Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 3
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3101
- Article
2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2994
- Guerra, E. O.;
- Reguera, V. A.;
- Souza, R. D.;
- Brante, G.;
- Fernandez, E. M. G.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3146
- Article
4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3752
- Article
5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3747
- Messaoudene, I.;
- Denidni, T. A.;
- Benghalia, A.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3731
- Rongguo Zhou;
- Zhongxiang Zhang;
- Chang Chen;
- Hualiang Zhang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3715
- S. Noh;
- C. Yoon;
- E. Hyun;
- H. N. Yoon;
- T. J. Chung;
- K. S. Park;
- H. C. Kim
- Article
8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3709
- Sajin, J. S.;
- Praveen, G.;
- Habiba, H. U.;
- Rao, P. H.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3708
- Shichao Li;
- Chao Li;
- Xiaojuan Zhang;
- Guangyou Fang
- Article
10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3589
- Reyhani, S. Z.;
- Hashemipour, O.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3685
- Santiago-Montero, R.;
- López-Morales, M. A.;
- Sossa, J. H.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3508
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3450
- Hinojo, J.;
- Luján-Martínez, C.;
- Torralba, A.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3447
- Xiaobin Huang;
- Quanzhong Li;
- Qi Zhang;
- Jiayin Qin
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3442
- Benqing Guo;
- Guangjun Wen;
- Shiquan An
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3409
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3371
- Chester Sungchung Park;
- Jintae Kim
- Article
18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3327
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3259
- Darsena, D.;
- Gelli, G.;
- Verde, F.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3214
- Anderson, T. J.;
- Feigelson, B. N.;
- Kub, F. J.;
- Tadjer, M. J.;
- Hobart, K. D.;
- Mastro, M. A.;
- Hite, J. K.;
- Eddy, Jr., C. R.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3193
- Ze Jia;
- Gong Zhang;
- Jizhi Liu;
- Zhiwei Liu;
- Juin J. Liou
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 130, doi. 10.1049/el.2014.0198
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 132, doi. 10.1049/el.2014.0197
- Anderson, T. J.;
- Feigelson, B. N.;
- Kub, F. J.;
- Tadjer, M. J.;
- Hobart, K. D.;
- Mastro, M. A.;
- Hite, J. K.;
- Eddy Jr., C. R.
- Article
25
- 2014
- S. Noh;
- C. Yoon;
- E. Hyun;
- H. N. Yoon;
- T. J. Chung;
- K. S. Park;
- H. C. Kim
- Product Review
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3978
- C. D. Qi;
- X. M. Shi;
- M. M. Bian;
- Y. J. Xue
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3956
- Y. S. Kang;
- S. B. Lee;
- Y. S. Ho
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3932
- J. Y. Kim;
- D. S. Kim;
- D. W. Woo;
- D. S. Shin;
- W. S. Park;
- W. Hwang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3906
- Allen, B.;
- Tennant, A.;
- Bai, Qiang;
- E. Chatziantoniou
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3884
- Bala, B.D.;
- Rahim, M. K. A.;
- Murad, N. A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3875
- Slimane, E. Ben;
- Jarboui, S.;
- Bouallègue, A.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3860
- T. Tajima;
- H. J. Song;
- M. Yaita
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3840
- Article
35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3830
- D. Cha;
- S. Oh;
- K. I. Kim;
- K. S. Kim;
- S. Kim
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3804
- Chin-I Yeh;
- Wu-Shiung Feng;
- Chen-Yu Hsu
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3813
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3800
- Rishøj, L. S.;
- Svane, A. S.;
- Lund-Hansen, T.;
- Rottwitt, K.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2871
- Article
40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3791
- Yongle Wu;
- Siyue Zhou;
- Weiwei Zhang;
- Mengbi Liao;
- Yuanan Liu
- Article
41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3784
- Heng Wei;
- Min Lin;
- Yang Xiang
- Article
42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3753
- Son, Minoh;
- Park, Changkun
- Article
43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2991
- Helmle, S.;
- Dehm, M.;
- Kuhn, M.;
- Lieckfeldt, D.;
- Pesch, D.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2767
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.3781
- Peng Chen;
- Songbai He;
- Xianfei Wang;
- Zhijiang Dai
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2857
- Sangwoo Han;
- Jintae Kim;
- Jongsun Kim
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2838
- Casson, A. J.;
- Rodriguez-Villegas, E.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2832
- Gaoqi Dou;
- Chunquan He;
- Congying Li;
- Jun Gao
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2780
- Article
50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 3, p. 1, doi. 10.1049/el.2013.2846
- N. Yafune;
- S. Hashimoto;
- K. Akita;
- Y. Yamamoto;
- H. Tokuda;
- M. Kuzuhara
- Article