Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 10
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 816, doi. 10.1049/el.2016.0890
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2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 782, doi. 10.1049/el.2016.1368
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3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 783, doi. 10.1049/el.2016.1365
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4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 877, doi. 10.1049/el.2016.0635
- Grakhova, E. P.;
- Rommel, S.;
- Jurado-Navas, A.;
- Sultanov, A. Kh.;
- Vegas Olmos, J.J.;
- Tafur Monroy, I.
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5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 823, doi. 10.1049/el.2016.0757
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6
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 833, doi. 10.1049/el.2016.0736
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7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 809, doi. 10.1049/el.2016.0680
- Sanyal, Arindam;
- Xueyi Yu;
- Yanlong Zhang;
- Nan Sun
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8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 782, doi. 10.1049/el.2016.1364
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9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 807, doi. 10.1049/el.2016.0347
- Al-Tamimi, K.;
- Thiyagarajan, P.;
- El-Sankary, K.
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10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 859, doi. 10.1049/el.2016.0555
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11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 837, doi. 10.1049/el.2016.0383
- Jeong, M.-G.;
- Kim, J.-H.;
- Bae, S.-H.;
- Lee, W.-S.
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12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 852, doi. 10.1049/el.2016.0350
- Min Xue;
- Shilong Pan;
- Yongjiu Zhao
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13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 789, doi. 10.1049/el.2016.0528
- Farran, M.;
- Boscolo, S.;
- Locatelli, A.;
- Capobianco, A.-D.;
- Midrio, M.;
- Ferrari, V.;
- Modotto, D.
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14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 846, doi. 10.1049/el.2016.0567
- Saeedi, S.;
- Lee, J.;
- Sigmarsson, H.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 863, doi. 10.1049/el.2016.0364
- Ali, S.;
- Ahmed, N.;
- Aljunid, S.;
- Ahmad, B.
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16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 874, doi. 10.1049/el.2016.0541
- Choi, S.;
- Park, S.;
- Ahn, S.
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17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 801, doi. 10.1049/el.2016.0533
- Seo, J.-H.;
- Ryu, Y.;
- Han, S.-D.;
- Song, H.;
- Kim, H.-K.;
- Kim, K.-N.
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18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 821, doi. 10.1049/el.2016.0477
- Elsayed, S.;
- Elsabrouty, M.;
- Muta, O.;
- Furukawa, H.
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19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 787, doi. 10.1049/el.2016.0470
- Sadeghi, P.;
- Nourinia, J.;
- Ghobadi, C.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 853, doi. 10.1049/el.2016.0339
- Park, M. J.;
- Lee, W. H.;
- Kim, K. A.;
- Yun, D. J.;
- Yoon, S. M.
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21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 842, doi. 10.1049/el.2016.0328
- Wenjun Li;
- Patrick Fay;
- Tao Yu;
- Judy Hoyt
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22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 794, doi. 10.1049/el.2016.0327
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23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 805, doi. 10.1049/el.2016.0292
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24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 855, doi. 10.1049/el.2016.0252
- Newburgh, G. A.;
- Dubinskii, M.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 848, doi. 10.1049/el.2016.0245
- Mi Xiao;
- Xiaozheng Li;
- Guoliang Sun
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 818, doi. 10.1049/el.2016.0206
- Kim, H.;
- Sa, J.;
- Chung, Y.;
- Park, D.;
- Yoon, S.
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27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 830, doi. 10.1049/el.2016.0191
- Hayati, M.;
- Akbari, M.;
- Salahi, R.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 839, doi. 10.1049/el.2016.0174
- Farah, S.;
- Ayari, L.;
- El-Akhdar, K.;
- Neveux, G.;
- Barataud, D.
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29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 861, doi. 10.1049/el.2016.0125
- Kajikawa, S.;
- Terao, T.;
- Yoshida, M.;
- Motokoshi, S.;
- Ishii, O.;
- Yamazaki, M.;
- Fujimoto, Y.
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30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 857, doi. 10.1049/el.2016.0115
- Hosoda, T.;
- Fradet, M.;
- Frez, C.;
- Shterengas, L.;
- Sander, S.;
- Forouhar, S.;
- Belenky, G.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 828, doi. 10.1049/el.2015.4391
- Maya Hernández, P. M.;
- Sanz Pascual, M. T.;
- Calvo, B.
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32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 803, doi. 10.1049/el.2015.3586
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33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 879, doi. 10.1049/el.2016.0048
- Lei Ning;
- Zhenyong Wang;
- Qing Guo;
- Haijun Zhang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 796, doi. 10.1049/el.2015.4283
- Bhattacharjee, S.;
- Kshetrimayum, R. S.;
- Bhattacharjee, R.
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35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 785, doi. 10.1049/el.2016.0019
- Sarkar, D.;
- Saurav, K.;
- Srivastava, K. V.
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36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 832, doi. 10.1049/el.2016.0078
- Bukhari, S. S.;
- Whittow, W. G.;
- Zhang, S.;
- Vardaxoglou, J. C.
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37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 883, doi. 10.1049/el.2015.4386
- Tian Qi;
- Songbai He;
- Weimin Shi
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38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 835, doi. 10.1049/el.2016.0046
- Ying Liu;
- Xin Quan;
- Wensheng Pan;
- Youxi Tang
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 812, doi. 10.1049/el.2015.4509
- Wang, S.;
- Deng, G.;
- Horestani, A. K.;
- Fumeaux, C.
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40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 827, doi. 10.1049/el.2016.0017
- Zia, M. F.;
- Abdel-Rahman, M.;
- Alduraibi, M.;
- Ilahi, B.;
- Alasaad, A.
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41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 825, doi. 10.1049/el.2015.4544
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42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 790, doi. 10.1049/el.2015.3867
- Qu, L.;
- Zhang, R.;
- Lee, H.;
- Kim, H.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 819, doi. 10.1049/el.2015.4484
- Zhaohan Li;
- Xinyang Wang;
- Bing Li;
- Yuchun Chang
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 872, doi. 10.1049/el.2015.4463
- Ye Yuan;
- Yong Fan;
- Zhe Chen;
- Ziqiang Yang;
- Haodong Lin
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 881, doi. 10.1049/el.2015.4418
- Meng Zheng;
- Chi Xu;
- Wei Liang;
- Haibin Yu
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 867, doi. 10.1049/el.2015.4183
- Weixing Li;
- Jianzhi Lin;
- Yue Zhang;
- Zengping Chen
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 810, doi. 10.1049/el.2015.3968
- Elnaqib, A.;
- Ibrahim, S. A.
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48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 876, doi. 10.1049/el.2015.3818
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 865, doi. 10.1049/el.2015.3089
- Cheng-Lin Xiong;
- Jun-Peng Ma;
- Xia-Jie Wu;
- Shun-Liang Wang;
- Xiao-Yun Feng
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 798, doi. 10.1049/el.2015.4080
- Liu, Y.;
- Gassino, R.;
- Braglia, A.;
- Vallan, A.;
- Perrone, G.
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