Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 12
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 933, doi. 10.1049/el.2015.0309
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2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 945, doi. 10.1049/el.2015.0457
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3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 1014, doi. 10.1049/el.2015.0361
- Chen, T.;
- Mastropaolo, E.;
- Bunting, A.;
- Cheung, R.
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4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 892, doi. 10.1049/el.2015.0445
- Chouhan, S. S.;
- Halonen, K.
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5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 897, doi. 10.1049/el.2015.0649
- Chun-Wei Hsu;
- Kinget, Peter R.
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6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 954, doi. 10.1049/el.2015.0737
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7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 953, doi. 10.1049/el.2015.0563
- Noulis, T.;
- Baumgartner, P.
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8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 951, doi. 10.1049/el.2014.4401
- Xiaowei Wang;
- Zhou Su;
- Guangyi Wang
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9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 949, doi. 10.1049/el.2014.4523
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10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 947, doi. 10.1049/el.2015.0347
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11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 943, doi. 10.1049/el.2015.0276
- Feng, X.;
- Feuvrie, B.;
- Descamps, A. S.;
- Wang, Y.
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12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 941, doi. 10.1049/el.2015.0539
- Ullah Khan, Najeeb;
- Jung-Chul Lee
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13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 939, doi. 10.1049/el.2015.0515
- George, K. K.;
- Kumar, C. S.;
- Ramachandran, K. I.;
- Panda, A.
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14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 937, doi. 10.1049/el.2015.0368
- Qingkai Hou;
- Yang Liu;
- Zengping Chen
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15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 917, doi. 10.1049/el.2015.0212
- Ou, H.;
- Sakai, Y.;
- Tsutsumi, T.;
- Fujiwara, T.;
- Kimura, Y.;
- Sakamoto, T.;
- Suzuki, H.;
- Terada, J.;
- Otaka, A.
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16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 935, doi. 10.1049/el.2014.4178
- Sahebi, M. R.;
- Heidarian, A.
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17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 915, doi. 10.1049/el.2015.0702
- Ducournau, G.;
- Engenhardt, K.;
- Szriftgiser, P.;
- Bacquet, D.;
- Zaknoune, M.;
- Kassi, R.;
- Lecomte, E.;
- Lampin, J.-F.
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18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 932, doi. 10.1049/el.2015.0654
- de Souza, A.C.;
- Duroc, Y.;
- Vuong, T. P.;
- Luce, A.
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19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 930, doi. 10.1049/el.2015.0730
- Kondrath, N.;
- Ayachit, A.;
- Kazimierczuk, M. K.
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20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 928, doi. 10.1049/el.2015.0572
- Seung-Hee Ryu;
- Byoung-Kuk Lee
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21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 926, doi. 10.1049/el.2015.0138
- Seung-Tae Khang;
- Jong Won Yu;
- Wang-Sang Lee
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 925, doi. 10.1049/el.2015.1025
- Fujimoto, Y.;
- Ishii, O.;
- Yamazaki, M.
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23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 923, doi. 10.1049/el.2014.3958
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24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 921, doi. 10.1049/el.2015.0586
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25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 919, doi. 10.1049/el.2015.1137
- Valavanis, A.;
- Han, Y. J.;
- Brewster, N.;
- Dean, P.;
- Dong, R.;
- Bushnell, L.;
- Oldfield, M.;
- Zhu, J. X.;
- Li, L. H.;
- Davies, A. G.;
- Ellison, B.;
- Linfield, E. H.
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26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 914, doi. 10.1049/el.2014.4477
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27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 894, doi. 10.1049/el.2015.0826
- Anjos, E. V. P.;
- Barúqui, F. A. P.
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28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 890, doi. 10.1049/el.2015.0447
- Mun Bae Lee;
- Woo Chul Jeong;
- Sajib, Saurav Z. K.;
- Hyung Joong Kim;
- Oh In Kwon
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 912, doi. 10.1049/el.2015.0391
- Xiangjun Zhang;
- Caoyuan Ma;
- Fei Wang
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30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 910, doi. 10.1049/el.2015.0405
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31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 908, doi. 10.1049/el.2015.0050
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32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 907, doi. 10.1049/el.2015.0108
- Boncalo, O.;
- Amaricai, A.;
- Savin, V.;
- Declercq, D.;
- Ghaffari, F.
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33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 905, doi. 10.1049/el.2015.0258
- Songhao Zhu;
- Xiangxiang Li;
- Shuhan Shen
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34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 903, doi. 10.1049/el.2014.4107
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35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 901, doi. 10.1049/el.2015.0112
- Liangxiao Tang;
- Weixin Gai;
- Jincai Liu
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36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 899, doi. 10.1049/el.2014.4280
- Yakopcic, C.;
- Taha, T. M.;
- McLean, M.
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37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 888, doi. 10.1049/el.2015.0850
- Iqbal, J.;
- Tsagarakis, N. G.;
- Caldwell, D. G.
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38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 895, doi. 10.1049/el.2015.0342
- Kaivani, Amir;
- Seok-Bum Ko
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39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 989, doi. 10.1049/el.2015.0297
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40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 1023, doi. 10.1049/el.2015.1052
- Delprato, J.;
- Delias, A.;
- Medrel, P.;
- Barataud, D.;
- Campovecchio, M.;
- Neveux, G.;
- Martin, A.;
- Bouysse, P.;
- Nebus, J.M.;
- Tolant, C.;
- Eudeline, P.
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41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 1021, doi. 10.1049/el.2015.0982
- Pieraccini, M.;
- Papi, F.;
- Donati, N.
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42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 1020, doi. 10.1049/el.2015.0225
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43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 886, doi. 10.1049/el.2014.3924
- Xiong Zou;
- Chuang-Ming Tong;
- Xi-Min Li;
- Ding-Wang Yu
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44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 885, doi. 10.1049/el.2015.0228
- Qiang Chen;
- Liang Chen;
- Jiajun Bai;
- Yunqi Fu
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 883, doi. 10.1049/el.2015.0288
- Bao-qin Lin;
- Shan-hong Zhou;
- Xing-yu Da;
- Ying-wu Fang;
- Yong-jun Li;
- Wei Li
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46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 880, doi. 10.1049/el.2015.1751
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47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 879, doi. 10.1049/el.2015.1745
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49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 878, doi. 10.1049/el.2015.1753
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50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 12, p. 1037, doi. 10.1049/el.2015.1930
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