Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 9


Results: 41
    1

    nuclear screening.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 9, p. 646, doi. 10.1049/el.2014.1227
    Publication type:
    Article
    2
    3
    4
    5
    6

    interview.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 9, p. 644, doi. 10.1049/el.2014.1284
    By:
    • Piehler, David
    Publication type:
    Article
    7

    in brief.

    Published in:
    2014
    Publication type:
    Abstract
    8

    light at the end of the tunnel.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 9, p. 645, doi. 10.1049/el.2014.1223
    Publication type:
    Article
    9
    10
    11
    12
    13
    14
    15
    16
    17
    18
    19
    20
    21
    22
    23
    24
    25
    26
    27
    28
    29
    30
    31
    32
    33
    34
    35
    36
    37

    Failure mechanism for input buffer under CDM test.

    Published in:
    Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 9, p. 667, doi. 10.1049/el.2013.4094
    By:
    • Tzu-Cheng Kao;
    • Chung-Yu Hung;
    • Jian-Hsing Lee;
    • Chen-Hsin Lien;
    • Chien-Wei Chiu;
    • Kuo-Hsuan Lo;
    • Hung-Der Su;
    • Wu-Te Weng
    Publication type:
    Article
    38
    39
    40
    41