Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 8
1
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0592
- Yurur, O.;
- C.-H. Liu;
- W. Moreno
- Article
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4483
- D. T. Nguyen;
- A. Muramatsu;
- A. Morimoto
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4402
- Maffezzoni, P.;
- Marucci, G.;
- Levantino, S.;
- Samori, C.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 511, doi. 10.1049/el.2013.1025
- Article
7
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0574
- S. H. Kim;
- D. G. Kim;
- B. H. Lee;
- T. U. Kim;
- H. C. Ki;
- H. J. Kim;
- Y. W. Choi;
- B.-T. Lee
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4232
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 512, doi. 10.1049/el.2013.1023
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0763
- Drzewietzki, L.;
- Breuer, S.;
- Elsäßer, W.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0639
- J. T. H. Tsai;
- Chia-Hsiang Hsu;
- Chia-Yun Hsu;
- Chu-Shou Yang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0463
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0454
- Loumiotis, I.;
- Stamatiadi, T.;
- Adamopoulou, E.;
- Demestichas, K.;
- Sykas, E.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0558
- Brandl, P.;
- Zimmermann, H.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4195
- X. Chen;
- Y. G. Chen;
- M. Wei;
- M. Cui
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4083
- J.-G. Lee;
- S. Choi;
- B.-R. Park;
- K.-S. Seo;
- H. Kim;
- H.-Y. Cha
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0398
- Jouvaud, C.;
- de Rosny, J.;
- Ourir, A.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0366
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0358
- D'Amico, M.;
- Jong, S. L.;
- Riva, C.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0246
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0234
- Patron, D.;
- Piazza, D.;
- Dandekar, K. R.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0220
- Zhengfan Liu;
- Zhiyong Wang;
- Satira, Zachary A.;
- Xu Chen;
- Shufen Chen;
- Jianguo Xin;
- Wong, Stephen T. C.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0198
- Prokopidis, K. P.;
- Zografopoulos, D. C.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0194
- Xiangning Fan;
- Bin Li;
- Zhigong Wang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0182
- C. Feng;
- X. P. Yu;
- Z. H. Lu;
- W. M. Lim;
- W. Q. Sui
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2013.0012
- Ritter, P.;
- Le Tual, S.;
- Allard, B.;
- Möller, M.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4015
- J. Liu;
- K. P. Esselle;
- S. G. Hay;
- S. S. Zhong
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4437
- C.-F. Chen;
- C.-Y. Lin;
- J.-H. Weng;
- K.-L. Tsai
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3776
- Hernández, L.;
- Prefasi, E.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4291
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4275
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 622, doi. 10.1049/el.2012.4030
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 628, doi. 10.1049/el.2013.1224
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.4149
- X. Tang;
- K. Mouthaan;
- J. C. Coetzee
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3387
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3345
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3724
- Junjun Jiang;
- Ruimin Hu;
- Zhen Han;
- Tao Lu
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 627, doi. 10.1049/el.2012.4508
- Jung, J.;
- Upadyaya, P.;
- Heo, D.;
- Kim, J.‐H.;
- Kim, B.‐S.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3627
- M.-S. Jeon;
- J. Woo;
- U. Kim;
- Y. Kwon
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3448
- Yeniçeri, R.;
- Yalçın, M. E.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 1, doi. 10.1049/el.2012.3388
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 623, doi. 10.1049/el.2013.0709
- Fan, W.;
- Sun, F.;
- Kyösti, P.;
- Nielsen, J.;
- Carreño, X.;
- Knudsen, M.;
- Pedersen, G.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 605, doi. 10.1049/el.2013.0238
- Chen, J.‐X.;
- Shao, C.;
- Shi, J.;
- Bao, Z.‐H.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 620, doi. 10.1049/el.2013.0645
- Choi, W.H.;
- Jang, H.K.;
- Shin, J.H.;
- Song, T.H.;
- Kim, J.B.;
- Lee, W.J.;
- Joo, Y.S.;
- Kim, C.‐G.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 625, doi. 10.1049/el.2013.0390
- Benavente‐Peces, C.;
- Cano‐Broncano, F.;
- Ahrens, A.;
- Ortega‐González, F.J.;
- Pardo‐Martín, J.M.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 618, doi. 10.1049/el.2012.4467
- Lu, Hongxi;
- Suo, Zhiyong;
- Guo, Rui;
- Bao, Zheng
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 604, doi. 10.1049/el.2012.4312
- Xue, S.J.;
- Zhu, H.T.;
- Feng, W.J.;
- Che, W.Q.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 617, doi. 10.1049/el.2013.0302
- Yao, H.Y.;
- Sun, W.F.;
- Ma, X.Y.;
- Li, X.X.;
- Qian, L.C.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 615, doi. 10.1049/el.2012.4459
- Tang, C.;
- Sun, Y.;
- Dai, X.;
- Su, Y.;
- Nguang, S.K.;
- Hu, A.P.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 8, p. 613, doi. 10.1049/el.2013.0605
- Guzmán‐Guemez, J.;
- Moreno‐Valenzuela, J.
- Article