Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 24
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2014, doi. 10.1049/el.2015.2924
- Kaijun Song;
- Yu Zhu;
- Qi Duan;
- Maoyu Fan;
- Yong Fan
- Article
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1977, doi. 10.1049/el.2015.2906
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1962, doi. 10.1049/el.2015.2899
- Dongfang Guan;
- Yongsong Zhang;
- Zuping Qian;
- Jianguo Zhang
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2012, doi. 10.1049/el.2015.2601
- Solomko, V.;
- Tanc, B.;
- Kehrer, D.;
- Ilkov, N.;
- Bakalski, W.;
- Simbürger, W.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1954, doi. 10.1049/el.2015.3915
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2039, doi. 10.1049/el.2015.3234
- Byung-Chul Park;
- Jeong-Hae Lee
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1964, doi. 10.1049/el.2015.3142
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1980, doi. 10.1049/el.2015.3128
- Jaehong Ko;
- Chang-Ho An;
- Chan-Keun Kwon;
- Soo-Won Kim;
- Chulwoo Kim
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2019, doi. 10.1049/el.2015.3119
- Ahmed, U. T.;
- Abbosh, A. M.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2047, doi. 10.1049/el.2015.3086
- Kim, J.;
- Jeong, S. M.;
- Jeong, J.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2001, doi. 10.1049/el.2015.3066
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2026, doi. 10.1049/el.2015.3064
- Omomukuyo, O.;
- Chang, D.;
- Dobre, O. A.;
- Venkatesan, R.;
- Ngatched, T. M. N.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1975, doi. 10.1049/el.2015.3005
- Chia-Hung Chen;
- Yi Zhang;
- Tao He;
- Temes, Gabor C.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1982, doi. 10.1049/el.2015.0833
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2045, doi. 10.1049/el.2015.2946
- Seoyoung Hong;
- Seonghearn Lee
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2066, doi. 10.1049/el.2015.2554
- Liangyin Chen;
- Liping Pang;
- Beisi Zhou;
- Jingyu Zhang;
- Zhenlei Liu;
- Qian Luo;
- Limin Sun
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1971, doi. 10.1049/el.2015.2827
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1973, doi. 10.1049/el.2015.2876
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1957, doi. 10.1049/el.2015.2693
- Ohashi, Y.;
- Kudo, T.;
- Yokota, Y.;
- Shoji, Y.;
- Kurosawa, S.;
- Kamada, K.;
- Yoshikawa, A.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1992, doi. 10.1049/el.2015.2806
- Choi, S.;
- Lee, S.;
- Yang, H. S.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2028, doi. 10.1049/el.2015.2543
- Assagra, Y. A. O.;
- Altafim, R. A. P.;
- Altafim, R. A. C.;
- Carmo, J. P.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2062, doi. 10.1049/el.2015.2026
- Kojo Sarfo Gyamfi;
- Jonghyen Baek;
- Kyungchun Lee
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1984, doi. 10.1049/el.2015.0950
- Umetani, K.;
- Yamamoto, M.;
- Hiraki, E.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1958, doi. 10.1049/el.2015.2540
- Xing, L.;
- Huang, Y.;
- Xu, Q.;
- Alja'afreh, S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2043, doi. 10.1049/el.2015.2525
- Lei Yang;
- Jianxiong Zhou;
- Huaitie Xiao
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1966, doi. 10.1049/el.2015.2521
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2041, doi. 10.1049/el.2015.2514
- Shun-Sheng Zhang;
- Chan Liu;
- Wen-Qin Wang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1988, doi. 10.1049/el.2015.2491
- Shizheng Zhang;
- Dan Yang;
- Sheng Huang;
- Liyun Tu;
- Xiaohong Zhang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2034, doi. 10.1049/el.2015.2464
- Tien, W. C.;
- Chen, L. Y.;
- Zeng, Y. W.;
- Chang, K. W.;
- Chu, A. K.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2003, doi. 10.1049/el.2015.2450
- Mousavi, M. R.;
- Shahzadi, A.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2007, doi. 10.1049/el.2015.2435
- Ismail, A.;
- El-Nafarawi, M.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2055, doi. 10.1049/el.2015.1297
- Young-Su Ryu;
- Su-Hyun Jung;
- Hyoung-Kyu Song
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2005, doi. 10.1049/el.2015.1123
- Xiao-Guang Yuan;
- Wei-Tao Zhang;
- Jiao Guo
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2030, doi. 10.1049/el.2015.2422
- Oh, K.;
- Yang, S.;
- Lee, J.;
- Park, K.;
- Sung, M. Y.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1960, doi. 10.1049/el.2015.2413
- Wei Chen;
- Jungang Yin;
- Meiju Li;
- Fuhai Li;
- Jian Yang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2035, doi. 10.1049/el.2015.2385
- Borin, V. P.;
- Barriquello, C. H.;
- Campos, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2023, doi. 10.1049/el.2015.2341
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2017, doi. 10.1049/el.2015.2329
- Mousavi, S. M. H.;
- Makki, S. V. A.;
- Hooshangi, Sh.;
- Alirezaee, Sh.;
- Siahkamari, H.;
- Ahmadi, M.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1986, doi. 10.1049/el.2015.2323
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2024, doi. 10.1049/el.2015.2294
- Yoshida, M.;
- Yonenaga, K.;
- Hirano, A.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2064, doi. 10.1049/el.2015.2275
- Liang-Shun Chang;
- Kuei-Hung Shen;
- Ming-Jinn Tsai;
- Chrong-Jung Lin;
- Ya-Chin King
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1990, doi. 10.1049/el.2015.2268
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2053, doi. 10.1049/el.2015.2261
- Fenggang Sun;
- Peng Lan;
- Bin Gao
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2037, doi. 10.1049/el.2015.2241
- Wen-Liang Zeng;
- Chi-Seng Lam;
- Wen-Ming Zheng;
- Sai-Weng Sin;
- Ning-Yi Dai;
- Man-Chung Wong;
- Seng-Pan U;
- Rui Paulo Martins
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2061, doi. 10.1049/el.2015.2234
- Niemelä, V.;
- Kumpuniemi, T.;
- Hämäläinen, M.;
- Iinatti, J.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2009, doi. 10.1049/el.2015.2073
- Plis, E. A.;
- Schuler-Sandy, T.;
- Ramirez, D. A.;
- Myers, S.;
- Krishna, S.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 1994, doi. 10.1049/el.2015.2049
- Kemeng Li;
- Feng Shao;
- Gangyi Jiang;
- Mei Yu
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2032, doi. 10.1049/el.2015.1982
- Xiao-long Hu;
- Li Liu;
- Hong Wang
- Article