Works matching IS 00135194 AND DT 2014 AND VI 50 AND IP 1
1
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 2, doi. 10.1049/el.2013.4008
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2
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 4, doi. 10.1049/el.2013.4007
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4
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 23, doi. 10.1049/el.2013.3600
- Raj, N.;
- Singh, A. K.;
- Gupta, A. K.
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5
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 20, doi. 10.1049/el.2013.3558
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6
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 2, doi. 10.1049/el.2013.4010
- Toumazou, Chris;
- White, Ian
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7
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 3, doi. 10.1049/el.2013.4009
- Clarricoats, Peter;
- Ash, Eric
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8
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 34, doi. 10.1049/el.2013.3533
- Flammia, I.;
- Khani, B.;
- Arafat, S.;
- Stöhr, A.
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9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 32, doi. 10.1049/el.2013.3425
- Ambroze, M.;
- Tomlinson, M.
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10
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 233, doi. 10.1049/el.2014.0124
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11
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 42, doi. 10.1049/el.2013.3042
- Hang Li;
- Yihua Tan;
- YanSheng Li;
- Jinwen Tian
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12
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 49, doi. 10.1049/el.2013.2944
- S. H. Yang;
- E. M. Jeong;
- S. K. Han
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13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 35, doi. 10.1049/el.2013.2899
- Ziwen Tao;
- Jianpeng Wang;
- Yan Dou
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14
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 39, doi. 10.1049/el.2013.3264
- W.-M. Chau;
- K.-W. Hsu;
- W.-H. Tu
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15
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 29, doi. 10.1049/el.2013.3362
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16
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 51, doi. 10.1049/el.2013.3261
- Politis, A.;
- Hilas, C. S.;
- Papatsoris, A. D.
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17
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 22, doi. 10.1049/el.2013.2794
- Liangbo Xie;
- Guangjun Wen;
- Jiaxin Liu;
- Yao Wang
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18
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 47, doi. 10.1049/el.2013.3231
- Aalo, V. A.;
- Peppas, K. P.;
- Efthymoglou, G.;
- Alwakeel, M.;
- Alwakeel, S.
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19
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 37, doi. 10.1049/el.2013.3144
- Dehghani, K.;
- Karimi, G.;
- Lalbakhsh, A.;
- Maki, S. V.
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20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 17, doi. 10.1049/el.2013.3099
- Michel, A.;
- Caso, R.;
- Buffi, A.;
- Nepa, P.;
- Isola, G.
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21
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 25, doi. 10.1049/el.2013.3095
- Miao Liu;
- ShouGuang Wang;
- Zhiwu Li
- Article
22
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 40, doi. 10.1049/el.2013.2774
- Safaisini, R.;
- Haglund, E.;
- Westbergh, P.;
- Gustavsson, J. S.;
- Larsson, A.
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23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 19, doi. 10.1049/el.2013.2971
- Morishita, A. M.;
- Kitamura, C. K. Y.;
- Ohta, A. T.;
- Shiroma, W. A.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 16, doi. 10.1049/el.2013.2701
- Carluccio, G.;
- Mazzinghi, A.;
- Freni, A.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 27, doi. 10.1049/el.2013.2578
- Hassan, A.;
- Riaz, F.;
- Rehman, S.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 45, doi. 10.1049/el.2013.2159
- Jahromi, M. J.;
- Kahaei, M. H.
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27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 44, doi. 10.1049/el.2013.0971
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28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 232, doi. 10.1049/el.2013.3906
- Allen, B.;
- Tennant, A.;
- Bai, Qiang;
- Chatziantoniou, E.
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29
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 30, doi. 10.1049/el.2013.2697
- Lei Xu;
- Yaping Li;
- Zhen-min Tang
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30
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 230, doi. 10.1049/el.2013.2767
- Article
31
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 229, doi. 10.1049/el.2013.3447
- Huang, Xiaobin;
- Li, Quanzhong;
- Zhang, Qi;
- Qin, Jiayin
- Article
32
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 227, doi. 10.1049/el.2013.3409
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33
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 225, doi. 10.1049/el.2013.3259
- Darsena, D.;
- Gelli, G.;
- Verde, F.
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34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 216, doi. 10.1049/el.2013.2871
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35
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 214, doi. 10.1049/el.2013.3840
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36
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 223, doi. 10.1049/el.2013.3371
- Park, Chester Sungchung;
- Kim, Jintae
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37
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 218, doi. 10.1049/el.2013.2566
- Kim, Jeong‐been;
- Lee, Jewon;
- Park, Daesoon;
- Kim, Kap‐jin;
- Song, Ki‐won;
- Lee, Sang‐Jeong;
- Ahn, Jae Min
- Article
38
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 219, doi. 10.1049/el.2013.3731
- Zhou, Rongguo;
- Zhang, Zhongxiang;
- Chen, Chang;
- Zhang, Hualiang
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39
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 182, doi. 10.1049/el.2013.2994
- Guerra, E.O.;
- Reguera, V.A.;
- Souza, R.D.;
- Brante, G.;
- Fernandez, E.M.G.
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40
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 221, doi. 10.1049/el.2013.2991
- Helmle, S.;
- Dehm, M.;
- Kuhn, M.;
- Lieckfeldt, D.;
- Pesch, D.
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41
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 212, doi. 10.1049/el.2013.2378
- Han, Jiang;
- Cui, Qimei;
- Yang, Chengcheng;
- Tao, Xiaofeng
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42
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 209, doi. 10.1049/el.2013.2287
- Mao, Kun;
- Qiao, Ming;
- Li, Zhaoji;
- Zhang, Bo
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43
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 207, doi. 10.1049/el.2013.2631
- Lin, Y.‐S.;
- Lee, G.‐L.;
- Wang, C.‐C.
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44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 211, doi. 10.1049/el.2013.2846
- Yafune, N.;
- Hashimoto, S.;
- Akita, K.;
- Yamamoto, Y.;
- Tokuda, H.;
- Kuzuhara, M.
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45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 204, doi. 10.1049/el.2013.1989
- Jiang, C.L.;
- Zhang, B.C.;
- Fang, J.;
- Zhe, Z.;
- Hong, W.;
- Wu, Y.R.;
- Xu, Z.B.
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46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 206, doi. 10.1049/el.2013.3978
- Qi, C.D.;
- Shi, X.M.;
- Bian, M.M.;
- Xue, Y.J.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 180, doi. 10.1049/el.2013.3875
- Ben Slimane, E.;
- Jarboui, S.;
- Bouallègue, A.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 179, doi. 10.1049/el.2013.2832
- Dou, Gaoqi;
- He, Chunquan;
- Li, Congying;
- Gao, Jun
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49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 200, doi. 10.1049/el.2013.1853
- Hung, Chung‐Yu;
- Kao, Tzu‐Cheng;
- Lee, Jian‐Hsing;
- Gong, Jeng;
- Huang, Tsung‐Yi;
- Su, Hung‐Der;
- Chang, Kuo‐Cheng;
- Huang, Chih‐Fang;
- Lo, Kuo‐Hsuan
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50
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 1, p. 202, doi. 10.1049/el.2013.2270
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