Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 18
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1385, doi. 10.1049/el.2015.2868
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2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1384, doi. 10.1049/el.2015.2865
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5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1426, doi. 10.1049/el.2015.2298
- Moscato, S.;
- Bahr, R.;
- Le, T.;
- Pasian, M.;
- Bozzi, M.;
- Perregrini, L.;
- Tentzeris, M. M.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1403, doi. 10.1049/el.2015.2255
- Chung, Kwok L.;
- Chaimool, Sarawuth;
- Chunwei Zhang
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7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1402, doi. 10.1049/el.2015.1915
- Yonghun Cheon;
- Yonghoon Kim
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8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1390, doi. 10.1049/el.2015.1871
- Yuan Yu Yu;
- Xue Wen Cao;
- Sio Hang Pun;
- Peng Un Mak;
- Mang I Vai
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9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1424, doi. 10.1049/el.2015.2100
- Abbasi, M.;
- Ricketts, D. S.
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10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1442, doi. 10.1049/el.2015.1989
- Ling Xiu Zou;
- Yong Zhen Huang;
- Xiao Meng Lv;
- Xiu Wen Ma;
- Jin Long Xiao;
- Yang De Yang;
- Yun Du
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1431, doi. 10.1049/el.2015.1928
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12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1409, doi. 10.1049/el.2015.2202
- Shih-Lun Chen;
- Min-Chun Tuan;
- Tsun-Kuang Chi;
- Tin-Lan Lin
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13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1439, doi. 10.1049/el.2015.2191
- Chen, W.;
- Chen, B.;
- Holmes, A.;
- Fay, P.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1398, doi. 10.1049/el.2015.1846
- Jianjian She;
- Zhanbo Lu;
- Dan Sun;
- Xue Quan Yan
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1444, doi. 10.1049/el.2015.1803
- Alhashim, H. H.;
- Khan, M. Z. M.;
- Majid, M. A.;
- Ng, T. K.;
- Ooi, B. S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1451, doi. 10.1049/el.2015.1785
- Pieraccini, M.;
- Papi, F.;
- Rocchio, S.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1394, doi. 10.1049/el.2015.1784
- Karamzadeh, S.;
- Kartal, M.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1457, doi. 10.1049/el.2015.1757
- Xiguang Xu;
- Hua Qu;
- Jihong Zhao;
- Xiaohan Yang;
- Badong Chen
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19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1440, doi. 10.1049/el.2015.1743
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1433, doi. 10.1049/el.2015.1742
- Nebhen, J.;
- Meillère, S.;
- Masmoudi, M.;
- Seguin, J.-L.;
- Aguir, K.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1396, doi. 10.1049/el.2015.1738
- Rui-Peng Li;
- Peng Wang;
- Qiang Zheng;
- Rui-Zhi Wu
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1437, doi. 10.1049/el.2015.1679
- Mirjalili, S. M.;
- Mirjalili, S.;
- Mirjalili, S. Z.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1392, doi. 10.1049/el.2015.1601
- Li Sun;
- Guan-xi Zhang;
- Bao-hua Sun
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1435, doi. 10.1049/el.2015.1498
- Thraskias, C. A.;
- Boucouvalas, A. C.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1387, doi. 10.1049/el.2015.1488
- Changeun Lee;
- Donghyeon Kim;
- Kiman Kim
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1459, doi. 10.1049/el.2015.1418
- Houjun Huang;
- Yunfei Xu;
- Ruohua Zhou;
- Yonghong Yan
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1420, doi. 10.1049/el.2015.1345
- Traumann, A.;
- Daneshmand, M.;
- Escalera, S.;
- Anbarjafari, G.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1455, doi. 10.1049/el.2015.1302
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1447, doi. 10.1049/el.2015.1298
- Xing Chen;
- Guohua Zhou;
- Shungang Xu;
- Shuhan Zhou
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1453, doi. 10.1049/el.2015.1270
- Jahyun Ahn;
- Seonghearn Lee
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1429, doi. 10.1049/el.2015.1261
- Xiaonan Hu;
- Xuelin Yang;
- Weisheng Hu
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1466, doi. 10.1049/el.2015.1226
- Soto, I.;
- Jiron, I.;
- Valencia, A.;
- Carrasco, R.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1416, doi. 10.1049/el.2015.1202
- Peiyong Zhang;
- Chenhui Feng;
- Huiyan Wang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1413, doi. 10.1049/el.2015.1153
- Hyunwook Joo;
- Yong Surk Lee
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1407, doi. 10.1049/el.2015.1133
- Hyejin An;
- Kab-mun Cha;
- Se-young Choi;
- Hyun-Chool Shin
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1422, doi. 10.1049/el.2015.1103
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37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1464, doi. 10.1049/el.2015.1035
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38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1428, doi. 10.1049/el.2015.0948
- Kordiboroujeni, Z.;
- Bornemann, J.
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39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1462, doi. 10.1049/el.2015.0882
- Belaoura, W.;
- Djeddou, M.;
- Ghanem, K.
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40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1446, doi. 10.1049/el.2015.0816
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1411, doi. 10.1049/el.2015.0768
- Molinar-Solis, J. E.;
- Gurrola-Navarro, M. A.;
- Padilla, I.;
- Ocampo, J. J.;
- Muñiz, C.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1388, doi. 10.1049/el.2015.0747
- Jin Mao;
- Zhongming Xu;
- Si Chen;
- Shu Li;
- Yansong He
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43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1405, doi. 10.1049/el.2015.0544
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1449, doi. 10.1049/el.2015.0503
- Ying-Yi Hong;
- Yi-Ting Tsai;
- Yu-Ting Yeh;
- Yung-Ruei Chang;
- Yih-Der Lee;
- Pang-Wei Liu
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1415, doi. 10.1049/el.2015.0417
- Delias, A.;
- Martin, A.;
- Bouysse, P.;
- Nebus, J. M.;
- Quéré, R.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1418, doi. 10.1049/el.2015.0382
- Shuqin Long;
- Shuiwang Li;
- Qijun Zhao;
- Wanzhong Song
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1461, doi. 10.1049/el.2015.0336
- Ki-Jin Kim;
- Suk-hui Lee;
- Sanghoon Park;
- Kwang-Ho Ahn
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1400, doi. 10.1049/el.2015.0083
- Bahramzy, P.;
- Svendsen, S.;
- Pedersen, G. F.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1552, doi. 10.1049/el.2015.1112
- Chin, Wen‐Long;
- Lee, Jia‐Ming
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50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1550, doi. 10.1049/el.2015.1774
- Barraj, I.;
- Trabelsi, H.;
- Rahajandraibe, W.;
- Masmoudi, M.
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