Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 2
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 54, doi. 10.1049/el.2014.0018
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3
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 55, doi. 10.1049/el.2013.4247
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5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3941
- H. Li;
- Wolf, P.;
- Moser, P.;
- Larisch, G.;
- Mutig, A.;
- Lott, J. A.;
- Bimberg, D.
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6
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3795
- Smith, J.;
- Couture, A.;
- Allee, D.
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7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3662
- Dalir, H.;
- Takahashi, Y.;
- Koyama, F.
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8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3640
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9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3555
- Arai, M.;
- Seki, T.;
- Hiraga, K.;
- Nakagawa, T.;
- Uehara, K.
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10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3544
- Deepak, U.;
- Roshna, T. K.;
- Nijas, C. M.;
- Mohanan, P.
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11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3483
- Hsiang Chen;
- Hung-Wei Chang;
- Shih-Chang Shei;
- Sheng-Hao Hung;
- Meng-Lieh Sheu
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12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3466
- Kumbhani, B.;
- Kshetrimayum, R. S.
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13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3457
- P. Wang;
- Halvorsrød, T. M.;
- T. Ytterdal
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3452
- Yulong Shi;
- Qimei Cui;
- Siqi Cao;
- Xuefei Zhang;
- Xiaofeng Tao
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3434
- Ajmal, T.;
- Dyo, V.;
- Allen, B.;
- Jazani, D.;
- Ivanov, I.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3391
- S. Jeong;
- E. Lee;
- M. Yim;
- G. Yoon
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3282
- Chami, A.;
- Brachat, P.;
- Fortino, N.;
- Kossiavas, G.
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18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3234
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3342
- Sahu, C.;
- Swami, P.;
- Sharma, S.;
- Singh, J.
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20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3295
- Amani, N.;
- Jafargholi, A.;
- Kamyab, M.;
- Vaziri, A.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3253
- Xin Zhang;
- Puming Huang;
- Xiaohui Li
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3365
- Yong Ding;
- Shaoze Wang;
- Dong Zhang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3176
- Jiuchao Li;
- Yuanan Liu;
- Shulan Li;
- Cuiping Yu;
- Yongle Wu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3164
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3133
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2985
- C. Jin;
- Jian-Xin Chen;
- H. Chu;
- Z.-H. Bao
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3108
- Biolek, D.;
- Biolek, Z.;
- Biolková, V.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3061
- Kubina, B.;
- Romeu, J.;
- Mandel, C.;
- Schüßler, M.;
- Jakoby, R.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3032
- Falavarjani, M. Mohammadi;
- Shahabadi, M.;
- Rashed-Mohassel, J.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2992
- Mussot, A.;
- Stroïazzo, L.;
- Hugonnot, E.;
- Kudlinski, A.
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31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2757
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.3077
- Jianpeng Wang;
- Junding Zhao;
- Jia-Lin Li
- Article
33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2539
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2513
- Chaozhu Zhang;
- Jing Zhang;
- Lin Li
- Article
35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2488
- Estévez, F. J.;
- Rebel, G.;
- González, J.;
- Gloesekoetter, P.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2109
- S. Kim;
- S.-G. Sun;
- K.-T. Kim
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2391
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.1835
- Haixiao Liu;
- Bin Song;
- Fang Tian;
- Hao Qin
- Article
39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.1385
- K. M. Lee;
- H. Chu;
- J. Chu;
- Y. Lin;
- C. Hsiao;
- T. W. Hou
- Article
40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2161
- Bonnet, S.;
- Campovecchio, M.;
- Verdeyme, S.;
- Lienhart, M. Y.;
- Le Diouron, J.;
- Dravet, A.;
- Estebe, E.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2472
- Bodetto, M.;
- El Aroudi, A.;
- Cid-Pastor, A.;
- Martinez-Salamero, L.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2071
- Haopeng Zhang;
- Zhiguo Jiang
- Article
43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2290
- Trung-Sinh Dang;
- Chang-Woo Kim;
- Sang-Woong Yoon
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.2253
- Trombetta, M.;
- Williams, N. E.;
- Fischer, S.;
- Gokirmak, A.;
- Silva, H.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 1, doi. 10.1049/el.2013.0969
- Clemente, M. C.;
- Paris, J. F.
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