Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 23
1
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1576, doi. 10.1049/el.2013.3333
- Lamothe, M.;
- Plessky, V.;
- Friedt, J.‐M.;
- Ostertag, T.;
- Ballandras, S.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1574, doi. 10.1049/el.2013.1905
- Xu, Jia;
- Lv, Pin;
- Wang, Xudong
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1572, doi. 10.1049/el.2013.2361
- Lei, Wenying;
- Chen, Baixiao
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1570, doi. 10.1049/el.2013.2134
- Zhang, X.;
- Liu, E.J.;
- Xiao, Z.;
- Zhang, J.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1569, doi. 10.1049/el.2013.1721
- Song, Yan;
- Jiang, Bing;
- Bao, YeBo;
- Wei, Si;
- Dai, Li‐Rong
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1567, doi. 10.1049/el.2013.2106
- Article
7
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1565, doi. 10.1049/el.2013.2909
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1564, doi. 10.1049/el.2013.2328
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1562, doi. 10.1049/el.2013.3203
- Su, Fulin;
- Xiao, Da;
- Gao, Jianjun
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1561, doi. 10.1049/el.2013.1146
- Choi, P.H.;
- Baek, D.H.;
- Kim, H.J.;
- Kim, K.S.;
- Park, H.S.;
- Kim, S.S.;
- Choi, B.D.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1559, doi. 10.1049/el.2013.1884
- Katz, N.;
- Patterson, M.;
- Zaunbrecher, K.;
- Johnston, S.;
- Hudgings, J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1558, doi. 10.1049/el.2013.2724
- Kim, N.Y.;
- Yoon, S.‐W.;
- Kim, C.‐W.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1556, doi. 10.1049/el.2013.2725
- Chung, S. K.;
- Kang, B. G.;
- Kim, M. S.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1555, doi. 10.1049/el.2013.2509
- Tosi, D.;
- Poeggel, S.;
- Leen, G.;
- Lewis, E.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1545, doi. 10.1049/el.2013.2752
- DasMahapatra, P.;
- Stabile, R.;
- Rohit, A.;
- Williams, K.A.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1544, doi. 10.1049/el.2013.3070
- Chen, Jun;
- Zhu, Xiao‐Wei;
- Ge, Chuan;
- Cao, Li‐Na
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1550, doi. 10.1049/el.2013.3273
- Da˛browska, E.;
- Teodorczyk, M.;
- Lipińska, L.;
- Koziński, R.;
- Mala˛g, A.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1548, doi. 10.1049/el.2013.2366
- Juretzka, C.;
- Breuer, S.;
- Drzewietzki, L.;
- Schad, F.;
- Carras, M.;
- Elsäßer, W.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1547, doi. 10.1049/el.2013.3404
- Tong, F.;
- Yapabandara, K.;
- Yang, C.‐W.;
- Khanal, M.;
- Jiao, C.;
- Goforth, M.;
- Ozden, B.;
- Ahyi, A.;
- Hamilton, M.;
- Niu, G.;
- Ewoldt, D.A.;
- Chung, G.;
- Park, M.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1553, doi. 10.1049/el.2013.3310
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1552, doi. 10.1049/el.2013.2503
- Bagheri, M.;
- Frez, C.;
- Kelly, B.;
- Gupta, J.A.;
- Forouhar, S.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1542, doi. 10.1049/el.2013.2821
- Wang, Y.X.;
- Zhu, L.;
- Zhang, S.B.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1541, doi. 10.1049/el.2013.2656
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1539, doi. 10.1049/el.2013.2129
- Kesar, A. S.;
- Merensky, L. M.;
- Ogranovich, M.;
- Kardo‐Sysoev, A. F.;
- Shmilovitz, D.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1537, doi. 10.1049/el.2013.2127
- Cao, Jia;
- Li, Zhiqun;
- Li, Qin;
- Wang, Zhigong
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1536, doi. 10.1049/el.2013.2769
- Geum, D.M.;
- Shin, S.H.;
- Kim, M.S.;
- Jang, J.H.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1534, doi. 10.1049/el.2013.2442
- Zeng, Ming Yong;
- Wu, Zemin;
- Tian, Chang;
- Fu, Yi;
- Zhang, Feng Xia
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1532, doi. 10.1049/el.2013.1352
- Bayer, F.M.;
- Cintra, R.J.;
- Madanayake, A.;
- Potluri, U.S.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1531, doi. 10.1049/el.2013.2781
- Kouadria, N.;
- Doghmane, N.;
- Messadeg, D.;
- Harize, S.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1530, doi. 10.1049/el.2013.3010
- Wakatsuchi, H.;
- Rushton, J.J.;
- Lee, J.;
- Gao, F.;
- Jacob, M.;
- Kim, S.;
- Sievenpiper, D.F.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1528, doi. 10.1049/el.2013.3139
- Wu, S.M.;
- Huang, S.H.;
- Wang, H.Y.;
- Chiu, C.T.;
- Hung, C.P.;
- Kuo, C.W.;
- Wang, C.C.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1526, doi. 10.1049/el.2013.2766
- Singh, P.;
- Deschrijver, D.;
- Pissoort, D.;
- Dhaene, T.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1525, doi. 10.1049/el.2013.2324
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1523, doi. 10.1049/el.2013.2788
- Bao, B.C.;
- Liu, Z.;
- Leung, H.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1522, doi. 10.1049/el.2013.3470
- Zhang, Y.;
- Chen, C.H.;
- Temes, G.C.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1520, doi. 10.1049/el.2013.3407
- Chen, Wei;
- Papavassiliou, C.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1518, doi. 10.1049/el.2013.2737
- Kim, H.;
- Kim, Y.;
- Kim, J.;
- Lee, E.C.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1517, doi. 10.1049/el.2013.3025
- Do, A.T.;
- Minkyu, J.;
- Yeo, K.S.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1515, doi. 10.1049/el.2013.3035
- Alrawashdeh, R.;
- Huang, Y.;
- Cao, P.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1514, doi. 10.1049/el.2013.2451
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1512, doi. 10.1049/el.2013.2852
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1510, doi. 10.1049/el.2013.2213
- Lee, W.‐S.;
- Jang, H.‐S.;
- Oh, K.‐S.;
- Yu, J.‐W.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1509, doi. 10.1049/el.2013.2012
- Wu, Yuntao;
- Wang, Hai;
- Zhang, Yanbin;
- Wang, Yang
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1507, doi. 10.1049/el.2013.2314
- Seager, R.D.;
- Chauraya, A.;
- Bowman, J.;
- Broughton, M.;
- Philpott, R.;
- Nimkulrat, N.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1506, doi. 10.1049/el.2013.2741
- Wang, Y.‐F.;
- Denidni, T.A.;
- Zeng, Q.‐S.;
- Wei, G.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1504, doi. 10.1049/el.2013.1565
- Ramaccia, D.;
- Di Palma, L.;
- Guarnieri, G.;
- Scafè, S.;
- Toscano, A.;
- Bilotti, F.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1503, doi. 10.1049/el.2013.2815
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1500, doi. 10.1049/el.2013.3699
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1499, doi. 10.1049/el.2013.3700
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 23, p. 1498, doi. 10.1049/el.2013.3701
- Article