Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 12
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1069, doi. 10.1049/el.2016.0896
- Yingying Cong;
- Dedong Han;
- Junchen Dong;
- Wen Yu;
- Xiaomi Zhang;
- Guodong Cui;
- Xing Zhang;
- Shengdong Zhang;
- Yi Wang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1082, doi. 10.1049/el.2015.4039
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1078, doi. 10.1049/el.2016.0226
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1074, doi. 10.1049/el.2015.3422
- Li Gao;
- Ruimin Hu;
- Xiaochen Wang;
- Gang Li;
- Yuhong Yang
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1067, doi. 10.1049/el.2016.0212
- Yongpeng Zhu;
- Yinsheng Wei;
- Kaihui Zhu
- Article
6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1080, doi. 10.1049/el.2016.0442
- Yoon, J.-W.;
- Park, H.;
- Kim, N.S.;
- Park, T.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1052, doi. 10.1049/el.2016.0810
- Shu Zhong;
- Jianping Xu;
- Xuejian Chen;
- Xiang Zhou
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1065, doi. 10.1049/el.2016.0406
- Wenshuai Zhai;
- Yunhua Zhang;
- Qingshan Yang;
- Xiaojin Shi
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1076, doi. 10.1049/el.2016.0962
- Jian-Hua Huang;
- Xiao-Peng Yu;
- Shi-Yi Xu;
- Jing Jin;
- Fa-Xin Yu
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1050, doi. 10.1049/el.2016.0919
- Abderahim, A.;
- Mahamat, A. T.;
- Chatelon, J. P.;
- Pietroy, D.;
- Capraro, S.;
- Rousseau, J. J.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1073, doi. 10.1049/el.2015.4198
- Wenjia Ma;
- Zheng Zhou;
- Dongbin Zhu;
- Lifeng Liu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1071, doi. 10.1049/el.2016.0707
- Kim, S. W.;
- Sun, M.-C.;
- Park, E.;
- Kim, J. H.;
- Kwon, D. W.;
- B.-G. Park
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1047, doi. 10.1049/el.2016.0140
- Vazquez-Zuniga, L. A.;
- Feng, X.;
- Kwon, Y.;
- Kim, H.;
- Shi, J.;
- Loh, W.;
- Jeong, Y.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1061, doi. 10.1049/el.2016.0990
- Aumann, H. M.;
- Emanetoglu, N. W.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1063, doi. 10.1049/el.2015.4032
- Liang Wang;
- Zishen Li;
- Hong Yuan;
- Jiaojiao Zhao;
- Kai Zhou;
- Chao Yuan
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1030, doi. 10.1049/el.2016.0742
- Saikia, M.;
- Ghosh, S.;
- Srivastava, K. V.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1060, doi. 10.1049/el.2015.4380
- Singh, P. R.;
- Wang, Y.;
- Chargé, P.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1028, doi. 10.1049/el.2015.4063
- Hamidian, A.;
- Barbin, S.E.;
- Boeck, G.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1058, doi. 10.1049/el.2015.3795
- Tao Zeng;
- Tiandong Liu;
- Zegang Ding;
- Qi Zhang;
- Teng Long
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1056, doi. 10.1049/el.2015.4193
- Dilello, A.;
- Rumberg, B.;
- Graham, D. W.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1054, doi. 10.1049/el.2016.0472
- Kang, B. G.;
- Choi, Y.;
- Chung, S. K.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1022, doi. 10.1049/el.2015.3876
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1049, doi. 10.1049/el.2016.0762
- Ibrahim, S. A.;
- Ridzwan, A. H.;
- Mansoor, A.;
- Dambul, K. D.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1045, doi. 10.1049/el.2016.0490
- Enne, R.;
- Hofbauer, M.;
- Zecevic, N.;
- Goll, B.;
- Zimmermann, H.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1043, doi. 10.1049/el.2016.0683
- Sitao Chen;
- Hao Wu;
- Daoxin Dai
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1041, doi. 10.1049/el.2016.0507
- Sung, H. K.;
- Wang, C.;
- Kim, N. Y.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1026, doi. 10.1049/el.2016.0365
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1039, doi. 10.1049/el.2016.0047
- Kim, Y.;
- Lee, J. H.;
- Kim, S. M.;
- Rhee, S. I.;
- Song, J. Y.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1013, doi. 10.1049/el.2016.0203
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1037, doi. 10.1049/el.2016.0686
- Choi, C. M.;
- Sukegawa, H.;
- Mitani, S.;
- Song, Y. H.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1036, doi. 10.1049/el.2015.4389
- Ling Wei;
- Hongming Zhang;
- Bingyan Yu
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1034, doi. 10.1049/el.2016.0372
- Yong Mao Huang;
- Zhenhai Shao;
- Wei Jiang;
- Tao Huang;
- Guoan Wang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1032, doi. 10.1049/el.2016.1044
- Lin, X.;
- Seet, B.-C.;
- Joseph, F.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1024, doi. 10.1049/el.2016.0891
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1008, doi. 10.1049/el.2016.0563
- Bo-Cheng Bao;
- Quan Xu;
- Han Bao;
- Mo Chen
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1007, doi. 10.1049/el.2016.0672
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1020, doi. 10.1049/el.2016.0969
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1016, doi. 10.1049/el.2016.0935
- Sotner, R.;
- Jerabek, J.;
- Prokop, R.;
- Kledrowetz, V.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1018, doi. 10.1049/el.2016.0261
- Lee, T.-K.;
- Chan, Y.-L.;
- Siu, W.-C.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1015, doi. 10.1049/el.2016.0668
- Sohrabi, Z.;
- Jannesari, A.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1005, doi. 10.1049/el.2016.1051
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 998, doi. 10.1049/el.2016.0857
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1003, doi. 10.1049/el.2015.3831
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1011, doi. 10.1049/el.2015.3714
- Weiwei He;
- Jing Chen;
- Qingqing Wu;
- Jiexin Luo;
- Zhan Chai;
- Jianqiang Huang;
- Xi Wang
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1010, doi. 10.1049/el.2016.1004
- Rocha, R.;
- Medrano-T, R. O.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1001, doi. 10.1049/el.2016.0186
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1000, doi. 10.1049/el.2016.0936
- Ji Zhang;
- Wen-Jun Lu;
- Ling Li;
- Lei Zhu;
- Hong-bo Zhu
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 996, doi. 10.1049/el.2016.0676
- Yoon, I.-J.;
- Christensen, S.;
- Zhurbenko, V.;
- Kim, O. S.;
- Breinbjerg, O.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 994, doi. 10.1049/el.2016.0982
- Kong, M.;
- Shin, G.;
- Lee, S.-H.;
- Yoon, I.-J.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 993, doi. 10.1049/el.2016.1101
- Zaifeng Yang;
- Eng Leong Tan
- Article