Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 23
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1838, doi. 10.1049/el.2015.3740
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1839, doi. 10.1049/el.2015.3721
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1911, doi. 10.1049/el.2015.2502
- Chuanhui Ma;
- Ying Liu;
- Wensheng Pan;
- Youxi Tang
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1899, doi. 10.1049/el.2015.3256
- Hamaoka, F.;
- Okamoto, S.;
- Horikoshi, K.;
- Yonenaga, K.;
- Hirano, A.;
- Miyamoto, Y.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1897, doi. 10.1049/el.2015.3031
- Aimone, A.;
- Fiol, G.;
- Gruner, M.;
- Schell, M.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1846, doi. 10.1049/el.2015.3033
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1916, doi. 10.1049/el.2015.2509
- Cuixian Luo;
- Yanfen Wang;
- Pengwei Li
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1865, doi. 10.1049/el.2015.3099
- García-Martín, A.;
- SanMiguel, J. C.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1914, doi. 10.1049/el.2015.2796
- Daiguo Xu;
- Shiliu Xu;
- Guangbing Chen
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1884, doi. 10.1049/el.2015.2927
- Mitchell, C.;
- Hunt, M. R.;
- McCartney, C. L.;
- Ho, F. D.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1873, doi. 10.1049/el.2015.2522
- Preda, R. O.;
- Vizireanu, D. N.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1928, doi. 10.1049/el.2015.2916
- Choi, H.;
- Urteaga, M.;
- Kim, M.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1893, doi. 10.1049/el.2015.2923
- Wenjie Feng;
- Yuxia Shang;
- Wenquan Che
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1935, doi. 10.1049/el.2015.2515
- Jinbo Li;
- Ran Shu;
- Qun J. Gu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1900, doi. 10.1049/el.2015.2909
- Liu, S.;
- Thomson, D. J.;
- Li, K.;
- Wilson, P.;
- Reed, G. T.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1889, doi. 10.1049/el.2015.2885
- Qi Zhou;
- Li Liu;
- Xingye Zhou;
- Anbang Zhang;
- Yuanyuan Shi;
- Zeheng Wang;
- Yuan Gang Wang;
- Yulong Fang;
- Yuanjie Lv;
- Zhihong Feng;
- Bo Zhang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1859, doi. 10.1049/el.2015.1899
- Yulong Huang;
- Yonggang Zhang;
- Ning Li;
- Lin Zhao
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1933, doi. 10.1049/el.2015.2761
- Perenzoni, M.;
- Xu, H.;
- Stoppa, D.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1886, doi. 10.1049/el.2015.2743
- Jun Dong;
- Hao Peng;
- Yu Liu;
- Haodong Lin;
- Tao Yang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1950, doi. 10.1049/el.2015.2706
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1944, doi. 10.1049/el.2015.2703
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1848, doi. 10.1049/el.2015.2667
- Hua, W.;
- Tadros, R. N.;
- Beerel, P.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1943, doi. 10.1049/el.2015.2648
- Zhong Zheng;
- Lu Liu;
- Te Chen;
- Weiwei Hu
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1909, doi. 10.1049/el.2015.2639
- Okayama, H.;
- Onawa, Y.;
- Shimura, D.;
- Yaegashi, H.;
- Sasaki, H.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1924, doi. 10.1049/el.2015.2565
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1937, doi. 10.1049/el.2015.2477
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1906, doi. 10.1049/el.2015.2448
- Tegegne, Z. G.;
- Viana, C.;
- Polleux, J. L.;
- Grzeskowiak, M.;
- Richalot, E.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1867, doi. 10.1049/el.2015.2360
- Baoxian Wang;
- Shuigen Wang;
- Xun Liu;
- Jinglin Yang
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1908, doi. 10.1049/el.2015.2396
- Šlekas, G.;
- Seliuta, D.;
- Devenson, J.;
- Urbanovič, A.;
- Kancleris, Ž.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1946, doi. 10.1049/el.2015.2472
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1930, doi. 10.1049/el.2015.2362
- Hamdoun, A.;
- Roy, L.;
- Himdi, M.;
- Lafond, O.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1841, doi. 10.1049/el.2015.2412
- Youcheng Wang;
- Guangyou Fang;
- Feng Zhang;
- Yicai Ji;
- Xiaojuan Zhang
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1888, doi. 10.1049/el.2015.2411
- Jang, S.-L.;
- Chen, Y.-J.;
- Fang, C.-H.;
- Lai, W. C.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1918, doi. 10.1049/el.2015.2244
- Prabha, R. Damodaran;
- Rincón-Mora, G. A.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1926, doi. 10.1049/el.2015.2182
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1939, doi. 10.1049/el.2015.2265
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1857, doi. 10.1049/el.2015.2308
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1891, doi. 10.1049/el.2015.2274
- Tubail, D. A.;
- Skaik, T. F.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1913, doi. 10.1049/el.2015.1897
- Haozhou Zhang;
- Menglian Zhao;
- Xiaobo Wu
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1861, doi. 10.1049/el.2015.1823
- Tong Liu;
- Changlin Zhou;
- Zhenyi Wang;
- Shouguo Zhao;
- Zhenhe Liang
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1854, doi. 10.1049/el.2015.2237
- Yeonbae Chung;
- Weijie Cheng;
- Das, Hritom
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1902, doi. 10.1049/el.2015.2156
- Yongming Yan;
- Yang Wang;
- Yun Zeng;
- Xiangliang Jin
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1877, doi. 10.1049/el.2015.2094
- Dong Li;
- Jia Su;
- Tao Wang;
- Huan Lin
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1843, doi. 10.1049/el.2015.2075
- Qu, L.;
- Zhang, R.;
- Kim, H. H.;
- Kim, H.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1922, doi. 10.1049/el.2015.2059
- Haoran Li;
- Jinbin Zhao;
- Xuhong Yang
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1879, doi. 10.1049/el.2015.2017
- Yinyin Tang;
- Yueke Wang;
- Jianyun Chen;
- Xiye Guo
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 23, p. 1895, doi. 10.1049/el.2015.2000
- Gang Liu;
- Lin Li;
- Yang Xiao;
- Si-Si Chen
- Article