Works matching IS 00135194 AND DT 2015 AND VI 51 AND IP 10
1
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 792, doi. 10.1049/el.2015.0808
- Kyung Jun Kim;
- Kyung Jun Choi;
- Seong Ro Lee;
- Kwang Soon Kim
- Article
2
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 769, doi. 10.1049/el.2015.0751
- Bekasiewicz, A.;
- Koziel, S.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 738, doi. 10.1049/el.2015.0612
- Kawamura, T.;
- Masuda, K.;
- Hirai, T.;
- Ohta, Y.;
- Motoyama, M.;
- Takehara, H.;
- Noda, T.;
- Sasagawa, K.;
- Tokuda, T.;
- Okitsu, T.;
- Takeuchi, S.;
- Ohta, J.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 745, doi. 10.1049/el.2015.0461
- Article
5
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 775, doi. 10.1049/el.2015.0624
- Shikam, K.;
- Asakawa, S.;
- Abe, Y.;
- Takahashi, T.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 787, doi. 10.1049/el.2015.0051
- Lukacs, M.;
- Collins, P.;
- Temple, M.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 751, doi. 10.1049/el.2015.0767
- Derbel, A.;
- Vivet, D.;
- Emile, B.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 760, doi. 10.1049/el.2015.0520
- Article
9
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 749, doi. 10.1049/el.2015.0659
- Ming Yin;
- Junbin Gao;
- Yi Guo
- Article
10
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 794, doi. 10.1049/el.2015.0610
- Weber, C.;
- Peter, M.;
- Felhauer, T.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 780, doi. 10.1049/el.2015.0605
- Sokolova, Z. N.;
- Bakhvalov, K. V.;
- Lyutetskiy, A. V.;
- Pikhtin, N. A.;
- Tarasov, I. S.;
- Asryan, L. V.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 778, doi. 10.1049/el.2015.0577
- Lombardi III, J. P.;
- Aga Jr., R. S.;
- Heckman, E. M.;
- Bartsch, C. M.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 742, doi. 10.1049/el.2015.0574
- Wenjuan Lu;
- Chunyu Peng;
- Youwu Tao;
- Zhengping Li
- Article
14
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 752, doi. 10.1049/el.2015.0530
- Yoo, W. S.;
- Park, J. B.;
- Lee, B. H.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 785, doi. 10.1049/el.2015.0348
- Haolin Li;
- Lei Zhang;
- Mengdao Xing;
- Zheng Bao
- Article
16
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 767, doi. 10.1049/el.2015.0343
- Wagner, J.;
- Joram, N.;
- Wolf, R.;
- Ellinger, F.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 763, doi. 10.1049/el.2015.0345
- Article
18
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 735, doi. 10.1049/el.2015.0466
- Rui-Zhi Wu;
- Peng Wang;
- Qiang Zheng;
- Rui-Peng Li
- Article
19
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 791, doi. 10.1049/el.2015.0431
- Pengfei You;
- Yanhui Liu;
- Xin Huang;
- Liang Zhang;
- Liu, Qing H.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 782, doi. 10.1049/el.2015.0299
- Song, Y. M.;
- Ju, G. W.;
- Choi, H. J.;
- Lee, Y. W.;
- Na, B. H.;
- Lee, Y. T.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 771, doi. 10.1049/el.2015.0393
- Mung, S. W. Y.;
- Chan, W. S.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 736, doi. 10.1049/el.2015.0351
- Tian-Ling Zhang;
- Xiao-Qiang Yang;
- Dong-Liang Fei;
- Ze-Hong Yan
- Article
23
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 747, doi. 10.1049/el.2014.4528
- Article
24
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 836, doi. 10.1049/el.2014.4303
- Aguilà, P.;
- Zuffanelli, S.;
- Zamora, G.;
- Paredes, F.;
- Martín, F.;
- Bonache, J.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 773, doi. 10.1049/el.2015.0290
- Fu-Jun Chen;
- Feng-Guang Luo;
- Bin Li;
- Cheng He
- Article
26
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 789, doi. 10.1049/el.2014.3833
- Article
27
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 865, doi. 10.1049/el.2015.0140
- Michalik, P.;
- Sánchez‐Chiva, J.M.;
- Fernández, D.;
- Madrenas, J.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 765, doi. 10.1049/el.2015.0232
- Huicong Zeng;
- Chulong Liang;
- Xiao Ma
- Article
29
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 740, doi. 10.1049/el.2015.0230
- Zamani, A.;
- Rezaeieh, S. A.;
- Abbosh, A. M.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 733, doi. 10.1049/el.2015.0206
- Yong Luo;
- Kazutaka Kikuta;
- Zhengli Han;
- Takuya Takahashi;
- Akira Hirose;
- Hiroshi Toshiyoshi
- Article
31
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 863, doi. 10.1049/el.2014.3978
- Chen, Hong Meng;
- Li, Ming;
- Wang, Zeyu;
- Lu, Yunlong;
- Zhang, Peng;
- Wu, Yan
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 762, doi. 10.1049/el.2014.4432
- Giard, P.;
- Sarkis, G.;
- Thibeault, C.;
- Gross, W. J.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 777, doi. 10.1049/el.2014.4416
- Schidl, S.;
- Enne, R.;
- Zimmermann, H.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 758, doi. 10.1049/el.2014.4329
- Wenbo Wan;
- Ju Liu;
- Jiande Sun;
- Chuan Ge;
- Xiushan Nie
- Article
35
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 744, doi. 10.1049/el.2014.4295
- Madureira, H.;
- Deltimple, N.;
- Kerherve, E.;
- Dematos, M.;
- Haddad, S.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 754, doi. 10.1049/el.2014.4259
- Article
37
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 756, doi. 10.1049/el.2014.3874
- Article
38
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 834, doi. 10.1049/el.2014.4084
- Kim, Gunyoung;
- Lee, Bomson
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 860, doi. 10.1049/el.2014.4378
- Samaali, H.;
- Ouni, B.;
- Najar, F.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 783, doi. 10.1049/el.2014.3593
- Xin Zhang;
- Puming Huang;
- Weiwei Wang
- Article
41
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 876, doi. 10.1049/el.2015.1477
- Article
42
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 874, doi. 10.1049/el.2014.4145
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 873, doi. 10.1049/el.2015.0378
- Park, Sangjoon;
- Choi, Sooyong
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 871, doi. 10.1049/el.2014.4160
- Yu, Kai;
- Li, Sizhen;
- Zhang, Zhihao;
- Zhang, Gary;
- Tong, Qiaoling;
- Zou, Xuecheng
- Article
45
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 869, doi. 10.1049/el.2015.0685
- Article
46
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 867, doi. 10.1049/el.2015.0362
- Wu, J.;
- Han, D.D.;
- Cong, Y.Y.;
- Zhao, N.N.;
- Chen, Z.F.;
- Dong, J.C.;
- Zhao, F.L.;
- Zhang, S.D.;
- Liu, L.F.;
- Zhang, X.;
- Wang, Y.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 862, doi. 10.1049/el.2015.0462
- Nair, R.U.;
- Suprava, M.;
- Jha, R.M.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 838, doi. 10.1049/el.2015.0595
- Article
49
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 852, doi. 10.1049/el.2015.0770
- Kishino, K.;
- Yanagihara, A.;
- Ikeda, K.;
- Yamano, K.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 10, p. 826, doi. 10.1049/el.2015.0589
- Lee, Hyo‐Haeng;
- Kim, Jung‐Hyun;
- Hong, Kwang‐Seok
- Article