Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 20
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1824, doi. 10.1049/el.2015.0488
- Shen, Wenqian;
- Dai, Linglong;
- Shi, Yi;
- Zhu, Xudong;
- Wang, Zhaocheng
- Article
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1778, doi. 10.1049/el.2015.1924
- Liu, Z.;
- Park, T.;
- Park, H.S.;
- Kim, N.S.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1828, doi. 10.1049/el.2015.1292
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1823, doi. 10.1049/el.2015.2037
- Terano, A.;
- Takei, A.;
- Tanaka, S.;
- Tsuchiya, T.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1833, doi. 10.1049/el.2015.1095
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1830, doi. 10.1049/el.2015.2417
- AL‐Salihi, H.;
- Said, F.;
- Nallanathan, A.;
- Wong, K.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1832, doi. 10.1049/el.2015.1585
- Hwang, Sunghyun;
- Jeong, Byung Jang;
- Park, Seungkeun
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1791, doi. 10.1049/el.2015.2342
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1789, doi. 10.1049/el.2015.1580
- Kim, Je Seok;
- Park, Jahng Hyon
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1826, doi. 10.1049/el.2015.2757
- Hossain, M.S.;
- Tariq, F.;
- Safdar, G.A.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1769, doi. 10.1049/el.2015.0967
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1776, doi. 10.1049/el.2015.0707
- He, Renjie;
- Wang, Zhiyong;
- Fan, Yangyu;
- Feng, David Dagan
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1821, doi. 10.1049/el.2015.1978
- Taher, H.;
- Farrell, R.;
- Schreurs, D.;
- Nauwelaers, B.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1819, doi. 10.1049/el.2015.2625
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1817, doi. 10.1049/el.2015.1403
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1815, doi. 10.1049/el.2015.1136
- Shi, Jun;
- Liu, Yang;
- Liu, Wei;
- Zhang, Xiaoling
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1813, doi. 10.1049/el.2015.3038
- Fioranelli, F.;
- Ritchie, M.;
- Griffiths, H.;
- Borrion, H.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1811, doi. 10.1049/el.2015.1516
- Xiao, Da;
- Su, Fulin;
- Gao, Jianjun
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1809, doi. 10.1049/el.2015.1039
- Feng, Weike;
- Zhang, YongShun;
- Guo, YiDuo;
- He, XingYu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1808, doi. 10.1049/el.2015.2587
- Fortaleza, L.G.S.;
- Silva, E.C.;
- Barbosa, C.R.H.;
- Gusmão, L.A.P.;
- Monteiro, E.C.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1806, doi. 10.1049/el.2015.2709
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1804, doi. 10.1049/el.2015.1479
- Wong, Chi Shing;
- Lai, Yuk Ming;
- Loo, Ka Hong;
- Tse, Chi K.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1802, doi. 10.1049/el.2015.2534
- Morosi, J.;
- Boffi, P.;
- Martelli, P.;
- Parolari, P.;
- Cincotti, G.;
- Shimizu, S.;
- Wada, N.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1800, doi. 10.1049/el.2015.2487
- Qin, Tao;
- Cai, Li;
- Yang, Xiaokuo;
- Zhang, Mingliang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1798, doi. 10.1049/el.2015.2844
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1796, doi. 10.1049/el.2015.2462
- Dong, Jun;
- Yang, Ziqiang;
- Peng, Hao;
- Yang, Tao
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1795, doi. 10.1049/el.2015.1750
- Cai, Chuantao;
- Wang, Jianpeng;
- Deng, Yijing;
- Li, Jia‐Lin
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1793, doi. 10.1049/el.2015.0811
- Fang, Yong;
- Zeng, Baoqing;
- Yu, Lei;
- Gao, Peng;
- Zhang, Hai;
- Wei, Xubo
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1715, doi. 10.1049/el.2015.1486
- Fang, Bing;
- Qian, Zuping;
- Zhong, Wei;
- Shao, Wei
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1788, doi. 10.1049/el.2015.1458
- Hwang, Hyeong Jae;
- Yoon, Sang Min
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1786, doi. 10.1049/el.2015.2009
- Ahn, Hyeon‐Jin;
- Jang, Dong‐Won;
- Park, Rae‐Hong
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1784, doi. 10.1049/el.2015.2289
- Zheng, Xin;
- Chen, Yung‐Sheng
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1782, doi. 10.1049/el.2015.1216
- Jung, Chanho;
- Joo, Sanghyun;
- Ji, Su Mi
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1780, doi. 10.1049/el.2015.0913
- Chiang, Jui‐Chiu;
- Wu, Jain‐Ron
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1771, doi. 10.1049/el.2015.3000
- Kwon, O.K.;
- Oh, S.H.;
- Kim, K.S.;
- Lee, C.W.;
- Leem, Y.A.;
- Nam, E.S.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1774, doi. 10.1049/el.2015.2878
- Lui, H.S.;
- Taimre, T.;
- Bertling, K.;
- Lim, Y.L.;
- Dean, P.;
- Khanna, S.P.;
- Lachab, M.;
- Valavanis, A.;
- Indjin, D.;
- Linfield, E.H.;
- Davies, A.G.;
- Rakić, A.D.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1720, doi. 10.1049/el.2015.3498
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1772, doi. 10.1049/el.2015.2859
- Wu, Chao;
- Guo, Yanmeng;
- Na, Yueyue;
- Wang, Xiaofei;
- Fu, Qiang;
- Yan, Yonghong
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1767, doi. 10.1049/el.2015.1902
- Kang, Songbai;
- Gharavipour, Mohammadreza;
- Affolderbach, Christoph;
- Mileti, Gaetano
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1765, doi. 10.1049/el.2015.1878
- Lee, D.M.;
- Lim, D.C.;
- Ahn, H.J.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1759, doi. 10.1049/el.2014.4529
- Kim, S.W.;
- Kim, T.M.;
- Yoo, C.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1763, doi. 10.1049/el.2015.1296
- Choe, Tok Son;
- Ra, Won Sang;
- Park, Jin Bae
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1761, doi. 10.1049/el.2015.1009
- Yang, Yanyu;
- Wang, Yong;
- Jia, Ping
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1758, doi. 10.1049/el.2015.1559
- Zhao, Xiao;
- Fang, Huajun;
- Ling, Tong;
- Xu, Jun
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1756, doi. 10.1049/el.2015.2102
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1754, doi. 10.1049/el.2015.2235
- D'Angelo, R.;
- Sonkusale, S.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1752, doi. 10.1049/el.2015.0835
- De Teyou, G.K.;
- Petit, H.;
- Loumeau, P.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1750, doi. 10.1049/el.2015.2228
- García, L.;
- Benítez, C.;
- Macizo, P.;
- Bajo, T.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1748, doi. 10.1049/el.2015.3047
- Guo, Z.X.;
- Wu, Xiaosheng;
- Chen, Wenyuan;
- Cui, Feng;
- Zhang, Weiping;
- Liu, Wu
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 20, p. 1746, doi. 10.1049/el.2015.2371
- Sivashankar, S.;
- Sapsanis, C.;
- Buttner, U.;
- Salama, K.N.
- Article