Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 19
2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1331, doi. 10.1049/el.2014.3140
- Article
4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1332, doi. 10.1049/el.2014.3072
- Article
5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1378, doi. 10.1049/el.2014.2733
- Liang, R.;
- Hosoda, T.;
- Shterengas, L.;
- Stein, A.;
- Lu, M.;
- Kipshidze, G.;
- Belenky, G.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1395, doi. 10.1049/el.2014.2639
- Xiaoli Yang;
- Kavanagh, Richard
- Article
7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1380, doi. 10.1049/el.2014.2639
- Nikolić, M.;
- Taimre, T.;
- Tucker, J. R.;
- Yah Leng Lim;
- Bertling, K.;
- Rakić, A. D.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1340, doi. 10.1049/el.2014.2538
- Grau, M.;
- Serra, R.;
- Parrón, J.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1363, doi. 10.1049/el.2014.2530
- Yafen Wu;
- Wenquan Che;
- Kuo-Sheng Chin;
- Kuang-Ching Chang;
- Wenjie Feng
- Article
10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1359, doi. 10.1049/el.2014.2502
- Cheol Ho Kim;
- Bonghyuk Park
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1347, doi. 10.1049/el.2014.2397
- Weiguo Feng;
- Baozhi Jia;
- Ming Zhu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1358, doi. 10.1049/el.2014.2336
- Mirzaee, M.;
- Noghanian, S.;
- Virdee, B. S.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1371, doi. 10.1049/el.2014.2285
- Kang-Sub Kwak;
- Seong-Kwan Hong;
- Oh-Kyong Kwon
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1386, doi. 10.1049/el.2014.2274
- Qiang Li;
- Dingjie Xu;
- Wei Wang;
- Xianpeng Wang;
- Zifa Han
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1375, doi. 10.1049/el.2014.2272
- Davidovic, M.;
- Seiter, J.;
- Hofbauer, M.;
- Gaberl, W.;
- Schidl, S.;
- Zimmermann, H.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1391, doi. 10.1049/el.2014.2248
- Bours, A.;
- Cetin, E.;
- Dempster, A. G.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1401, doi. 10.1049/el.2014.2222
- Méric, H.;
- Piquer, J. M.;
- Lacan, J.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1356, doi. 10.1049/el.2014.2170
- Zhi-Yuan Zhao;
- Jiang Chen;
- Lin Yang;
- Kun-He Chen
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1377, doi. 10.1049/el.2014.2135
- Urino, Y.;
- Hatori, N.;
- Akagawa, T.;
- Shimizu, T.;
- Okano, M.;
- Ishizaka, M.;
- Yamamoto, T.;
- Okayama, H.;
- Onawa, Y.;
- Takahashi, H.;
- Shimura, D.;
- Yaegashi, H.;
- Nishi, H.;
- Fukuda, H.;
- Yamada, K.;
- Miura, M.;
- Fujikata, J.;
- Akiyama, S.;
- Baba, T.;
- Usuki, T.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1351, doi. 10.1049/el.2014.2000
- Bo Li;
- Yi Shen;
- Jia Li;
- Zhenghua Wu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1344, doi. 10.1049/el.2014.1963
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1390, doi. 10.1049/el.2014.1944
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1388, doi. 10.1049/el.2014.1913
- Feiyang He;
- Peng Wang;
- Xiaojian Xu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1367, doi. 10.1049/el.2014.1893
- Minkevičius, L.;
- Tamošiūnas, V.;
- Madeikis, K.;
- Voisiat, B.;
- Kašalynas, I.;
- Valušis, G.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1393, doi. 10.1049/el.2014.1837
- Ioannidis, E. G.;
- Theodorou, C. G.;
- Haendler, S.;
- Dimitriadis, C. A.;
- Ghibaudo, G.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1369, doi. 10.1049/el.2014.1703
- Moser, P.;
- Lott, J. A.;
- Wolf, P.;
- Larisch, G.;
- Li, H.;
- Bimberg, D.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1338, doi. 10.1049/el.2014.1700
- Liu, H. W.;
- Zhan, X.;
- Li, S.;
- Lei, J. H.;
- Qin, F.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1336, doi. 10.1049/el.2014.1678
- Yuan-Fu Liu;
- Peng Wang;
- Hao Qin
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1373, doi. 10.1049/el.2014.1662
- Yongha Hwang;
- Paydar, O. H.;
- Ho, M.;
- Rosenzweig, J. B.;
- Candler, R. N.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1355, doi. 10.1049/el.2014.1577
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1342, doi. 10.1049/el.2014.1553
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1345, doi. 10.1049/el.2014.1493
- Kang, D.;
- Kang, Y.;
- Lee, E.;
- Hong, Y.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1335, doi. 10.1049/el.2014.1482
- Martinez-Lopez, L.;
- Rodriguez-Cuevas, J.;
- Martinez-Lopez, J. I.;
- Martynyuk, A. E.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1382, doi. 10.1049/el.2014.1409
- Zhongxing Gao;
- Yonggang Zhang;
- Wei Gao
- Article
35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1384, doi. 10.1049/el.2014.1224
- Mizuno, Y.;
- Ohara, S.;
- Hayashi, N.;
- Nakamura, K.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1361, doi. 10.1049/el.2014.1211
- Youn Sub Noh;
- Yun Ho Choi;
- In-Bok Yom
- Article
37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1399, doi. 10.1049/el.2014.1159
- Kim, J. S.;
- Munir, D.;
- Hasan, S. F.;
- Chung, M. Y.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1365, doi. 10.1049/el.2014.1150
- Zong, B. F.;
- Wang, G. M.;
- Zhang, C. X.;
- Wang, Y. W.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1349, doi. 10.1049/el.2014.1135
- Article
40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1353, doi. 10.1049/el.2014.1083
- Jabeur, K.;
- Bernard-Granger, F.;
- Di Pendina, G.;
- Prenat, G.;
- Dieny, B.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1397, doi. 10.1049/el.2014.0834
- Article
42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1486, doi. 10.1049/el.2014.2500
- Feng, Wenjie;
- Gao, Xin;
- Che, Wenquan
- Article
43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1484, doi. 10.1049/el.2014.2468
- Oller, J.;
- Garcia, E.;
- Lopez, E.;
- Demirkol, I.;
- Casademont, J.;
- Paradells, J.;
- Gamm, U.;
- Reindl, L.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1482, doi. 10.1049/el.2014.2406
- Wang, Zengqi;
- Li, Zhiqun;
- Shen, Changguo
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1480, doi. 10.1049/el.2014.1116
- Zhou, Hong‐Cheng;
- Fusco, Vincent;
- Wang, Bing‐Zhong;
- Malyuskin, O.;
- Zhong, Lei;
- Ding, Shuai;
- Zhao, De‐Shuang
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1479, doi. 10.1049/el.2014.1361
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1477, doi. 10.1049/el.2014.2759
- Okayama, H.;
- Onawa, Y.;
- Shimura, D.;
- Takahashi, H.;
- Miyamura, S.;
- Yaegashi, H.;
- Sasaki, H.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1475, doi. 10.1049/el.2014.1013
- Yang, H.S.;
- Zhang, C.;
- Bakir, M.S.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1474, doi. 10.1049/el.2014.2626
- Yang, X.;
- Li, M.;
- Zhao, G.;
- Zhang, Y.;
- Freisem, S.;
- Deppe, D.G.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 19, p. 1472, doi. 10.1049/el.2014.2799
- Evirgen, A.;
- Abautret, J.;
- Perez, J.P.;
- Cordat, A.;
- Nedelcu, A.;
- Christol, P.
- Article