Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 2
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 127, doi. 10.1049/el.2014.4426
- Article
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3960
- Guerreiro, João;
- Rui Dinis;
- Montezuma, Paulo
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.4130
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3691
- Abdelsamea, M. M.;
- Gnecco, G.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.4052
- Keum-Won Ha;
- Eun-Taek Sung;
- Donghyun Baek
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 128, doi. 10.1049/el.2014.4515
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 126, doi. 10.1049/el.2014.4489
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3487
- Xinming Huang;
- Xiangwei Zhu;
- Gang Ou
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.4104
- Jolani, Farid;
- Yiqiang Yu;
- Zhizhang Chen
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3724
- Kouno, T.;
- Sakai, M.;
- Kishino, K.;
- Hara, K.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3711
- Figliolia, T.;
- Murray, T. S.;
- Andreou, A. G.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3895
- Bobae Kim;
- Jung Won Yoon;
- Seung-eui Lee;
- Seung-Hoon Han;
- Kangwook Kim
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3871
- Ribeiro, R. M.;
- Silva, V. N. H.;
- Barbero, A. P. L.;
- Alves, C. M.;
- Rodrigues, C. R. L.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3866
- Zabri, S. N.;
- Cahill, R.;
- Schuchinsky, A.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3814
- Faes, B.;
- Reynaert, P.;
- Leroux, P.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3749
- Sangseob Kim;
- Chang-Hee Hyoung;
- Kyoung-Hwan Park
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3733
- Li, C.;
- Verhelst, M.;
- Bourdoux, A.;
- Van der Perre, L.;
- Pollin, S.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 172, doi. 10.1049/el.2014.3411
- Ono, H.;
- Hosokawa, T.;
- Ichii, K.;
- Matsuo, S.;
- Yamada, M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3381
- Sungjin Shin;
- Jong-Moon Chung
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3635
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3525
- Tuffery, A.;
- Deltimple, N.;
- Kerhervé, E.;
- Knopik, V.;
- Cathelin, P.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3347
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3523
- Kumar, Nagendra;
- Singh, Yatendra Kumar
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 144, doi. 10.1049/el.2014.3494
- Yuhui Zheng;
- Byeungwoo Jeon;
- Jianwei Zhang;
- Yunjie Chen
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3507
- Mishra, V. K.;
- Sengupta, A.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 131, doi. 10.1049/el.2014.3333
- Xue-Yuan Zhang;
- Qian-Hua He
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3272
- Junfeng Gao;
- Guangjun Li;
- Qiang Li
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3260
- Fuqiang Wang;
- Changbin Yu;
- Xiaoming Wu;
- Yifan Hu
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3235
- Marszalek, W.;
- Trzaska, Z. W.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.3107
- Gantmakher, V. E.;
- Zaleshin, M. V.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.2467
- Chotikakamthorn, N.;
- Jitnupong, T.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.2978
- Haijing Liu;
- Hui Gao;
- Tiejun Lv
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.2113
- Madhavi, T.;
- Rao, G. Sasi Bhushana
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 1, doi. 10.1049/el.2014.2268
- Yongtao Hui;
- Bingbing Li;
- Zhao Tong
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 189, doi. 10.1049/el.2014.4334
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 183, doi. 10.1049/el.2014.3814
- Faes, B.;
- Reynaert, P.;
- Leroux, P.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 161, doi. 10.1049/el.2014.4052
- Ha, Keum‐Won;
- Sung, Eun‐Taek;
- Baek, Donghyun
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 187, doi. 10.1049/el.2014.3381
- Shin, Sungjin;
- Chung, Jong‐Moon
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 185, doi. 10.1049/el.2014.2113
- Madhavi, T.;
- Bhushana Rao, G. Sasi
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 181, doi. 10.1049/el.2014.3525
- Tuffery, A.;
- Deltimple, N.;
- Kerhervé, E.;
- Knopik, V.;
- Cathelin, P.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 164, doi. 10.1049/el.2014.3523
- Kumar, Nagendra;
- Singh, Yatendra Kumar
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 162, doi. 10.1049/el.2014.3866
- Zabri, S.N.;
- Cahill, R.;
- Schuchinsky, A.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 159, doi. 10.1049/el.2014.3895
- Kim, Bobae;
- Yoon, Jung Won;
- Lee, Seung‐eui;
- Han, Seung‐Hoon;
- Kim, Kangwook
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 157, doi. 10.1049/el.2014.3507
- Mishra, V.K.;
- Sengupta, A.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 179, doi. 10.1049/el.2014.3260
- Wang, Fuqiang;
- Yu, Changbin;
- Wu, Xiaoming;
- Hu, Yifan
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 177, doi. 10.1049/el.2014.2268
- Hui, Yongtao;
- Li, Bingbing;
- Tong, Zhao
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 175, doi. 10.1049/el.2014.3487
- Huang, Xinming;
- Zhu, Xiangwei;
- Ou, Gang
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 2, p. 173, doi. 10.1049/el.2014.4104
- Jolani, Farid;
- Yu, Yiqiang;
- Chen, Zhizhang
- Article