el.2016.2711
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2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1421, doi. 10.1049/el.2016.2709
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4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1457, doi. 10.1049/el.2016.2476
- Krengel, E. I.;
- Ivanov, P. V.
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5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1438, doi. 10.1049/el.2016.2123
- Tay, J. J.;
- Wong, M. L. D.;
- Wong, M. M.;
- Zhang, C.;
- Hijazin, I.
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6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1490, doi. 10.1049/el.2016.2289
- Colalongo, L.;
- Richelli, A.;
- Kovács-Vajna, Zs. M.
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7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1499, doi. 10.1049/el.2016.2274
- Shu Zhong;
- Jianping Xu;
- Xuejian Chen;
- Xiang Zhou
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8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1436, doi. 10.1049/el.2016.2096
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9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1478, doi. 10.1049/el.2016.1740
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10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1463, doi. 10.1049/el.2016.2202
- Chuanming Zhu;
- Jin Xu;
- Wei Kang;
- Wen Wu
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11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1433, doi. 10.1049/el.2016.2198
- Khil, S. Khojet El;
- Jlassi, I.;
- Estima, J. O.;
- Mrabet-Bellaaj, N.;
- Cardoso, A. J. Marques
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12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1488, doi. 10.1049/el.2016.2033
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13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1474, doi. 10.1049/el.2016.2025
- Mingkun Zhang;
- Wang, Kang L.;
- Hexin Jiang;
- Rongdun Hong;
- Zhengyun Wu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1446, doi. 10.1049/el.2016.2109
- Yi Xie;
- Levine, Martin D.;
- Huimin Yu
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1441, doi. 10.1049/el.2016.2048
- Chong Zhu;
- Zhiyong Zeng;
- Rongxiang Zhao
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1482, doi. 10.1049/el.2016.2037
- Zhihui Xin;
- Guisheng Liao;
- Zhiwei Yang
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1469, doi. 10.1049/el.2016.1563
- Hui Chen;
- Di Jiang;
- Xu Chen
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18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1425, doi. 10.1049/el.2016.1996
- Mathew, S.;
- Ameen, M.;
- Jayakrishnan, M. P.;
- Mohanan, P.;
- Vasudevan, K.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1467, doi. 10.1049/el.2016.2010
- Bo Zhang;
- Gaoya Dong;
- Yongle Wu;
- Cuiping Yu;
- Yuanan Liu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1430, doi. 10.1049/el.2016.1992
- Supriya, S.;
- Siuly, S.;
- Zhang, Y.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1484, doi. 10.1049/el.2016.1986
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22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1451, doi. 10.1049/el.2016.1983
- Zhaoxi Fang;
- Feng Liang;
- Jun Li;
- Yang Wang
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23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1461, doi. 10.1049/el.2016.1944
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24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1497, doi. 10.1049/el.2016.1893
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25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1465, doi. 10.1049/el.2016.1876
- Abdel-Wahab, W. M.;
- Ehsandar, A.;
- Al-Saedi, H.;
- Safavi-Naeini, S.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1426, doi. 10.1049/el.2016.1825
- Huan Zhang;
- Yong-Chang Jiao;
- Gang Zhao;
- Chi Zhang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1453, doi. 10.1049/el.2016.1799
- Shiyuan Wang;
- Yunfei Zheng;
- Shukai Duan;
- Lidan Wang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1501, doi. 10.1049/el.2016.1797
- Shu Li;
- Zhongming Xu;
- Yansong He;
- Zhifei Zhang;
- Qinghua Wang
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1503, doi. 10.1049/el.2016.1773
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1492, doi. 10.1049/el.2016.1715
- Karatsori, T. A.;
- Theodorou, C. G.;
- Dimitriadis, C. A.;
- Ghibaudo, G.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1486, doi. 10.1049/el.2016.1636
- Chong Hu;
- Feng Luo;
- Linrang Zhang;
- Yifei Fan;
- Shuailin Chen
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1445, doi. 10.1049/el.2016.1731
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33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1476, doi. 10.1049/el.2016.1103
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34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1455, doi. 10.1049/el.2016.1709
- De Deckere, B.;
- Van Londersele, A.;
- De Zutter, D.;
- Ginste, D. Vande
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35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1495, doi. 10.1049/el.2016.1393
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36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1449, doi. 10.1049/el.2016.1614
- Ostojić, V.;
- Starčević, D.;
- Petrović, V.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1480, doi. 10.1049/el.2016.1595
- Huang Darong;
- Feng Cunqian;
- Tong Ningning;
- Guo Yiduo
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1440, doi. 10.1049/el.2016.1565
- Ivanović, V. N.;
- Jovanovski, S.;
- Radović, N.
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39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1459, doi. 10.1049/el.2015.3748
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40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1432, doi. 10.1049/el.2016.1035
- Xinpeng Xing;
- Peng Zhu;
- Hui Liu;
- Ye Liu;
- Gielen, Georges
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1428, doi. 10.1049/el.2016.0975
- Rafiue, M. A.;
- Lee, B. G.;
- Jeon, M.
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42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1472, doi. 10.1049/el.2016.0905
- Shimada, S.;
- Tanaka, H.;
- Hasebe, K.;
- Hayashi, N.;
- Ochi, Y.;
- Matsui, T.;
- Nishizaki, I.;
- Matsumoto, Y.;
- Tanaka, Y.;
- Nakamura, H.;
- Mizuno, Y.;
- Nakamura, K.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1493, doi. 10.1049/el.2016.0912
- Xingyu He;
- Ningning Tong;
- Xiaowei Hu
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1471, doi. 10.1049/el.2016.0644
- Kawahara, H.;
- Yamamoto, S.;
- Fukutoku, M.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1444, doi. 10.1049/el.2016.0611
- Yanfang Liu;
- Hong Liu;
- Dongfang Zhu
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