Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 4


Results: 41
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    in brief.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 4, p. 300, doi. 10.1049/el.2015.0365
    Publication type:
    Article
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    inside view.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 4, p. 302, doi. 10.1049/el.2015.0359
    Publication type:
    Article
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    interview.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 4, p. 300, doi. 10.1049/el.2015.0360
    Publication type:
    Article
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    Neuromorphic VLSI second-order synapse.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 4, p. 319, doi. 10.1049/el.2014.3976
    By:
    • Aggarwal, A.;
    • Horiuchi, T. K.
    Publication type:
    Article
    29

    SEU reliability evaluation of 3D ICs.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 4, p. 362, doi. 10.1049/el.2014.3968
    By:
    • Huiyun Li;
    • Xiaobo Hu;
    • Cuiping Shao;
    • Jianbin Zhou;
    • Guoqing Xu
    Publication type:
    Article
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