Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 1
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 18, doi. 10.1049/el.2015.3111
- Min Kim;
- Gunho Lee;
- Minsuk Park;
- Tai-Kyong Song
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 31, doi. 10.1049/el.2015.2936
- Article
3
- 2016
- Toumazou, Chris;
- White, Ian
- Editorial
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 70, doi. 10.1049/el.2015.3515
- Esmaeli, S. H.;
- Sedighy, S. H.
- Article
6
- 2016
- Do, Trang T. T.;
- Nguyen, Binh P.
- Correction Notice
7
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 3, doi. 10.1049/el.2015.4249
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 10, doi. 10.1049/el.2015.2817
- Karamzadeh, S.;
- Rafii, V.;
- Kartal, M.;
- Saygin, H.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 12, doi. 10.1049/el.2015.2725
- Kangkang Liu;
- Qian Ye;
- Guoxiang Meng
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 68, doi. 10.1049/el.2015.1419
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 22, doi. 10.1049/el.2015.2407
- Herbert, J.;
- Wilson, S.;
- Rakic, A. D.;
- Taimre, T.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 49, doi. 10.1049/el.2015.2372
- Cheng-Kai Lin;
- Jen-te Yu;
- Yen-Shin Lai;
- Hsing-Cheng Yu;
- Yan-Hong Lin;
- Fu-Min Chen
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 7, doi. 10.1049/el.2015.2334
- Chenwei Sun;
- Haihong Tao;
- Xiaoshuang Guo;
- Jian Xie
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 85, doi. 10.1049/el.2015.2804
- Xiaopeng Yang;
- Shuai Li;
- Xiaona Hu;
- Tao Zeng
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 34, doi. 10.1049/el.2015.2801
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 52, doi. 10.1049/el.2015.2753
- Ohlrogge, M.;
- Tessmann, A.;
- Leuther, A.;
- Schlechtweg, M.;
- Ambacher, O.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 47, doi. 10.1049/el.2015.2738
- Butzen, P. F.;
- Slimani, M.;
- Wang, Y.;
- Cai, H.;
- Naviner, L. A. B.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 37, doi. 10.1049/el.2015.2678
- Zhi Zheng;
- Caiyong Hao;
- Xuemin Yang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 77, doi. 10.1049/el.2015.2669
- Luo, H.;
- Li, W.;
- Zhang, Y.;
- Huang, L.-K.;
- Cosmas, J.;
- Ni, Q.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 29, doi. 10.1049/el.2015.2604
- Danaeifar, M.;
- Granpayeh, N.;
- Booket, M. R.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 25, doi. 10.1049/el.2015.2668
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 43, doi. 10.1049/el.2015.2592
- Dongsheng Wu;
- Aijun Liu;
- Yingxian Zhang;
- Qingshuang Zhang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 51, doi. 10.1049/el.2015.2579
- Chenyang Wu;
- Qingyuan Wang;
- Xi Tian
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 15, doi. 10.1049/el.2015.2573
- Carrillo-Martínez, L. A.;
- Flores-Verdad, G. Espinosa;
- Pérez, B. M.;
- Reyes, J. Molina
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 23, doi. 10.1049/el.2015.2493
- Bo-Cheng Bao;
- Pan Jiang;
- Quan Xu;
- Mo Chen
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 63, doi. 10.1049/el.2015.2410
- Sakata, H.;
- Kimpara, K.;
- Takahashi, N.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 39, doi. 10.1049/el.2015.1957
- Lamb, D.;
- Chamon, L. F. O.;
- Nascimento, V. H.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 66, doi. 10.1049/el.2015.1938
- Ye Yuan;
- Yukun Sun;
- Yonghong Huang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 71, doi. 10.1049/el.2015.1879
- Jing Zhu;
- Long Zhang;
- Weifeng Sun;
- Keqin Huang;
- Yicheng Du
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 55, doi. 10.1049/el.2015.2356
- Bin-Feng Zong;
- Guangming Wang;
- JiangGang Liang;
- XuChun Zhang;
- Wang, D.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 41, doi. 10.1049/el.2015.1700
- Brajović, M.;
- Orović, I.;
- Daković, M.;
- Stanković, S.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 27, doi. 10.1049/el.2015.2332
- Zhongyuan Xiang;
- Feng Zhang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 8, doi. 10.1049/el.2015.2301
- Tong Li;
- Cheng Zhu;
- Xiangyu Cao;
- Jun Gao
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 73, doi. 10.1049/el.2015.2290
- Thomas, P. M.;
- Filmer, M. J.;
- Gaur, A.;
- Rommel, S. L.;
- Bhatnagar, K.;
- Droopad, R.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 86, doi. 10.1049/el.2015.2225
- Pantoli, L.;
- Stornelli, V.;
- Leuzzi, G.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 45, doi. 10.1049/el.2015.2160
- Kong, L.;
- Tran, H.;
- Kaddoum, G.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 79, doi. 10.1049/el.2015.2155
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 81, doi. 10.1049/el.2015.2034
- Cazarotto, M.;
- Lopes, R. R.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 57, doi. 10.1049/el.2015.1696
- Tingting Zhang;
- Jintian Xiong;
- Jilin Zheng;
- Xiangfei Chen;
- Tao Pu
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 128, doi. 10.1049/el.2015.3540
- Jukić, T.;
- Steindl, B.;
- Enne, R.;
- Zimmermann, H.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 161, doi. 10.1049/el.2015.3304
- Dai, Weihua;
- Qiao, Chunjie;
- Wang, Yueke;
- Zhou, Chao
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 83, doi. 10.1049/el.2015.1793
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 36, doi. 10.1049/el.2015.0971
- Li, B.;
- Nutter, B.;
- Boehme, J.;
- McFadden, M.;
- Mitra, S.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 64, doi. 10.1049/el.2015.1237
- Chul-Jun Shin;
- Kwang-Min Yoo;
- Dong-Rak Kim;
- Jun-Young Lee
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 20, doi. 10.1049/el.2015.1595
- Tao He;
- Yi Zhang;
- Temes, Gabor C.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 5, doi. 10.1049/el.2015.1508
- Peng Hu;
- Dezhong Peng;
- Zhang Yi;
- Yong Xiang
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 143, doi. 10.1049/el.2015.3358
- Wan, Fayu;
- Cao, Huixia;
- An, Sushen;
- Feng, Chaochao;
- Hu, Guang;
- Ge, Junxiang
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 141, doi. 10.1049/el.2015.3103
- Buchanan, N.B.;
- Fusco, V.F.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 1, p. 59, doi. 10.1049/el.2015.1087
- Wen-Hao Wu;
- Yueh-Chin Lin;
- Tzu-Ching Hou;
- Tai-Wei Lin;
- Hisang-Hua Hsu;
- Yuen-Yee Wong;
- Hiroshi Iwai;
- Kuniyuki Kakushima;
- Edward Yi Chang
- Article