Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 12
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 889, doi. 10.1049/el.2014.0416
- Biho Kim;
- Yunil Hwang;
- Hyung-Min Park
- Article
2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 896, doi. 10.1049/el.2014.0985
- Zhen Gao;
- Linglong Dai;
- Zhaocheng Wang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 855, doi. 10.1049/el.2014.0825
- Ke Huang;
- Ziqiang Wang;
- Xuqiang Zheng;
- Chun Zhang;
- Zhihua Wang
- Article
4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 898, doi. 10.1049/el.2014.0695
- Khavasi, Ali A.;
- Aajami, Mojtaba;
- Hae-Ryeon Park;
- Jung-Bong Suk
- Article
5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 888, doi. 10.1049/el.2014.1072
- Singh, S.;
- Kondekar, P. N.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 870, doi. 10.1049/el.2014.1027
- Yuting Su;
- Li Ma;
- An-An Liu;
- Zhaoxuan Yang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 892, doi. 10.1049/el.2014.1031
- Slimane, Abdelhalim;
- Haddad, Fayrouz;
- Bourdel, Sylvain;
- Tedjini-Baïliche, Sid Ahmed;
- Belaroussi, Mohand Tahar;
- Mohamed, Trabelsi;
- Barthélemy, Hervé
- Article
8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 894, doi. 10.1049/el.2014.0787
- Liangyin Chen;
- Miao Li;
- Kai Liu;
- Zhenlei Liu;
- Jingyu Zhang;
- Tong Peng;
- Yan Liu;
- Yongjun Xu;
- Qian Luo;
- Tian He
- Article
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 868, doi. 10.1049/el.2014.0842
- Chaobing Liang;
- Hongshi Sang;
- Xubang Shen
- Article
10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 886, doi. 10.1049/el.2014.0507
- Oruganti, S. K.;
- Heo, S. H.;
- Ma, H.;
- Bien, F.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 874, doi. 10.1049/el.2013.2732
- Article
12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 884, doi. 10.1049/el.2014.0419
- Guohua Zhou;
- Shengzong He;
- Xi Zhang;
- Shu Zhong
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 882, doi. 10.1049/el.2014.0612
- Young-Ho Kim;
- Eui-Suk Jung;
- Sang-Soo Lee
- Article
14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 881, doi. 10.1049/el.2014.0625
- Schmalz, K.;
- Mao, Y.;
- Borngräber, J.;
- Neumaier, P.;
- Hübers, H.-W.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 879, doi. 10.1049/el.2014.0927
- Asadbeigi, H.;
- Virdee, B. S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 877, doi. 10.1049/el.2014.0667
- Ming Hui;
- Taijun Liu;
- Meng Zhang;
- Yan Ye;
- Dongya Shen;
- Xiangyue Ying
- Article
17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 876, doi. 10.1049/el.2013.3474
- Kim, T. W.;
- Choi, B. D.;
- Kim, D. K.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 861, doi. 10.1049/el.2014.0638
- Bordet, M.;
- Morfu, S.;
- Marquié, P.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 857, doi. 10.1049/el.2014.0586
- Young-Seok Park;
- Dae-hyun Kwon;
- Choi, K.-C.;
- Woo-Young Choi
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 872, doi. 10.1049/el.2014.0287
- Article
21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 866, doi. 10.1049/el.2014.0128
- Xie Jun;
- Yu Lu;
- Zhu Lei;
- Xue Hui
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 863, doi. 10.1049/el.2013.3417
- Mattia, O. E.;
- Klimach, H.;
- Bampi, S.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 864, doi. 10.1049/el.2014.0609
- Kahveci, H.;
- Okumuş, H. I.;
- Ekici, M.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 853, doi. 10.1049/el.2014.0567
- RamRakhyani, A. K.;
- Lazzi, G.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 851, doi. 10.1049/el.2014.0765
- Hayami, H.;
- Ishii, Y.;
- Sasagawa, K.;
- Noda, T.;
- Tokuda, T.;
- Ohta, J.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 850, doi. 10.1049/el.2014.0616
- Mobashsher, A. T.;
- Abbosh, A.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 859, doi. 10.1049/el.2014.0485
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 844, doi. 10.1049/el.2014.1867
- Article
29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 843, doi. 10.1049/el.2014.1856
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 848, doi. 10.1049/el.2013.4027
- Mirzapour, M. I.;
- Razavi, S. M. J.;
- Mohseni Armaki, S. H.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 12, p. 847, doi. 10.1049/el.2014.0875
- Amani, N.;
- Kamyab, M.;
- Jafargholi, A.;
- Hosseinbeig, A.;
- Meiguni, J. S.
- Article