Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 22
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1828, doi. 10.1049/el.2015.1292
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2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1833, doi. 10.1049/el.2015.1095
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3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1832, doi. 10.1049/el.2015.1585
- Sunghyun Hwang;
- Byung Jang Jeong;
- Seungkeun Park
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4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1830, doi. 10.1049/el.2015.2417
- AL-Salihi, H.;
- Said, F.;
- Nallanathan, A.;
- Wong, K.
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5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1826, doi. 10.1049/el.2015.2757
- Hossain, M. S.;
- Tariq, F.;
- Safdar, G. A.
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6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1824, doi. 10.1049/el.2015.0488
- Wenqian Shen;
- Linglong Dai;
- Yi Shi;
- Xudong Zhu;
- Zhaocheng Wang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1823, doi. 10.1049/el.2015.2037
- Terano, A.;
- Takei, A.;
- Tanaka, S.;
- Tsuchiya, T.
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8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1809, doi. 10.1049/el.2015.1039
- Weike Feng;
- YongShun Zhang;
- YiDuo Guo;
- XingYu He
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9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1821, doi. 10.1049/el.2015.1978
- Taher, H.;
- Farrell, R.;
- Schreurs, D.;
- Nauwelaers, B.
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10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1817, doi. 10.1049/el.2015.1403
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11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1815, doi. 10.1049/el.2015.1136
- Jun Shi;
- Yang Liu;
- Wei Liu;
- Xiaoling Zhang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1811, doi. 10.1049/el.2015.1516
- Da Xiao;
- Fulin Su;
- Jianjun Gao
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1813, doi. 10.1049/el.2015.3038
- Fioranelli, F.;
- Ritchie, M.;
- Griffiths, H.;
- Borrion, H.
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14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1819, doi. 10.1049/el.2015.2625
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1808, doi. 10.1049/el.2015.2587
- Fortaleza, L. G. S.;
- Silva, E. C.;
- Barbosa, C. R. H.;
- Gusmão, L. A. P.;
- Monteiro, E. C.
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16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1806, doi. 10.1049/el.2015.2709
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17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1804, doi. 10.1049/el.2015.1479
- Chi Shing Wong;
- Yuk Ming Lai;
- Ka Hong Loo;
- Tse, Chi K.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1802, doi. 10.1049/el.2015.2534
- Morosi, J.;
- Boffi, P.;
- Martelli, P.;
- Parolari, P.;
- Cincotti, G.;
- Shimizu, S.;
- Wada, N.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1800, doi. 10.1049/el.2015.2487
- Tao Qin;
- Li Cai;
- Xiaokuo Yang;
- Mingliang Zhang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1778, doi. 10.1049/el.2015.1924
- Liu, Z.;
- Park, T.;
- Park, H. S.;
- Kim, N. S.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1791, doi. 10.1049/el.2015.2342
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1786, doi. 10.1049/el.2015.2009
- Hyeon-Jin Ahn;
- Dong-Won Jang;
- Rae-Hong Park
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1798, doi. 10.1049/el.2015.2844
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1780, doi. 10.1049/el.2015.0913
- Jui-Chiu Chiang;
- Jain-Ron Wu
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1788, doi. 10.1049/el.2015.1458
- Hyeong Jae Hwang;
- Sang Min Yoon
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1796, doi. 10.1049/el.2015.2462
- Jun Dong;
- Ziqiang Yang;
- Hao Peng;
- Tao Yang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1795, doi. 10.1049/el.2015.1750
- Chuantao Cai;
- Jianpeng Wang;
- Yijing Deng;
- Jia-Lin Li
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1793, doi. 10.1049/el.2015.0811
- Yong Fang;
- Baoqing Zeng;
- Lei Yu;
- Peng Gao;
- Hai Zhang;
- Xubo Wei
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1782, doi. 10.1049/el.2015.1216
- Chanho Jung;
- Sanghyun Joo;
- Su Mi Ji
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1789, doi. 10.1049/el.2015.1580
- Je Seok Kim;
- Jahng Hyon Park
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1776, doi. 10.1049/el.2015.0707
- Renjie He;
- Zhiyong Wang;
- Yangyu Fan;
- Dagan Feng, David
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1774, doi. 10.1049/el.2015.2878
- Lui, H. S.;
- Taimre, T.;
- Bertling, K.;
- Lim, Y. L.;
- Dean, P.;
- Khanna, S. P.;
- Lachab, M.;
- Valavanis, A.;
- Indjin, D.;
- Linfield, E. H.;
- Davies, A. G.;
- Rakić, A. D.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1784, doi. 10.1049/el.2015.2289
- Xin Zheng;
- Yung-Sheng Chen
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1772, doi. 10.1049/el.2015.2859
- Chao Wu;
- Yanmeng Guo;
- Yueyue Na;
- Xiaofei Wang;
- Qiang Fu;
- Yonghong Yan
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1771, doi. 10.1049/el.2015.3000
- Kwon, O. K.;
- Oh, S. H.;
- Kim, K. S.;
- Lee, C. W.;
- Leem, Y. A.;
- Nam, E. S.
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36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1769, doi. 10.1049/el.2015.0967
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1767, doi. 10.1049/el.2015.1902
- Songbai Kang;
- Gharavipour, Mohammadreza;
- Affolderbach, Christoph;
- Mileti, Gaetano
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1765, doi. 10.1049/el.2015.1878
- Lee, D. M.;
- Lim, D. C.;
- Ahn, H. J.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1763, doi. 10.1049/el.2015.1296
- Tok Son Choe;
- Won Sang Ra;
- Jin Bae Park
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40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1761, doi. 10.1049/el.2015.1009
- Yanyu Yang;
- Yong Wang;
- Ping Jia
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1759, doi. 10.1049/el.2014.4529
- Kim, S. W.;
- Kim, T. M.;
- Yoo, C.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1758, doi. 10.1049/el.2015.1559
- Xiao Zhao;
- Huajun Fang;
- Tong Ling;
- Jun Xu
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1744, doi. 10.1049/el.2015.2222
- Martinek, R.;
- Kelnar, M.;
- Koudelka, P.;
- Vanus, J.;
- Bilik, P.;
- Janku, P.;
- Nazeran, H.;
- Zidek, J.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1742, doi. 10.1049/el.2015.0598
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45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1740, doi. 10.1049/el.2015.2551
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46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1756, doi. 10.1049/el.2015.2102
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47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1754, doi. 10.1049/el.2015.2235
- D'Angelo, R.;
- Sonkusale, S.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1750, doi. 10.1049/el.2015.2228
- García, L.;
- Benítez, C.;
- Macizo, P.;
- Bajo, T.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1738, doi. 10.1049/el.2015.2291
- Martinek, R.;
- Kelnar, M.;
- Vojcinak, P.;
- Koudelka, P.;
- Vanus, J.;
- Bilik, P.;
- Janku, P.;
- Nazeran, H.;
- Zidek, J.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 22, p. 1752, doi. 10.1049/el.2015.0835
- De Teyou, G. K.;
- Petit, H.;
- Loumeau, P.
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