Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 24
1
- 2013
- B. C. Bao;
- Z. Liu;
- H. Leung
- Interview
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3310
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3407
- Wei Chen;
- Papavassiliou, C.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1498, doi. 10.1049/el.2013.3701
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1499, doi. 10.1049/el.2013.3700
- Bagheri, M.;
- Frez, C.;
- Kelly, B.;
- Gupta, J. A.;
- Forouhar, S.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3070
- Jun Chen;
- Xiao-Wei Zhu;
- Chuan Ge;
- Li-Na Cao
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2788
- B. C. Bao;
- Z. Liu;
- H. Leung
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3470
- Y. Zhang;
- C. H. Chen;
- Temes, G. C.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2442
- Ming Yong Zeng;
- Zemin Wu;
- Chang Tian;
- Yi Fu;
- Feng Xia Zhang
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3404
- F. Tong;
- K. Yapabandara;
- C. W. Yang;
- Khanal, M.;
- C. Jiao;
- Goforth, M.;
- Ozden, B.;
- A. Ahyi;
- Hamilton, M.;
- G. Niu;
- Ewoldt, D.A.;
- G. Chung;
- Park, M.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3333
- Lamothe, M.;
- Plessky, V.;
- Friedt, J. M.;
- Ostertag, T.;
- Ballandras, S.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3273
- Dąbrowska, E.;
- Teodorczyk, M.;
- Lipinśka, L.;
- Kozinśki, R.;
- Maląg, A.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3139
- S. M. Wu;
- S. H. Huang;
- H. Y. Wang;
- C.T. Chiu;
- C. P. Hung;
- C.W. Kuo;
- C. C. Wang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3203
- Fulin Su;
- Da Xiao;
- Jianjun Gao
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3025
- A. T. Do;
- J. Minkyu;
- K. S. Yeo
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2821
- Y. X. Wang;
- L. Zhu;
- S. B. Zhang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3035
- Alrawashdeh, R.;
- Y. Huang;
- P. Cao
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2129
- Kesar, A. S.;
- Merensky, L. M.;
- Ogranovich, M.;
- Kardo-Sysoev, A. F.;
- Shmilovitz, D.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.3010
- H. Wakatsuchi;
- Rushton, J. J.;
- J. Lee;
- F. Gao;
- M. Jacob;
- S. Kim;
- Sievenpiper, D. F.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2909
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2852
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2324
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2815
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2781
- Kouadria, N.;
- Doghmane, N.;
- Messadeg, D.;
- Harize, S.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2769
- D. M. Geum;
- S. H. Shin;
- M. S. Kim;
- J. H. Jang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2752
- DasMahapatra, P.;
- Stabile, R.;
- Rohit, A.;
- Williams, K. A.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2766
- Singh, P.;
- Deschrijver, D.;
- vPissoort, D.;
- Dhaene, T.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2741
- Y. F. Wang;
- T. A. Denidni;
- Q. S. Zeng;
- G. Wei
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.1884
- Katz, N.;
- Patterson, M.;
- K. Zaunbrecher;
- Johnston, S.;
- J. Hudgings
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2737
- H. Kim;
- Y. Kim;
- J. Kim;
- Lee, E. C.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2725
- S. K. Chung;
- B. G. Kang;
- M. S. Kim
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2724
- Kim, N. Y.;
- Yoon, S. W.;
- Kim, C. W.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2656
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2509
- Tosi, D.;
- Poeggel, S.;
- Leen, G.;
- Lewis, E.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2503
- Bagheri, M.;
- Frez, C.;
- B. Kelly;
- Gupta, J. A.;
- Forouhar, S.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2451
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2314
- Seager, R. D.;
- Chauraya, A.;
- Bowman, J.;
- Broughton, M.;
- Philpott, R.;
- Nimkulrat, N.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2366
- Juretzka, C.;
- Breuer, S.;
- Drzewietzki, L.;
- Schad, F.;
- Carras, M.;
- Elsäßer, W.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2361
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2328
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.1721
- Yan Song;
- Bing Jiang;
- YeBo Bao;
- Si Wei;
- Li-Rong Dai
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.1905
- Jia Xu;
- Pin Lv;
- Xudong Wang
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2213
- W. S. Lee;
- H. S. Jang;
- K. S. Oh;
- J. W. Yu
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2134
- X. Zhang;
- E. J. Liu;
- Z. Xiao;
- J. Zhang
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.1565
- Ramaccia, D.;
- Palma, L. Di;
- Guarnieri, G.;
- Scafè, S.;
- Toscano, A.;
- Bilotti, F.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2127
- Jia Cao;
- Zhiqun Li;
- Qin Li;
- Zhigong Wang
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2106
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.2012
- Yuntao Wu;
- Hai Wang;
- Yanbin Zhang;
- Yang Wang
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 24, p. 1, doi. 10.1049/el.2013.1352
- Bayer, F. M.;
- Cintra, R. J.;
- Madanayake, A.;
- Potluri, U. S.
- Article