Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 16
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1279, doi. 10.1049/el.2015.1385
- Xu Yang;
- Guowei Zhao;
- Mingxin Li;
- Deppe, Dennis
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1281, doi. 10.1049/el.2015.1657
- Jeong Jae Han;
- So Ryoung Park;
- Sanguk Noh
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1286, doi. 10.1049/el.2015.1089
- Wen Yu;
- Dedong Han;
- Pan Shi;
- Yingying Cong;
- Yi Zhang;
- Junchen Dong;
- Xiaoliang Zhou;
- Lingling Huang;
- Guodong Cui;
- Shengdong Zhang;
- Xing Zhang;
- Yi Wang
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1290, doi. 10.1049/el.2015.1304
- Le, N. P.;
- Safaei, F.;
- Tran, L. C.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1292, doi. 10.1049/el.2015.0832
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1288, doi. 10.1049/el.2014.4519
- Wei Cui;
- Tong Qian;
- Jing Tian
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1284, doi. 10.1049/el.2015.0079
- Lahgere, A.;
- Sahu, C.;
- Singh, J.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1282, doi. 10.1049/el.2015.1181
- Heng Zhao;
- Hong Hong;
- Li Sun;
- Feng Xi;
- Changzhi Li;
- Xiaohua Zhu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1277, doi. 10.1049/el.2015.1120
- Welna, K.;
- Debnath, K.;
- Krauss, T. F.;
- O'Faolain, L.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1276, doi. 10.1049/el.2015.0421
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1263, doi. 10.1049/el.2015.1228
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1274, doi. 10.1049/el.2015.1393
- Fernández Berlanga, M. D.;
- Ballesteros Garrido, J. A.;
- Martínez Cano, L.;
- González, H. Esteban;
- Belenguer Martínez, Á.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1233, doi. 10.1049/el.2015.1396
- Dongquan Sun;
- Jinping Xu;
- Shu Jiang
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1231, doi. 10.1049/el.2015.1203
- Martin, A.;
- Castel, X.;
- Lafond, O.;
- Himdi, M.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1265, doi. 10.1049/el.2015.1633
- Qi Duan;
- Kaijun Song;
- Fulong Chen;
- Yong Fan
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1245, doi. 10.1049/el.2015.1127
- Kangjun Lee;
- Jechang Jeong
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1272, doi. 10.1049/el.2015.0810
- Fangzheng Zhang;
- Dengjian Zhu;
- Shilong Pan
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1270, doi. 10.1049/el.2015.0690
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1268, doi. 10.1049/el.2015.0921
- Ik-Jae Hyeon;
- Chang-Wook Baek
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1266, doi. 10.1049/el.2015.0235
- Li, Y.;
- Torah, R.;
- Yang, K.;
- Wei, Y.;
- Tudor, J.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1241, doi. 10.1049/el.2015.1604
- Rih-Lung Chung;
- Yi-Qin Zhang;
- Shih-Lun Chen
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1261, doi. 10.1049/el.2015.1049
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1259, doi. 10.1049/el.2015.0334
- Sungheon Lim;
- Seungnam Yang;
- Younghwa Kim;
- Sunhee Yang;
- Hyogon Kim
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1257, doi. 10.1049/el.2015.0389
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1240, doi. 10.1049/el.2015.0272
- Billingsley, J.;
- Ghude, S.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1255, doi. 10.1049/el.2015.0838
- Kiokes, G.;
- Zountouridou, E.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1253, doi. 10.1049/el.2015.1841
- Russell, M.;
- Zou, J. J.;
- Fang, G.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1251, doi. 10.1049/el.2015.1013
- Khalili, A.;
- Soliman, A. A.;
- Asaduzzaman, M.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1249, doi. 10.1049/el.2015.1543
- Longquan Dai;
- Mengke Yuan;
- Xiaopeng Zhang
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1247, doi. 10.1049/el.2015.1349
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1238, doi. 10.1049/el.2015.0013
- Heesung Lim;
- Taejoon Park;
- Nam Sung Kim
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1243, doi. 10.1049/el.2015.1967
- Yinliang Diao;
- Weinong Sun;
- Sai Wing Leung;
- Kwok Hung Chan;
- Yun Ming Siu
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1222, doi. 10.1049/el.2015.2131
- Islam, M. M.;
- Islam, M. T.;
- Samsuzzaman, M.;
- Faruque, M. R. I.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1228, doi. 10.1049/el.2015.1663
- Ming-Chun Tang;
- Ting Shi;
- Ziolkowski, Richard
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1235, doi. 10.1049/el.2015.0899
- Ruaro, A.;
- Thaysen, J.;
- Jakobsen, K. B.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1236, doi. 10.1049/el.2015.0384
- Sohrabi, Z.;
- Jannesari, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1226, doi. 10.1049/el.2015.0934
- Dong-Hyo Lee;
- Seongmin Pyo
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1229, doi. 10.1049/el.2015.1908
- Bhattacharjee, T.;
- Jiang, H.;
- Behdad, N.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1220, doi. 10.1049/el.2015.1594
- Escobar, E. R.;
- Kirsch, N. J.;
- Kontopidis, G.;
- Turner, B.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1352, doi. 10.1049/el.2015.2030
- Brox, O.;
- Fricke, J.;
- Klehr, A.;
- Maaßdorf, A.;
- Matalla, M.;
- Wenzel, H.;
- Erbert, G.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1216, doi. 10.1049/el.2015.2499
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1224, doi. 10.1049/el.2015.1301
- Jingli Guo;
- Yuhang Yang;
- Youhuo Huang;
- Baohua Sun
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1382, doi. 10.1049/el.2015.2510
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1318, doi. 10.1049/el.2015.0651
- Lorenz, M.;
- Becker, J.;
- Ortmanns, M.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1219, doi. 10.1049/el.2015.1138
- Lu, D.;
- Zheng, Y.;
- Penirschke, A.;
- Jakoby, R.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 16, p. 1347, doi. 10.1049/el.2015.1330
- Abe, Y.;
- Shikama, K.;
- Ono, H.;
- Yanagi, S.;
- Takahashi, T.
- Article