Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 22
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1568, doi. 10.1049/el.2014.2964
- Article
2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1581, doi. 10.1049/el.2014.3063
- Kong-Woo Lee;
- Seung-Hwan Lee;
- Beom-Hee Lee
- Article
3
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1556, doi. 10.1049/el.2014.3605
- Article
4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1557, doi. 10.1049/el.2014.3604
- Article
6
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1564, doi. 10.1049/el.2014.3163
- Addaci, R.;
- Hamdiken, N.;
- Fortaki, T.;
- Ferrero, F.;
- Seetharamdoo, D.;
- Staraj, R.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1583, doi. 10.1049/el.2014.2167
- Wei Qiu;
- Jianxiong Zhou;
- Hong Zhong Zhao;
- Qiang Fu
- Article
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1602, doi. 10.1049/el.2014.3097
- Reviriego, P.;
- Maestro, J. A.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1570, doi. 10.1049/el.2014.2047
- MooHo Bae;
- Sung-Bae Park;
- Sung-Jae Kwon
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1579, doi. 10.1049/el.2014.1595
- Reum Oh;
- J. Jang;
- J. Kim;
- Man Young Sung
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1563, doi. 10.1049/el.2014.2898
- Verma, P. K.;
- Kumar, R.;
- Singh, M.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1620, doi. 10.1049/el.2014.3002
- Ippolito, C. E.;
- Paranjpe, T.;
- Permeneva, D.;
- Maywar, D. N.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1613, doi. 10.1049/el.2014.2992
- Chun-Ho Jeong;
- Jong-Phil Hong
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1646, doi. 10.1049/el.2014.2969
- Liangyin Chen;
- Xunde Xiong;
- Yanru Chen;
- Kai Liu;
- Jingyu Zhang;
- Yushi Jiang;
- Feng Yin;
- Qian Luo
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1631, doi. 10.1049/el.2014.2774
- Kashio, N.;
- Kurishima, K.;
- Ida, M.;
- Matsuzaki, H.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1633, doi. 10.1049/el.2014.2611
- Xi Zhao;
- Zhiming Gao;
- Tao Feng;
- Shishir Shah;
- Weidong Shi
- Article
18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1616, doi. 10.1049/el.2014.2863
- Fei Gao;
- Fushun Zhang;
- Jiang Long;
- Jacob, Minu;
- Sievenpiper, Daniel
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1622, doi. 10.1049/el.2014.2848
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1630, doi. 10.1049/el.2014.2723
- Jianbing Li;
- Xiaoping Li;
- Mingfu Lin;
- Jungang Shi;
- Shuangxi Zhang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1641, doi. 10.1049/el.2014.2648
- Tian Liang;
- Smith, David B.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1624, doi. 10.1049/el.2014.2470
- Guojie Tu;
- Xuping Zhang;
- Yixin Zhang;
- Zhoufeng Ying;
- Lidong Lv
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1626, doi. 10.1049/el.2014.2190
- Abramovitz, Alexander;
- Jia Yao;
- Smedley, Keyue
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1615, doi. 10.1049/el.2014.2178
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1628, doi. 10.1049/el.2014.2464
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1574, doi. 10.1049/el.2014.2371
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1591, doi. 10.1049/el.2014.1956
- Yu Lu;
- Sook Yoon;
- Dong Sun Park
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1585, doi. 10.1049/el.2014.1017
- Shih-Lun Chen;
- Huan-Rui Chang;
- Ting-Lan Lin
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1645, doi. 10.1049/el.2014.2154
- Ming Jin;
- Qinghua Guo;
- Jiangtao Xi;
- Yanguang Yu
- Article
30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1587, doi. 10.1049/el.2014.1844
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1566, doi. 10.1049/el.2014.2144
- Alam, S.;
- Lai, E. M-K.;
- Young, J.;
- Hasan, S. M. R.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1561, doi. 10.1049/el.2014.2125
- Article
33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1597, doi. 10.1049/el.2014.2121
- Juhua Wang;
- Guohua Zhang;
- Quan Zhou
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1606, doi. 10.1049/el.2014.1621
- Weiye Xu;
- Yongqiang Bao;
- Xiangbin Yu
- Article
35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1600, doi. 10.1049/el.2014.2022
- Ning Fu;
- Pingfan Song;
- Liyan Qiao
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1589, doi. 10.1049/el.2014.1964
- Junfeng Wu;
- Zhiguo Jiang;
- Jianwei Luo;
- Haopeng Zhang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1599, doi. 10.1049/el.2014.1290
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1637, doi. 10.1049/el.2014.1926
- Mizugaki, Y.;
- Takahashi, Y.;
- Shimada, H.;
- Maezawa, M.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1577, doi. 10.1049/el.2014.1874
- Nanjo, T.;
- Kurahashi, K.;
- Imai, A.;
- Suzuki, Y.;
- Nakmura, M.;
- Suita, M.;
- Yagyu, E.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1572, doi. 10.1049/el.2014.1860
- Ghorbel, I.;
- Haddad, F.;
- Barthélemy, H.;
- Rahajandraibe, W.;
- Loulou, M.;
- Mnif, H.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1604, doi. 10.1049/el.2014.1559
- Jiangsha Ma;
- Xiangyu Li;
- Moyang Wang
- Article
42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1635, doi. 10.1049/el.2014.1757
- Article
43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1639, doi. 10.1049/el.2014.1167
- Kuen-Min Lee;
- Wei-Guang Teng;
- Jin-Neng Wu;
- Ping-Yu Chen;
- Mu-Kai Huang;
- Ting-Wei Hou
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1611, doi. 10.1049/el.2014.0847
- Jin Jei Wu;
- Da Jun Hou;
- Her-Lih Chiueh;
- Jian-Qi Shen;
- Chien-Jang Wu;
- Yao-Huang Kao;
- Wen-Chen Lo;
- Tzong-Jer Yang;
- Ing-Jar Hsieh
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1609, doi. 10.1049/el.2014.0769
- Nassar, I.;
- Tsang, H.;
- Weller, T.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1595, doi. 10.1049/el.2014.1465
- Teng-Chang Chang;
- Sendren Sheng-Dong Xu
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1575, doi. 10.1049/el.2014.1411
- Sung-Woo Kim;
- Won-Jin Eom;
- Jaehyouk Choi;
- Jae Joon Kim
- Article
48
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1608, doi. 10.1049/el.2014.1310
- Lin Yang;
- Wu-Jun Hu;
- Kwok-Kai Soo;
- Yun-Ming Siu
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1643, doi. 10.1049/el.2014.1245
- Alhennawi, H. R.;
- Ismail, M. H.;
- Mourad, H.-A. M.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1618, doi. 10.1049/el.2014.1229
- Gimenez, S. P.;
- Davini, E.;
- Peruzzi, V. V.;
- Renaux, C.;
- Flandre, D.
- Article