Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 21
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1621, doi. 10.1049/el.2015.2868
- Article
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1647, doi. 10.1049/el.2015.2992
- Suraparaju, E. R.;
- Arja, P. V. R.;
- Ren, S.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1630, doi. 10.1049/el.2015.2782
- Dang, J. H.;
- Gough, R. C.;
- Morishita, A. M.;
- Ohta, A. T.;
- Shiroma, W. A.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1623, doi. 10.1049/el.2015.2555
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1686, doi. 10.1049/el.2015.2512
- Zubov, F. I.;
- Maximov, M. V.;
- Moiseev, E. I.;
- Savelyev, A. V.;
- Shernyakov, Y. M.;
- Livshits, D. A.;
- Kryzhanovskaya, N. V.;
- Zhukov, A. E.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1683, doi. 10.1049/el.2015.3003
- Li, M.;
- Yang, X.;
- Zhang, Y.;
- Zhao, G.;
- Beadsworth, J.;
- Eifert, L.;
- Tucker, F.;
- Deppe, D. G.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1632, doi. 10.1049/el.2015.2607
- Cremer, M.;
- Dettmar, U.;
- Hudasch, C.;
- Kronberger, R.;
- Lerche, R.;
- Pervez, A.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1677, doi. 10.1049/el.2015.2622
- Roohi, A.;
- Thapliyal, H.;
- DeMara, R. F.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1641, doi. 10.1049/el.2015.2764
- Cook, A. J.;
- Gargiulo, G. D.;
- Lehmann, T.;
- Hamilton, T. J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1679, doi. 10.1049/el.2015.2762
- Thomas, V. A.;
- Liu, D.;
- El-Hajjar, M.;
- Hanzo, L.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1662, doi. 10.1049/el.2015.2503
- Limengnan Zhou;
- Daiyuan Peng
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1693, doi. 10.1049/el.2015.2696
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1654, doi. 10.1049/el.2015.2488
- Zheng-Yu Huang;
- Li-Hua Shi;
- Yinghui Zhou;
- Bin Chen
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1704, doi. 10.1049/el.2015.2480
- Fangqing Wen;
- Yu Zhang;
- Gong Zhang
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1664, doi. 10.1049/el.2015.2468
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1684, doi. 10.1049/el.2015.2449
- Zhiyong Wang;
- Hao Yang;
- Hao Ding;
- Guijin Lu;
- Huabei Jiang;
- Xiaohong Bi
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1675, doi. 10.1049/el.2015.2276
- Ying Lu;
- Xianchao Yang;
- Mintuo Wang;
- Jianquan Yao
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1702, doi. 10.1049/el.2015.2416
- Avedillo, M. J.;
- Núñez, J.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1699, doi. 10.1049/el.2015.2395
- Tsirimokou, G.;
- Psychalinos, C.;
- Allagui, A.;
- Elwakil, A. S.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1649, doi. 10.1049/el.2015.2161
- Kim, W.-C.;
- Kim, J.-G.;
- Ahn, K.-H.;
- Kim, G.-J.;
- Park, S.-H.;
- Ryu, S.-T.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1688, doi. 10.1049/el.2015.2415
- Feng Wu;
- Jin Zhao;
- Yang Liu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1695, doi. 10.1049/el.2015.2108
- Kim, Seulkirom;
- Kim, Katherine A.;
- Bien, Franklin
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1660, doi. 10.1049/el.2015.2262
- Hyeji Kim;
- Youngjoo Lee;
- Ji-Hoon Kim
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1634, doi. 10.1049/el.2015.2206
- Teng Li;
- Baoping Wang;
- Wenbin Dou
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1673, doi. 10.1049/el.2015.2281
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1681, doi. 10.1049/el.2015.2024
- Jian Dang;
- Zaichen Zhang;
- Liang Wu
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1628, doi. 10.1049/el.2015.1771
- Byford, J. A.;
- Park, K. Y.;
- Chahal, P.;
- Rothwell, E. J.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1658, doi. 10.1049/el.2015.2259
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1711, doi. 10.1049/el.2015.2199
- Ruizhe Yang;
- Chen Zheng;
- Zhuwei Wang;
- Yanhua Zhang;
- Fei Richard Yu
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1692, doi. 10.1049/el.2015.1975
- Dongsheng Zhao;
- Dong Dai;
- Licheng Li
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1710, doi. 10.1049/el.2015.2099
- Noulis, T.;
- Lourandakis, E.;
- Stefanou, S.;
- Merakos, P.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1713, doi. 10.1049/el.2015.1770
- Peng Zhang;
- Shuai Du;
- Changyin Liu;
- Qianqian Jiang
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1639, doi. 10.1049/el.2015.1726
- Wang, P.;
- Phillips, B. J.;
- Liebelt, M. J.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1666, doi. 10.1049/el.2015.2015
- Hongqi Yu;
- Day-Uei Li, David
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1706, doi. 10.1049/el.2015.1701
- Houjun Huang;
- Ruohua Zhou;
- Yonghong Yan
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1668, doi. 10.1049/el.2015.1963
- Abouelatta, M.;
- Shaker, A.;
- Gontrand, C.;
- Ossaimee, M.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1643, doi. 10.1049/el.2015.1873
- Jeong Su Lee;
- Chung Min Han;
- Jee Hoon Kim;
- Kwang Suk Park
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1626, doi. 10.1049/el.2015.1822
- Kumar, T.;
- Gautam, A. K.;
- Kanaujia, B. K.;
- Rambabu, K.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1697, doi. 10.1049/el.2015.1586
- Silva, K. M.;
- Almeida, M. L. S.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1690, doi. 10.1049/el.2015.1584
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1624, doi. 10.1049/el.2015.1557
- Huiqing Zhai;
- Chuanhan Zhan;
- Lu Liu;
- Yiping Zang
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1635, doi. 10.1049/el.2015.1521
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1650, doi. 10.1049/el.2015.1370
- Lee, H. S.;
- Yoo, H. W.;
- Lee, B. H.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1715, doi. 10.1049/el.2015.1486
- Bing Fang;
- Zuping Qian;
- Wei Zhong;
- Wei Shao
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1656, doi. 10.1049/el.2015.1456
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1701, doi. 10.1049/el.2015.1363
- Yin Zhang;
- Yulin Huang;
- Jianyu Yang
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1671, doi. 10.1049/el.2015.1329
- Ohlsson, L.;
- Fay, P.;
- Wernersson, L.-E.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 21, p. 1645, doi. 10.1049/el.2015.1318
- Shuai Yuan;
- Ziqiang Wang;
- Xuqiang Zheng;
- Wen Jia;
- Liji Wu;
- Chun Zhang;
- Zhihua Wang
- Article