Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 13
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1185, doi. 10.1049/el.2015.4420
- Yasen Wang;
- Qinglong Bao;
- Zengping Chen
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1172, doi. 10.1049/el.2016.0938
- Weiwei He;
- Jing Chen;
- Jiexin Luo;
- Zhan Chai;
- Xi Wang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1170, doi. 10.1049/el.2016.1156
- Armstrong, A. M.;
- Allerman, A. A.;
- Fischer, A. J.;
- King, M. P.;
- van Heukelom, M. S.;
- Moseley, M. W.;
- Kaplar, R. J.;
- Wierer, J. J.;
- Crawford, M. H.;
- Dickerson, J. R.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1168, doi. 10.1049/el.2016.0237
- Mingtuan Lin;
- Yue Gao;
- Peiguo Liu;
- Jibin Liu
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1194, doi. 10.1049/el.2016.0411
- Yilmaz, H. B.;
- Cho, Y.-J.;
- Guo, W.;
- Chae, C.-B.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1197, doi. 10.1049/el.2016.0688
- Müller, C.;
- Alves, D. I.;
- Uchôa-Filho, B. F.;
- Machado, R.;
- de Oliveira, L. L.;
- Martins, J. B. S.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1183, doi. 10.1049/el.2016.0946
- Hua Jiang;
- Lizhen Shen;
- Tianjing Wang;
- Guoqing Liu
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1181, doi. 10.1049/el.2016.0532
- Zengqi Wang;
- Zhiqun Li;
- Guoxiao Cheng;
- Lei Luo;
- Yuwenyuan Gao
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1177, doi. 10.1049/el.2016.0981
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1175, doi. 10.1049/el.2016.0880
- Chiou, H.-K.;
- Chien, K.-H.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1173, doi. 10.1049/el.2015.4013
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1166, doi. 10.1049/el.2016.1249
- Junnan Shi;
- Bo Jiu;
- Yuan Liu;
- Junkun Yan;
- Hongwei Liu;
- Liangbing Hu
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1164, doi. 10.1049/el.2016.0976
- Dong Zhang;
- Yongshun Zhang;
- Xiaowei Hu;
- Guimei Zheng;
- Jun Tang;
- Cunqian Feng
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1162, doi. 10.1049/el.2016.0893
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1151, doi. 10.1049/el.2016.1275
- Park, J.;
- Jin, S.;
- Moon, K.;
- Kim, B.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1149, doi. 10.1049/el.2016.0860
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1140, doi. 10.1049/el.2016.0693
- Wen Lian Wang;
- Hui Zhang;
- XiaoJun Du;
- YouYi Sun
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1160, doi. 10.1049/el.2016.0939
- Jinping Wang;
- Liangkui Hou;
- Bo-Cheng Bao;
- Yigang He
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1153, doi. 10.1049/el.2016.0716
- Gang Zhang;
- Jianpeng Wang;
- Wen Wu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1158, doi. 10.1049/el.2016.1057
- Umegami, H.;
- Ishibashi, H.;
- Nanamori, K.;
- Hattori, F.;
- Yamamoto, M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1157, doi. 10.1049/el.2016.0407
- Dalla Santa, M.;
- Antony, C.;
- Talli, G.;
- Krestnikov, I.;
- Townsend, P. D.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1155, doi. 10.1049/el.2015.4001
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1124, doi. 10.1049/el.2015.4548
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1147, doi. 10.1049/el.2016.1075
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1143, doi. 10.1049/el.2016.1076
- Chengying Du;
- Kaixue Ma;
- Shouxian Mou
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1145, doi. 10.1049/el.2016.0835
- Gholipour, V.;
- Moshiri, S. M. M.;
- Alighanbari, A.;
- Yahaghi, A.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1134, doi. 10.1049/el.2016.1126
- Xiaohu Liang;
- Aijun Liu;
- Bin Gao;
- Ke Wang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1141, doi. 10.1049/el.2016.1193
- Ghosh, S.;
- Srivastava, K. V.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1138, doi. 10.1049/el.2015.3681
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1136, doi. 10.1049/el.2016.0580
- Jizhong Shen;
- Jianwei Liang;
- Xiaochen Liu
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1120, doi. 10.1049/el.2016.0632
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1106, doi. 10.1049/el.2016.1109
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1126, doi. 10.1049/el.2015.3722
- Shengyu Nie;
- Mingxi Guo;
- Yuehong Shen
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1114, doi. 10.1049/el.2016.0402
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1132, doi. 10.1049/el.2016.1127
- Yawei Li;
- Xiaofeng Li;
- Beaulieu, Norman C.;
- Zhizhong Fu
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1130, doi. 10.1049/el.2016.0837
- El-Khamy, M.;
- Lin, H. P.;
- Lee, J.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1128, doi. 10.1049/el.2015.3958
- Cho, Y.;
- Park, S.;
- Kim, K.;
- Suh, D. Y.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1104, doi. 10.1049/el.2016.1267
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1102, doi. 10.1049/el.2016.0161
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1122, doi. 10.1049/el.2016.0440
- Sabokrou, M.;
- Fathy, M.;
- Hoseini, M.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1112, doi. 10.1049/el.2016.0334
- Wanting Fang;
- Haolong Wang;
- Biao Xu;
- Ye Zhang
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1118, doi. 10.1049/el.2015.4483
- Lu Lin;
- Eryun Liu;
- Lianghao Wang;
- Ming Zhang
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1100, doi. 10.1049/el.2016.0800
- De Matteis, M.;
- Pezzotta, A.;
- Pipino, A.;
- Baschirotto, A.;
- D'Amico, S.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1098, doi. 10.1049/el.2015.4191
- Xiaolong Mo;
- Changqing Jiang;
- Jianqi Ding;
- Feng Zhang;
- Luming Li
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1116, doi. 10.1049/el.2016.0201
- De Praeter, J.;
- Swimberghe, H.;
- Renard, G.;
- Van Wallendael, G.;
- Lambert, P.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1110, doi. 10.1049/el.2016.1008
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1108, doi. 10.1049/el.2016.1039
- Shifeng Zhang;
- Ailing Li;
- Yan Han;
- Lu Jie;
- Xiaoxia Han;
- Cheung, Ray C. C.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1096, doi. 10.1049/el.2015.4407
- Hsu, S.-H.;
- Lin, C.-Y.;
- Tuan, C.-T.;
- Chang, C.-C.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1086, doi. 10.1049/el.2016.1924
- Article