Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 3
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 192, doi. 10.1049/el.2015.0173
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 217, doi. 10.1049/el.2014.3715
- Wei Gao;
- Sam Kwong;
- Hongshi Sang
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 249, doi. 10.1049/el.2014.3698
- Al-Hmood, H.;
- Al-Raweshidy, H. S.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 193, doi. 10.1049/el.2015.0154
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 202, doi. 10.1049/el.2014.3856
- Papanicolaou, N. C.;
- Christou, M. A.;
- Polycarpou, A. C.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 220, doi. 10.1049/el.2014.4255
- Cristiano, J.;
- Puig, D.;
- Garcia, M. A.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 207, doi. 10.1049/el.2014.4187
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 234, doi. 10.1049/el.2014.4182
- Wencheng Yang;
- Jiankun Hu;
- Song Wang;
- Chi Chen
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 257, doi. 10.1049/el.2014.4174
- Schmalz, K.;
- Borngräber, J.;
- Debski, W.;
- Neumaier, P.;
- Wang, R.;
- Hübers, H. -W.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 236, doi. 10.1049/el.2014.4176
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 261, doi. 10.1049/el.2014.4140
- Han Ren;
- Jin Shao;
- Mi Zhou;
- Arigong, Bayaner;
- Jun Ding;
- Hualiang Zhang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 215, doi. 10.1049/el.2014.4064
- Roman-Loera, Alejandro;
- Ramirez-Angulo, Jaime;
- Lopez-Martin, Antonio;
- Carvajal, Ramon G.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 262, doi. 10.1049/el.2014.4050
- Xin Yu Zhou;
- Shao Yong Zheng;
- Xing Yu Pu;
- Wing Shing Chan;
- Yunliang Long
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 213, doi. 10.1049/el.2014.3998
- Shuo Li;
- Salthouse, Christopher D.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 270, doi. 10.1049/el.2014.3202
- Nagesh Deevi, B. V. N. S. M.;
- Bheema Rao, N.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 244, doi. 10.1049/el.2014.3791
- Rosa, L. S.;
- Toledo, C. F. M.;
- Bonato, V.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 268, doi. 10.1049/el.2014.3994
- Xin Huang;
- Xuequn Fu;
- Wei Xu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 255, doi. 10.1049/el.2014.3980
- Jin-Bum Kim;
- Rae-Hong Park
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 251, doi. 10.1049/el.2014.3977
- Zan Kai Chong;
- Bok-Min Goi;
- Hiroyuki Ohsaki;
- Bryan Ng;
- Hong Tat Ewe
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 219, doi. 10.1049/el.2014.3975
- Valero, M. R.;
- Thoutam, S.;
- Ramírez-Angulo, J.;
- Lopez-Martín, A.;
- Carvajal, R. G.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 278, doi. 10.1049/el.2014.3972
- Martelli, P.;
- Boffi, P.;
- Fasiello, A.;
- Martinelli, M.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 259, doi. 10.1049/el.2014.3928
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 208, doi. 10.1049/el.2014.3927
- Aldaya, I.;
- Gosset, C.;
- Wang, C.;
- Campuzano, G.;
- Grillot, F.;
- Castañón, G.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 224, doi. 10.1049/el.2014.3912
- Lijun Zhao;
- Anhong Wang;
- Bing Zeng;
- Yingchun Wu
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 242, doi. 10.1049/el.2014.3872
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 293, doi. 10.1049/el.2014.3825
- Chengcheng Yang;
- Xiaodong Xu;
- Jiang Han;
- Xiaofeng Tao
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 238, doi. 10.1049/el.2014.3770
- Min-Gyu Park;
- Jonghee Park;
- Yongho Shin;
- Eul-Gyoon Lim;
- Kuk-Jin Yoon
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 204, doi. 10.1049/el.2014.3766
- Sang-Burm Ryu;
- Eun-Su Kang;
- Hyeon-Cheol Lee;
- Sang-Soon Yong;
- Sang-Kon Lee;
- Sang-Gyu Lee
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 289, doi. 10.1049/el.2014.3151
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 282, doi. 10.1049/el.2014.3763
- De Marcellis, A.;
- Janneh, M.;
- Palange, E.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 199, doi. 10.1049/el.2014.3729
- Yang Yi;
- Li Jian-ying;
- Wei Kun;
- Xu Rui;
- Yang Guang-wei
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 206, doi. 10.1049/el.2014.3626
- He Huang;
- Ying Liu;
- Shuxi Gong
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 222, doi. 10.1049/el.2014.3667
- Jiangtao Sun;
- Zhen Ren;
- Wuqiang Yang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 211, doi. 10.1049/el.2014.3709
- Moghadami, S.;
- Ardalan, S.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 294, doi. 10.1049/el.2014.3677
- Makki, A.;
- Siddig, A.;
- Saad, M. M.;
- Bleakley, C. J.;
- Cavallaro, J. R.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 364, doi. 10.1049/el.2014.3408
- Ha, Dong‐Hyun;
- Song, Hyoung‐Kyu
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 247, doi. 10.1049/el.2014.3607
- Tran, N. N.;
- Nguyen, H. X.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 253, doi. 10.1049/el.2014.3579
- Teguig, D.;
- Le Nir, V.;
- Scheers, B.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 266, doi. 10.1049/el.2014.3552
- Changsoo Kwak;
- Manseok Uhm;
- In-Bok Yom
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 264, doi. 10.1049/el.2014.3490
- Bo Zhang;
- Shaosheng Li;
- Jianming Huang
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 272, doi. 10.1049/el.2014.3448
- Zhuofa Chen;
- Dedong Han;
- Nannan Zhao;
- Yingying Cong;
- Jing Wu;
- Junchen Dong;
- Feilong Zhao;
- Lingling Huang;
- Yi Zhang;
- Guodong Cui;
- Lifeng Liu;
- Shengdong Zhang;
- Xing Zhang;
- Yi Wang
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 343, doi. 10.1049/el.2014.3817
- De Keulenaer, T.;
- Torfs, G.;
- Ban, Y.;
- Pierco, R.;
- Vaernewyck, R.;
- Vyncke, A.;
- Li, Z.;
- Sinsky, J.H.;
- Kozicki, B.;
- Yin, X.;
- Bauwelinck, J.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 291, doi. 10.1049/el.2014.2753
- Briff, P.;
- Lutenberg, A.;
- Vega, L. Rey;
- Vargas, F.;
- Patwary, M.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 209, doi. 10.1049/el.2014.3444
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 226, doi. 10.1049/el.2014.3405
- SanMiguel, J. C.;
- Calvo, A.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 284, doi. 10.1049/el.2014.3400
- Daeyeon Yun;
- Jungyong Park;
- Kwang-Seok Yun
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 3, p. 230, doi. 10.1049/el.2014.3379
- Song Zhu;
- Danhua Cao;
- Shixiong Jiang;
- Yubin Wu;
- Pan Hu
- Article