Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 23
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1768, doi. 10.1049/el.2014.3508
- Zhibin Luan;
- Xiang Chen;
- Ning Ge;
- Zhaocheng Wang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1741, doi. 10.1049/el.2014.2542
- Tao Zeng;
- Wei Yin;
- Zegang Ding;
- Teng Long
- Article
3
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1736, doi. 10.1049/el.2014.1084
- Sheng-Shih Wang;
- Jyh-Jier Ho;
- Duo-Sheng Chen;
- Jia-Show Ho;
- Chen-Hsun Du;
- Song-Yeu Tsai;
- Hsien-Seng Hung;
- Wang, Kang L.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1757, doi. 10.1049/el.2014.2522
- Nunes, J.;
- Bento, P.;
- Gomes, M.;
- Dinis, R.;
- Silva, V.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1740, doi. 10.1049/el.2014.2633
- Wei Cui;
- Shuang Wu;
- Jing Tian;
- Shenghui Shao;
- Siliang Wu
- Article
6
- 2014
- Srinivasan, S. R.;
- Balsara, P. T.
- Correction Notice
7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1772, doi. 10.1049/el.2014.2877
- Khan, A.;
- Fanaei, M.;
- Jamalipour, A.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1770, doi. 10.1049/el.2014.2769
- Article
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1761, doi. 10.1049/el.2014.2825
- Soonyong Song;
- Kunmin Yeo;
- Yong Tae Lee;
- Won Ryu;
- Young-il Kim
- Article
10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1766, doi. 10.1049/el.2014.2685
- Jungyup Jang;
- Dong Ho Kim;
- Ye Hoon Lee
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1764, doi. 10.1049/el.2014.2786
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1762, doi. 10.1049/el.2014.2972
- Aridas, N. K.;
- Yarman, B. S.;
- Chacko, P.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1759, doi. 10.1049/el.2014.2777
- Guobing Li;
- Pinyi Ren;
- Gangming Lv;
- Qinghe Du
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1738, doi. 10.1049/el.2014.2155
- Hill, R. D.;
- Tough, R. J. A.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1755, doi. 10.1049/el.2014.0845
- Yingying Dong;
- Fuqin Li;
- Zhengguang Xu
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1753, doi. 10.1049/el.2014.1355
- Kim, J. J.;
- Yang, K. M.;
- Kim, J. M.;
- Kim, Y. J.;
- Lee, S. Y.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1751, doi. 10.1049/el.2014.2901
- Chen, Jone F.;
- Tzu-Hsiang Chen;
- Deng-Ren Ai
- Article
18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1749, doi. 10.1049/el.2014.1692
- Chul-Ho Won;
- Ki-Won Kim;
- Dong-Seok Kim;
- Hee-Sung Kang;
- Ki-Sik Im;
- Young-Woo Jo;
- Do-Kywn Kim;
- Ryun-Hwi Kim;
- Jung-Hee Lee
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1747, doi. 10.1049/el.2014.1823
- Chien-Hung Wu;
- Kow-Ming Chang;
- Hsin-Yu Hsu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1743, doi. 10.1049/el.2014.1680
- Xiaopeng Yang;
- Yuze Sun;
- Yongxu Liu;
- Teng Long
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1745, doi. 10.1049/el.2014.3206
- Hiblot, G.;
- Rafhay, Q.;
- Boeuf, F.;
- Ghibaudo, G.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1731, doi. 10.1049/el.2014.2437
- Park, M. S.;
- Jain, V.;
- Lee, E. H.;
- Kim, S. H.;
- Pettersson, H.;
- Wang, Q.;
- Song, J. D.;
- Choi, W. J.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1724, doi. 10.1049/el.2014.3061
- Jingping Liu;
- Safieddin Safavi-Naeini;
- Dayan Ban
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1734, doi. 10.1049/el.2014.1908
- Jinghua Li;
- Jinyu Wen;
- Jiaming Li;
- Shijie Cheng;
- Peng Yu;
- Weihua Luo
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1720, doi. 10.1049/el.2014.3075
- Attaran, A.;
- Rashidzadeh, R.;
- Muscedere, R.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1733, doi. 10.1049/el.2014.3129
- Tian, Z.-B.;
- Plis, E. A.;
- Hinkey, R. T.;
- Krishna, S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1664, doi. 10.1049/el.2014.3103
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1712, doi. 10.1049/el.2014.2805
- Yongjun Huang;
- Guangjun Wen;
- Jian Li
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1710, doi. 10.1049/el.2014.3115
- Sheng-Lyang Jang;
- Chih-Yuan Lin
- Article
30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1729, doi. 10.1049/el.2014.2849
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1728, doi. 10.1049/el.2014.2228
- Schidl, S.;
- Zimmermann, H.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1726, doi. 10.1049/el.2014.2618
- Article
33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1678, doi. 10.1049/el.2014.2678
- Seung-Hoon Kim;
- Sang-Bock Cho;
- Sung Min Park
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1722, doi. 10.1049/el.2014.2401
- Hite, J. K.;
- Gaddipati, P.;
- Meyer, D. J.;
- Mastro, M. A.;
- Eddy Jr., C. R.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1719, doi. 10.1049/el.2014.2732
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1717, doi. 10.1049/el.2014.3456
- Ping-Juan Zhang;
- Min-Quan Li
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1715, doi. 10.1049/el.2014.3652
- Ducournau, G.;
- Szriftgiser, P.;
- Bacquet, D.;
- Zaknoune, M.;
- Kassi, R.;
- Lampin, J.-F.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1697, doi. 10.1049/el.2014.2659
- Mingyong Zeng;
- Chang Tian;
- Zemin Wu;
- Xi Liu
- Article
39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1714, doi. 10.1049/el.2014.3020
- Xie Xiaoqiang;
- Zhou Qiang;
- Li Dawei
- Article
40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1699, doi. 10.1049/el.2014.2086
- Guozhen Cheng;
- Hongchang Chen
- Article
41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1693, doi. 10.1049/el.2014.3351
- Xia, P.;
- Awatsuji, Y.;
- Nishio, K.;
- Matoba, O.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1708, doi. 10.1049/el.2014.2612
- Long, J.;
- Sievenpiper, D. F.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1706, doi. 10.1049/el.2014.3024
- Roy, A. G.;
- Mayaram, K.;
- Fiez, T. S.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1704, doi. 10.1049/el.2014.2116
- Bobae Kim;
- Seung-eui Lee;
- Seung-Hoon Han;
- Kangwook Kim
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1702, doi. 10.1049/el.2014.2993
- Shah, S. M.;
- Samar, R.;
- Naqvi, S. M. R.;
- Chambers, J. A.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1701, doi. 10.1049/el.2014.1549
- Jaehwan Jung;
- Youngjoo Lee;
- In-Cheol Park
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1682, doi. 10.1049/el.2014.3104
- Arumí, D.;
- Rodríguez-Montañés, R.;
- Figueras, J.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1695, doi. 10.1049/el.2014.2844
- Shaoshu Gao;
- Yanjiang Wang;
- Weiqi Jin;
- Xiaodong Zhang
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1879, doi. 10.1049/el.2014.2971
- Hong, Seoyoung;
- Lee, Seonghearn
- Article
50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1691, doi. 10.1049/el.2014.2651
- Article