Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 5
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2014.0087
- Okayama, H.;
- Onawa, Y.;
- Shimura, D.;
- Takahashi, H.;
- Miyamura, S.;
- Yaegashi, H.;
- Sasaki, H.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 331, doi. 10.1049/el.2014.0538
- Article
3
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2014.0056
- Ducournau, G.;
- Yoshimizu, Y.;
- Hisatake, S.;
- Pavanello, F.;
- Peytavit, E.;
- Zaknoune, M.;
- Nagatsuma, T.;
- Lampin, J.-F.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4300
- Augustine, R.;
- Raman, S.;
- Rydberg, A.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 332, doi. 10.1049/el.2014.0555
- Article
7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 330, doi. 10.1049/el.2014.0553
- Article
8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4160
- Article
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4132
- Younghoon Cho;
- Byeng-Joo Byen;
- Gyu-Ha Choe
- Article
10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4115
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2014.0040
- Weihai Fang;
- Peng Fei;
- Feng Nian
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4087
- Ahn, H. R.;
- Kim, M.S.;
- Kim, Y. J.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4079
- Tan, Z. Y.;
- Tao Zhou;
- Fu, Z. L.;
- Cao, J. C.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4253
- Gupta, S.;
- Gui Jun Li;
- Roberts, R. C.;
- Li Jun Jiang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4170
- Yang, C. C.;
- Zhao, Q.;
- Gao, C. C.;
- Liu, G. D.;
- Zhang, Y. X.;
- Cui, W. P.;
- Hao, Y. L.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4072
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4038
- Gimenez, S. P.;
- Leoni, R. D.;
- Renaux, C.;
- Flandre, D.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4029
- Zhi Bin Xiao;
- Yingxiang Liu;
- Xiaomei Tang;
- XiangWei Zhu;
- Feixue Wang
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.4021
- Longsheng Liu;
- Yue Li;
- Zhijun Zhang;
- Zhenghe Feng
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3993
- Lim, M. K.;
- Chan, C. S.;
- Monekosso, D.;
- Remagnino, P.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3657
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3984
- Zhangyong Chen;
- Jianping Xu
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3952
- Bowers, D. F.;
- Modica, E. J.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3942
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3921
- Niwayama, M.;
- Yamakawa, T.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3886
- Samson, G. Beaufort;
- Levasseur, M.-A.;
- Gagnon, F.;
- Gagnon, G.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3980
- Sarrazin, F.;
- Pouliguen, P.;
- Sharaiha, A.;
- Potier, P.;
- Chauveau, J.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3562
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3548
- Article
30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3866
- Yongtao Jia;
- Ying Liu;
- Yuwen Haoa;
- Shuxi Gong
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3796
- Ducournau, G.;
- Pavanello, F.;
- Beck, A.;
- Tohme, L.;
- Blin, S.;
- Nouvel, P.;
- Peytavit, E.;
- Zaknoune, M.;
- Szriftgiser, P.;
- Lampin, J. F.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3695
- Han, Y.;
- Liu, Y. M.;
- Jin, P.;
- Liu, B.;
- Ma, J.;
- Tan, J. B.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3857
- Jin-Young Kim;
- Shang Hyeun Park;
- SeGi Yu
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3834
- Kai Xie;
- Zhijun Bai;
- Wenmao Yu
- Article
35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3819
- Wei Li;
- Yue Zhang;
- Jin Wang;
- Li-ke Huang;
- Jian Xiong;
- Carster Maple
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3537
- Zhi Li;
- Liguo Sun;
- Lu Huang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.2908
- Zhou, J. G.;
- Chiang, Y. C.;
- Che, W. Q.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3311
- Gonzalez-Diaz, V. R.;
- Peña-Perez, A.;
- Maloberti, F.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3523
- Article
40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3209
- Martín, R.;
- Martínez, J. M.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3162
- Wu, J. J.;
- Hou, D. J.;
- Shen, J. Q.;
- Chiueh, H. L.;
- Yang, T. J.;
- Wu, C.-J.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3505
- Hyejeong Ryu;
- Wan Kyun Chung
- Article
43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3461
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3439
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3288
- Yu, H. G.;
- Choi, S. H.;
- Jeon, S.;
- Kim, M.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.3235
- Chenggang Yan;
- Yongdong Zhang;
- Feng Dai;
- Xi Wang;
- Liang Li;
- Qionghai Dai
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.2671
- Article
48
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.2802
- Chowdhury, M. S.;
- Ashrafuzzaman, K.;
- K. S. Kwak
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.2755
- Article
50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 5, p. 1, doi. 10.1049/el.2013.2121
- Shengsen Wang;
- Chunyan Feng;
- Caili Guo;
- Guoxiang Wang
- Article