Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 4
1
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 79, doi. 10.1049/el.2012.4477
- Article
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 234, doi. 10.1049/el.2013.0395
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 81, doi. 10.1049/el.2012.4523
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 235, doi. 10.1049/el.2013.0392
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 85, doi. 10.1049/el.2013.0104
- Chen, C.-H.;
- Zhang, Y.;
- Jung, Y.;
- He, T.;
- Ceballos, J. L.;
- Temes, G. C.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 83, doi. 10.1049/el.2013.0031
- Chen, C.;
- Zhang, C. F.;
- Zhang, W.;
- Jin, W.;
- Qiu, K.
- Article
7
- 2013
- Shapiro, David;
- Shapiro, Elena
- Interview
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 236, doi. 10.1049/el.2013.0393
- Rawat, M.;
- Rawat, K.;
- Younes, M. F.;
- Ghannouchi, F.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 51, doi. 10.1049/el.2012.4186
- Xinfan Xia;
- Lihua Liu;
- Hongfei Guan;
- Guangyou Fang
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 77, doi. 10.1049/el.2012.4465
- Choi, P. H.;
- Baek, D. H.;
- Kim, H. J.;
- Kim, K. S.;
- Park, H. S.;
- Lee, J. H.;
- Yi, J. S.;
- Choi, B. D.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 73, doi. 10.1049/el.2012.4445
- D'Addio, S.;
- Martin-Neira, M.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 57, doi. 10.1049/el.2012.4261
- Kim, D. S.;
- Kim, M.;
- Kim, B. S.;
- Lee, K. H.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 55, doi. 10.1049/el.2012.4252
- Zhijun Ying;
- Xubo Guo;
- Bisong Cao;
- Bin Wei;
- Xiaoping Zhang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 53, doi. 10.1049/el.2012.4245
- Gómez-García, R.;
- Sánchez-Soriano, M.-A.;
- Sánchez-Renedo, M.;
- Torregrosa-Penalva, G.;
- Bronchalo, E.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 75, doi. 10.1049/el.2012.4450
- Dallner, M.;
- Höfling, S.;
- Kamp, M.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 71, doi. 10.1049/el.2012.4428
- Zabri, S. N.;
- Cahill, R.;
- Schuchinsky, A.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 69, doi. 10.1049/el.2012.4335
- Yang, H.;
- Ye, N.;
- Phelan, R.;
- O'Carroll, J.;
- Kelly, B.;
- Han, W.;
- Wang, X.;
- Nudds, N.;
- MacSuibhne, N.;
- Gunning, F.;
- O'Brien, P.;
- Peters, F. H.;
- Corbett, B.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 65, doi. 10.1049/el.2012.4294
- Schidl, S.;
- Polzer, A.;
- Dong, J.;
- Schneider-Hornstein, K.;
- Zimmermann, H.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 67, doi. 10.1049/el.2012.4332
- Wong, E.;
- Müller, M.;
- Amann, M. C.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 61, doi. 10.1049/el.2012.4266
- Quiroz, R.;
- Alves, T.;
- Poussot, B.;
- Laheurte, J.-M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 63, doi. 10.1049/el.2012.4276
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 59, doi. 10.1049/el.2012.4263
- So, H.;
- Ando, A.;
- Seki, T.;
- Kawashima, M.;
- Sugiyama, T.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 49, doi. 10.1049/el.2012.4173
- Pereira, L. F. A.;
- Pinheiro, H. N. B.;
- Cavalcanti, G. D. C.;
- Ren, Tsang Ing
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 47, doi. 10.1049/el.2012.4165
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 45, doi. 10.1049/el.2012.4109
- Yu, H. G.;
- Lee, K. J.;
- Kim, M.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 43, doi. 10.1049/el.2012.4069
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 41, doi. 10.1049/el.2012.4050
- Debogović, T.;
- Hrabar, S.;
- Perruisseau-Carrier, J.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 39, doi. 10.1049/el.2012.4042
- Stanković, V.;
- Spalević, P.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 37, doi. 10.1049/el.2012.4001
- Juntunen, E.;
- Dawn, D.;
- Laskar, J.;
- Papapolymerou, J.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 35, doi. 10.1049/el.2012.3923
- Zakharov, Y. V.;
- Nascimento, V.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 33, doi. 10.1049/el.2012.3903
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 31, doi. 10.1049/el.2012.3900
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 29, doi. 10.1049/el.2012.3898
- Vasic, D.;
- Chen, Y. Y.;
- Costa, F.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 21, doi. 10.1049/el.2012.3817
- García-Martín, A.;
- Martínez, J. M.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 7, doi. 10.1049/el.2012.3457
- Zhang, T.;
- Cai, Y.;
- Yang, W.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 367, doi. 10.1049/el.2012.4463
- Heves, E.;
- Ozturk, C.;
- Gurbuz, Y.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 27, doi. 10.1049/el.2012.3893
- Kyung Woon Kwak;
- Kyung-Soo Kim;
- Soohyun Kim
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 1, doi. 10.1049/el.2012.2607
- Bao, B. C.;
- Zhang, X.;
- Xu, J. P.;
- Wang, J. P.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 25, doi. 10.1049/el.2012.3837
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 5, doi. 10.1049/el.2012.3382
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 23, doi. 10.1049/el.2012.3835
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 19, doi. 10.1049/el.2012.3740
- Yi Wang;
- Qianbin Chen;
- Xingzhe Hou;
- Zufan Zhang;
- Tang, H.;
- Ke Zheng
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 15, doi. 10.1049/el.2012.3625
- Shapiro, E. G.;
- Shapiro, D. A.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 17, doi. 10.1049/el.2012.3671
- Rawat, M.;
- Rawat, K.;
- Younes, M.;
- Ghannouchi, F.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 13, doi. 10.1049/el.2012.3552
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 9, doi. 10.1049/el.2012.3492
- Lin, K.-T.;
- Chen, H.-K.;
- Lu, S.-S.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 11, doi. 10.1049/el.2012.3512
- Tripathi, R. K.;
- Singh, Y. N.;
- Verma, N. K.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 372, doi. 10.1049/el.2012.3910
- Qiu, Y.J.;
- Xu, Y.H.;
- Xu, R.M.;
- Lin, W.G.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 370, doi. 10.1049/el.2012.3532
- Hong, Sheng;
- Zhang, Bo;
- Yang, Hongqi
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 4, p. 369, doi. 10.1049/el.2012.1221
- Tian, Wenbiao;
- Rui, Guosheng
- Article