Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 17
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1354, doi. 10.1049/el.2015.2325
- Kryzhanovskaya, N. V.;
- Moiseev, E. I.;
- Kudashova, Yu. V.;
- Zubov, F. I.;
- Lipovskii, A. A.;
- Kulagina, M. M.;
- Troshkov, S. I.;
- Zadiranov, Yu. M.;
- Livshits, D. A.;
- Maximov, M. V.;
- Zhukov, A. E.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1298, doi. 10.1049/el.2015.2699
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1357, doi. 10.1049/el.2015.2351
- Krauß, N.;
- Haas, M.;
- Winnerl, S.;
- Helm, M.;
- Dekorsy, T.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1350, doi. 10.1049/el.2015.2299
- Aqeeli, M.;
- Leng, T.;
- Huang, X.;
- Chen, J. C.;
- Chang, K. H.;
- Alburaikan, A.;
- Hu, Z.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1372, doi. 10.1049/el.2015.1913
- Li-Jie Xu;
- Gang Zhang;
- Yi-Ming Tang;
- Ya-Ming Bo
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1316, doi. 10.1049/el.2015.1813
- Boni, A.;
- Tonelli, M.;
- Magnanini, A.;
- Caselli, M.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1304, doi. 10.1049/el.2015.1839
- Yu-Jen Chou;
- Guo-Sheng Lin;
- Jun-Fu Chen;
- Lih-Shan Chen;
- Mau-Phon Houng
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1339, doi. 10.1049/el.2015.2306
- Dolatsha, N.;
- Saiz, N.;
- Arbabian, A.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1380, doi. 10.1049/el.2015.1724
- Zhuang, Y.;
- Li, Y.;
- Lan, H.;
- Syed, Z.;
- El-Sheimy, N.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1328, doi. 10.1049/el.2015.2132
- Emran, A.;
- Elsabrouty, M.;
- Muta, O.;
- Furukawa, H.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1314, doi. 10.1049/el.2015.2105
- Seonghun Kang;
- Chang Won Jung
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1352, doi. 10.1049/el.2015.2030
- Brox, O.;
- Fricke, J.;
- Klehr, A.;
- Maaßdorf, A.;
- Matalla, M.;
- Wenzel, H.;
- Erbert, G.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1310, doi. 10.1049/el.2015.1998
- Majumder, B.;
- Kandasamy, K.;
- Mukherjee, J.;
- Ray, K. P.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1363, doi. 10.1049/el.2015.1994
- Xiao-Fan Ai;
- Yong-Jiang Luo;
- Guo-Qing Zhao
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1332, doi. 10.1049/el.2015.1932
- Ogundile, O. O.;
- Genga, Y. O.;
- Versfeld, D. J. J.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1308, doi. 10.1049/el.2015.1919
- Shakhtour, H.;
- Heberling, D.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1341, doi. 10.1049/el.2015.1665
- Jiabin Yan;
- Xiaoping Liao;
- Zhenxiang Yi
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1312, doi. 10.1049/el.2015.1497
- Smith, J.;
- Bawolek, E.;
- Lee, Y. K.;
- O'Brien, B.;
- Marrs, M.;
- Howard, E.;
- Strnad, M.;
- Christen, J. Blain;
- Goryll, M.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1348, doi. 10.1049/el.2015.1493
- Chao Yin;
- Jie Wei;
- Kun Zhou;
- Xiaorong Luo
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1374, doi. 10.1049/el.2015.1491
- Ding, Y.;
- Zhang, J.;
- Fusco, V.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1364, doi. 10.1049/el.2015.1475
- Moldovan, O.;
- Lime, F.;
- Barraud, S.;
- Smaani, B.;
- Latreche, S.;
- Iñiguez, B.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1320, doi. 10.1049/el.2015.1431
- Yuhwan Ro;
- Eojin Lee;
- Jung Ho Ahn
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1370, doi. 10.1049/el.2015.1428
- Maan, A. K.;
- James, A. P.;
- Dimitrijev, S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1366, doi. 10.1049/el.2015.1395
- Christy, P. D.;
- Katayama, Y.;
- Wakejima, A.;
- Egawa, T.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1347, doi. 10.1049/el.2015.1330
- Abe, Y.;
- Shikama, K.;
- Ono, H.;
- Yanagi, S.;
- Takahashi, T.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1301, doi. 10.1049/el.2015.1327
- Jing-Yi Zhang;
- Fan Zhang;
- Wen-Peng Tian;
- Yong-Lun Luo
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1345, doi. 10.1049/el.2015.1274
- Schmalz, K.;
- Borngräber, J.;
- Debski, W.;
- Neumaier, P.;
- Wang, R.;
- Kissinger, D.;
- Hübers, H.-W.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1334, doi. 10.1049/el.2015.1169
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1376, doi. 10.1049/el.2015.1093
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1322, doi. 10.1049/el.2015.0669
- Seung-Tae Kim;
- Oh-Kyong Kwon
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1302, doi. 10.1049/el.2015.0968
- Qiang Li;
- Wei Wang;
- Dingjie Xu;
- Xianpeng Wang;
- Zifa Han
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1336, doi. 10.1049/el.2015.0830
- Zhijiang Dai;
- Songbai He;
- Jingzhou Pang;
- Chaoyi Huang
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1343, doi. 10.1049/el.2015.0721
- Shuai Liu;
- Jun Xu;
- Zhitao Xu
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1324, doi. 10.1049/el.2015.0677
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1355, doi. 10.1049/el.2015.1041
- Yu Dong;
- Jianxing Xu;
- Guanglong Wang;
- Haiqiao Ni;
- Kangming Pei;
- Jianhui Chen;
- Fengqi Gao;
- Baochen Li;
- Zhichuan Niu
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1318, doi. 10.1049/el.2015.0651
- Lorenz, M.;
- Becker, J.;
- Ortmanns, M.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1361, doi. 10.1049/el.2015.0484
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1330, doi. 10.1049/el.2015.0454
- Jian Xie;
- Haihong Tao;
- Xuan Rao;
- Jia Su
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1326, doi. 10.1049/el.2015.0143
- Kim, K. J.;
- Kim, J. H.;
- Nam, S. W.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1338, doi. 10.1049/el.2015.0449
- Jiao Li;
- Chen Ding;
- Feng Wei;
- Xiao Wei Shi
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1378, doi. 10.1049/el.2015.0171
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1359, doi. 10.1049/el.2015.0323
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1368, doi. 10.1049/el.2015.0222
- Tawfic, I. S.;
- Kayhan, S. Koç
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 17, p. 1306, doi. 10.1049/el.2014.4156
- Li, Y.;
- Torah, R.;
- Beeby, S.;
- Tudor, J.
- Article